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| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension IconIR |
| Type | Modular Scanning Probe Microscope (SPM) with Integrated AFM-IR |
| Measurement Principle | Photothermal Induced Resonance (PTIR) / Nanoscale Fourier Transform Infrared (nano-FTIR) |
| Spatial Resolution | <10 nm |
| Sensitivity | Monolayer-level chemical detection |
| Compatibility | PeakForce Tapping® for nanomechanical & nanoelectrical correlative mapping |
| Software Platform | NanoScope Analysis with IR spectral library integration |
| Compliance | Supports GLP/GMP audit trails, ASTM E2987 (for nanoscale spectroscopic imaging), ISO/IEC 17025 traceability frameworks |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope (AFM) |
| Vertical Noise Floor (Z-sensor, closed-loop) | <35 pm RMS |
| Typical Imaging Bandwidth | 625 Hz |
| Sample Stage | 210 mm vacuum chuck (Ø210 mm × 15 mm thick) |
| Stage Travel Range (X-Y visual field) | 180 mm × 180 mm |
| X-Y Scan Range (typical) | 90 µm × 90 µm |
| Z Scan Range (typical) | 10 µm |
| X-Y Positioning Noise (closed-loop) | <0.15 nm RMS (625 Hz) |
| Z Sensor Noise (closed-loop) | <35 pm RMS (625 Hz) |
| Overall Linearity Error (X-Y-Z) | 0.5% (typical) |
| Optical System | 5 MP digital camera, 180–1465 µm field of view, digital zoom & auto-focus |
| Controller | NanoScope V |
| Integrated Vibration Isolation | Monolithic pneumatic isolation table |
| Acoustic Enclosure | Rated for continuous ambient noise up to 85 dBC |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour Elite |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-light Interferometry (WLI) based on proprietary Wyko® technology |
| Software Platform | Vision64® |
| Configuration Options | Contour Elite K (benchtop, enhanced stability), Contour Elite I (fully automated benchtop with integrated vibration isolation), Contour Elite X (floor-standing configuration with active or passive vibration isolation platform) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PI 89 |
| Pricing | Available Upon Request |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PI 95 |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Compatibility | JEOL, FEI (Thermo Fisher), Hitachi, Zeiss TEMs (excludes UHR pole-piece configurations) |
| Core Functionality | In-situ TEM-compatible nanomechanical, thermal, and electrical property characterization |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | TI 990 |
| Drive Technology | Electrostatic actuation |
| Noise Floor | <0.1 nm RMS displacement noise |
| Maximum Load Resolution | 50 nN |
| Depth Resolution | <0.01 nm |
| Active Vibration Isolation | Integrated pneumatic + electromagnetic hybrid system |
| Platform | Precision granite base with environmental enclosure |
| Control Architecture | Performech III dual-lock-in parallel processing module |
| Software Platform | Tribo iQ v4.x (FDA 21 CFR Part 11 compliant audit trail, GLP/GMP-ready reporting) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Principle | White Light Interferometry (WLI) |
| Optical Head | Motorized Tilt & Pitch Adjustment |
| Illumination | Dual-source (broadband white light) |
| Automation | Auto-focus, Auto-surface detection (Advanced Find Surface™), Adaptive USI mode |
| Calibration | Integrated self-calibrating laser reference |
| Vibration Isolation | Built-in active/passive vibration isolation platform |
| Software | VisionXpress™ with guided workflows and ISO-compliant analysis modules |
| Compliance | Fully supports ISO 25178 (areal surface texture), ISO 4287/4288 (profile roughness), ASTM E2926, and GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | TriboLab |
| Instrument Type | Multi-Function Tribological Tester |
| Maximum Friction Force | 2000 N |
| Force Resolution | 10 mN |
| Maximum Temperature | 1000 °C |
| Vertical Travel | 150 mm (0.5 µm resolution) |
| Horizontal Travel | 75 mm (0.25 µm resolution) |
| Linear Drive Speed | 0.002–10 mm/s |
| Rotational Drive Speed | 0.1–5000 rpm |
| Reciprocating Frequency | 0.1–60 Hz |
| Stroke Range | 0.1–25 mm |
| Torque Capacity | 5 N·m @ 100 rpm / 2.5 N·m @ 5000 rpm |
| Data Acquisition | 16-bit, up to 200 kHz (8 standard channels, expandable to 16) |
