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| Brand | Narishige |
|---|---|
| Origin | Japan |
| Model | JCM-7000 |
| Instrument Type | Desktop SEM |
| Magnification Range | 10×–100,000× (print output: 128 mm × 96 mm) |
| 24×–202,168× (on-screen display | 280 mm × 210 mm) |
| Accelerating Voltage | 5 kV, 10 kV, or 15 kV (software-selectable constant-voltage mode) |
| BSE Image Resolution | Not specified (system optimized for compositional and topographic contrast) |
| Specimen Dimensions | Ø80 mm × 50 mm (without stage夹具) |
| Detector Types | Everhart-Thornley secondary electron detector |
| Stage Motion | Motorized X/Y = ±40 mm each |
| Tilt | −15° to +45° |
| Rotation | 360° continuous |
| Vacuum Modes | High Vacuum (HV) and Low Vacuum (LV) |
| Operating System | Windows 10 |
| Data Formats | TIFF, BMP, JPEG, PNG (still) |
| Electron Source | Tungsten filament with integrated Wehnelt cap |
| Brand | NIKON |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JCM-7000 |
| Instrument Type | Desktop SEM |
| Electron Gun | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Secondary Electron Image Resolution | 20 nm |
| Magnification Range | 10×–60,000× |
| Accelerating Voltages | 5 kV, 10 kV, 15 kV |
| Backscattered Electron Image Resolution | 20 nm |
| Vacuum Modes | High Vacuum & Low Vacuum |
| Sample Chamber Capacity | Ø ≥80 mm × H ≥50 mm |
| Motorized Stage Travel | X ≥40 mm, Y ≥40 mm |
| Detector Configuration | Secondary Electron Detector (SED) + Backscattered Electron Detector (BSED) |
| Imaging Modes | SE, BSE (compositional & topographic), Real-Time 3D Reconstruction |
| Dual-Channel Simultaneous Display | Yes |
| Image Storage Resolutions | 1280×960, 2560×1920, 5120×3840 pixels |
| Power Supply | AC 100–240 V, 50/60 Hz, ≤700 VA |
| Operating Temperature | 15–30 °C |
| Relative Humidity | 30–60 % RH (non-condensing) |
| Ground Resistance | <100 Ω |
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