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| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour Elite |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-light Interferometry (WLI) based on proprietary Wyko® technology |
| Software Platform | Vision64® |
| Configuration Options | Contour Elite K (benchtop, enhanced stability), Contour Elite I (fully automated benchtop with integrated vibration isolation), Contour Elite X (floor-standing configuration with active or passive vibration isolation platform) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Principle | White Light Interferometry (WLI) |
| Optical Head | Motorized Tilt & Pitch Adjustment |
| Illumination | Dual-source (broadband white light) |
| Automation | Auto-focus, Auto-surface detection (Advanced Find Surface™), Adaptive USI mode |
| Calibration | Integrated self-calibrating laser reference |
| Vibration Isolation | Built-in active/passive vibration isolation platform |
| Software | VisionXpress™ with guided workflows and ISO-compliant analysis modules |
| Compliance | Fully supports ISO 25178 (areal surface texture), ISO 4287/4288 (profile roughness), ASTM E2926, and GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Automation Features | Motorized XY Stage with Encoders, Programmable Auto-Tilt Optical Head, Auto-Brightness Control, Pneumatic Vibration Isolation Base |
| Software Platform | VisionXpress™ and Vision64® |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Interface | VisionXpress™ and Vision64® software platforms |
| Vibration Isolation | Integrated passive damping architecture |
| Z-axis Resolution | Sub-nanometer (independent of magnification) |
| Field of View | Maximum standard FOV among benchtop WLI systems |
| Surface Reflectivity Range | 0.05% to 100% |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX 3D |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | Sub-nanometer |
| Measurement Mode | Full-field 3D Topography |
| Sample Flexibility | Large-format, Angled, and Complex-Geometry Samples |
| Optional Modules | Tilted Measurement Head, Through-Transmissive Media (TTM) Module, Folded-Objective Lens |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dektak Pro |
| Type | Contact Stylus Profilometer |
| Operating Principle | Mechanical Stylus Scanning (Tactile Profilometry) |
| Category | Precision Geometric Measurement Instrument |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-200 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Field of View | Standard Large FOV |
| Z-Axis Resolution | Sub-nanometer |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | Vision64® and VisionXpress™ |
| Motion Control | Motorized XY Stage |
| Surface Reflectivity Range | 0.05% – 100% |
| Application Scope | Precision Machined Surfaces, Thin Films, Semiconductors, Ophthalmic Lenses, Medical Devices, MEMS, Tribology |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX-1000 |
| Measurement Principle | White Light Interferometry (WLI) |
| Type | Non-contact 3D Surface Profilometer / Roughness Analyzer |
| Sample Stage Travel | 300 mm X-Y |
| Design | Floor-standing Open-bridge Configuration |
| Software Platform | VisionXpress™ with Adaptive USI Mode and One-click Advanced Surface Find™ |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1392, and USP <1058> analytical instrument qualification frameworks |
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