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| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Type | Imported Instrument |
| Model | SPECORD 210 PLUS |
| Optical Design | Double-Beam |
| Detector | Peltier-Cooled CCD Array |
| Wavelength Range | 185–1100 nm |
| Spectral Bandwidth | 0.2, 0.5, 1, 2, and 4 nm (5-step adjustable) |
| Wavelength Accuracy | < ±0.1 nm (entire range) |
| Stray Light | < 0.005% at 340 nm (NaNO₂) |
| Photometric Range | –5 to +5 A |
| Baseline Stability | ≤ 0.0001 A (RMS) |
| Long-Term Drift | ≤ 0.0005 A/h |
| Scan Speed | Up to 12,000 nm/min |
| Wavelength Reproducibility | < ±0.01 nm |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit (Zn at 213.856 nm) | 0.06 ppb |
| Precision (RSD) | ≤0.5% |
| Long-Term Stability (RSD, 4h) | ≤1.5% |
| Wavelength Range | 160–900 nm |
| Optical Resolution | 0.003 nm (at 200 nm) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Flame and Graphite Furnace AAS |
| Monochromator | Plane Grating |
| Optical System | Dual-Beam with Automatic Switching to Single-Beam |
| Detector | CCD Array (185–900 nm) |
| Background Correction | Automatic Deuterium/Halogen Lamp or Zeeman (software-selectable) |
| Spectral Resolution | ≤ 0.1 nm |
| Sensitivity | ≥ 0.9 A for 5 mg/L Cu solution (279.5 nm, air-acetylene flame) |
| Precision (RSD) | < 0.5% (n = 10, typical aqueous standards) |
| Detection Limit (Flame Mode) | < 0.005 mg/L Cu |
| Detection Limit (Graphite Furnace Mode) | Sub-pg range for Cd/Pb (e.g., < 3 pg for Cd) |
| Baseline Stability | < 0.002 A/h (typical, 24 h drift monitoring) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena GmbH & Co. KG |
| Instrument Type | Flame–Graphite Furnace AAS |
| Monochromator | Concave Grating |
| Optical System | Dual-Beam |
| Detector | Photomultiplier Tube (PMT) |
| Background Correction | Deuterium Lamp + Triple-Field Zeeman |
| Grating Density | 1800 lines/mm |
| Lamp Holder | Automated 8-Lamp Turret with Auto-Alignment |
| Magnetic Field Range | 0.1–1.0 T (Switchable Between 2-Field and 3-Field Zeeman Modes) |
| Graphite Furnace | Transversely Heated, Temperature Range: Room Temp to 3000 °C, Max. Ramp Rate: 3000 °C/s |
| Autosampler Capacity | Up to 108 Positions |
| Dimensions | 1200 × 480 × 600 mm |
| Brand | Endress+Hauser |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RAMAN RXN HYBRID |
| Instrument Type | Grating-Based Raman Spectrometer |
| Excitation Wavelength | 785 nm |
| Probe Compatibility | Rxn-20 Solid-Phase Probe + Secondary E+H Raman Probe |
| Hazardous Area Certifications | ATEX, IECEx, North America (Class I Div 1/2, Class II Div 1) |
| Installation Options | Benchtop, Mobile Cart, or In-Line Process Skid Mounting |
| Sample Phase Support | Simultaneous Solid & Liquid Analysis Channels |
| Spatial Sampling Flexibility | Micron- to Millimeter-Scale Spot Sizes (up to 6 mm diameter) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Instrument Type | Flame and Graphite Furnace AAS |
| Optical System | Dual-Beam |
| Monochromator | Echelle Grating with Quartz Prism Cross-Disperser |
| Detector | Solid-State CCD Array |
| Background Correction | Real-Time, Multi-Wavelength Simultaneous Correction |
| Wavelength Resolution | 0.002 nm |
| Light Source | High-Intensity Short-Arc Xenon Lamp (Continuum Source) |
| Measurement Mode | Sequential Multi-Element & Full-Spectrum Acquisition |
| Dynamic Linear Range | 5 Orders of Magnitude |
| Software Compliance | FDA 21 CFR Part 11 Ready, GLP/GMP Audit Trail Enabled |
| Brand | Endress+Hauser |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RAMANRXN2 |
| Instrument Type | Grating-Based Raman Spectrometer |
| Excitation Wavelength Options | 532 nm, 785 nm, or 1000 nm |
| Channel Configuration | Single-Channel (Standard), Optional 4-Channel Multiplexing |
| Probe Compatibility | Rxn-10 (with accessory optics), Rxn-30, Rxn-40, Rxn-41, Rxn-45, Rxn-46 |
| Hazardous Area Certifications | ATEX, IECEx, North American Class I Div 1/2, Class II Div 1/2 |
| Installation Form Factor | Benchtop or Mobile Cart-Mounted |
| Regulatory Compliance | Designed for cGMP/GLP environments, supports FDA 21 CFR Part 11–compliant audit trails when integrated with validated software platforms |
| Software Interface | Embedded touchscreen control with optional remote web-based access via Ethernet/Wi-Fi |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Type | Imported Instrument |
| Model | SPECORD 200 PLUS |
| Optical Design | Double-Beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Automation | Motorized Wavelength Scanning |
| Spectral Bandwidth | 1.4 nm |
| Wavelength Accuracy | < ±0.1 nm (full range) |
| Wavelength Repeatability | < ±0.01 nm |
| Stray Light | < 0.005% @ 340 nm (NaNO₂) |
| Baseline Stability | ≤ 0.0001 A (RMS) |
| Photometric Range | –5 to +5 A |
| Scan Speed | 12,000 nm/min |
| Light Sources | Deuterium Lamp + Tungsten-Halogen Lamp (automatically switched) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | ZEEnit 700Q |
| Pricing | Available upon Request |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Product Type | Imported |
| Model | PlasmaQuant 9200 |
| Instrument Category | Full-Spectrum Simultaneous ICP-OES |
| Wavelength Range | 160–900 nm |
| Optical Resolution | 0.002 nm (at 200 nm) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Instrument Type | Double-beam |
| Detector | CCD array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | < ±0.1 nm (full range) |
| Wavelength Repeatability | ≤ 0.02 nm |
| Spectral Bandwidth | 0.2, 0.5, 1, 2, and 4 nm (motorized selection) |
| Stray Light | < 0.0002% at 340 nm (NaNO₂) |
| Scan Speed | up to 12,000 nm/min |
| Automatic Wavelength Calibration | 内置 Ho-glass reference filter |
| Light Sources | Deuterium lamp (190–350 nm) and tungsten-halogen lamp (350–1100 nm) |
| Software | SCIENCE™ v3.x with GLP-compliant audit trail, method library, and instrument self-check (SCS) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Product Type | Imported Instrument |
| Model | PlasmaQuant 9100 |
| Detection Principle | Full-Spectrum Direct-Reading ICP-OES |
| Optical Range | 160–900 nm |
| Optical Resolution | ≤3 pm |
| Wavelength Accuracy | <0.0004 nm |
| Observation Modes | Dual-View (Radial + Axial) with Four Simultaneous Viewing Configurations |
| Plasma System | High-Stability, High-Power RF Generator (27.12 MHz) |
| Detector | Back-Illuminated CCD with Deep-UV Sensitivity |
| Startup Time | <5 minutes |
| Gas Efficiency | Integrated Plasma Gas Recycling for Cooling & Purge Streams |
| Software | Aspect PQ with ABC and CSI Background Correction Algorithms |
| Compliance | Designed for GLP/GMP environments |
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