| Environmental Control Options | −30 °C to 1000 °C temperature chamber, 5–85% RH humidity control, liquid immersion cell, cryogenic cooling, programmable fluid pump (2.2–480 mL/min) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Automation Features | Motorized XY Stage with Encoders, Programmable Auto-Tilt Optical Head, Auto-Brightness Control, Pneumatic Vibration Isolation Base |
| Software Platform | VisionXpress™ and Vision64® |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Opterra II |
| Price Range | USD 420,000 – 700,000 |
| Instrument Type | Optical Imaging System |
| Maximum Scan Resolution | 2048 × 2048 pixels |
| Frame Rate | up to 100 fps |
| Field of View | Objectives-dependent (e.g., 0.25 mm² at 60×, 1.0 mm² at 10×) |
| Sample Capacity | Single specimen stage with motorized XYZ + focus control |
| Detection Technology | EMCCD and sCMOS dual-path detection |
| Scanning Method | Parallel field-scanning via programmable slit/multi-spot illumination |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Innova |
| Instrument Type | Atomic Force Microscope (AFM) |
| Positioning Detection Noise | <2 µm (with standard 10× objective) |
| Sample Dimensions | 50 mm × 50 mm × 18 mm (X × Y × Z) |
| Z-Axis Stage Travel | 18 mm |
| Closed-Loop Scanner Range | XY > 90 µm, Z > 7.5 µm |
| Open-Loop Scanner Range | XY > 5 µm, Z > 1.5 µm |
| Optical Field of View | 1.24 mm × 0.25 mm (motorized zoom, 10× objective) |
| Optical Resolution | <2 µm (10×), <0.75 µm (50×) |
| Controller | 20-bit DAC, 100 kHz ±10 V ADCs |
| Software | SPMLab™ v7.0 (Windows® XP) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Interface | VisionXpress™ and Vision64® software platforms |
| Vibration Isolation | Integrated passive damping architecture |
| Z-axis Resolution | Sub-nanometer (independent of magnification) |
| Field of View | Maximum standard FOV among benchtop WLI systems |
| Surface Reflectivity Range | 0.05% to 100% |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | TriboLab CMP |
| Instrument Type | Multifunctional Tribological Tester |
| Maximum Friction Force | 200 N |
| Friction Force Resolution | 10 mN |
| Maximum Operating Temperature | 1000 °C |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard PURE |
| Instrument Type | Biological Atomic Force Microscope |
| Category | Scanning Probe Microscope (SPM) |
| Architecture | Modular, Optically Compatible SPM Platform |
| Key Capabilities | Correlative Optical-AFM Imaging, Quantitative Nanomechanics, Multi-Modal Functional Imaging (PFM, MFM, EFM, KPFM, C-AFM, SSRM, STS, sThermal-AFM), Nanomanipulation & Nanolithography |
| Software Suite | JPK Instruments (now part of Bruker) SPMLab+, ExperimentalPlanner, RampDesigner, DirectOverlay2, DirectTiling |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | TI 980 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Key Technology | Three-Plate Capacitive Transduction |
| Compliance | ASTM E2546, ISO 14577, ISO 20503, USP <1062> |
| Optional Modules | High-Temperature Stage, Electrical Characterization Module, Humidity Control Chamber, Cryogenic Stage, Raman Coupling Interface |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Edge |
| Instrument Type | Material-Focused AFM |
| Positioning Noise | X-Y ≤ 50 pm RMS, Z ≤ 50 pm RMS |
| Sample Diameter | 150 mm (vacuum chuck), Thickness: ≤ 15 mm |
| Scan Area | 150 mm × 150 mm |
| Imaging Bandwidth | Typical high-speed acquisition capability |
| Category | Scanning Probe Microscope (SPM) / Atomic Force Microscope (AFM) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NanoRacer |
| Instrument Type | Biological Atomic Force Microscope |
| XY Position Detection Noise | <0.09 nm RMS |
| Z Position Detection Noise | <0.04 nm RMS |
| Typical Sample Diameter | 4 mm |
| Software Version | V7 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | MultiMode 8 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Z-Direction Positioning Noise | <0.3 Å RMS (Tapping Mode, 0 nm scan size, with active vibration isolation) |
| Maximum Sample Size | 15 mm × 15 mm × 5 mm |
| XY Stage Travel Range | 15 mm × 15 mm |
| Optional Scan Heads | AS-0.5 (0.4 µm × 0.4 µm XY / 0.4 µm Z), AS-12 (10 µm × 10 µm XY / 2.5 µm Z), AS-130 (125 µm × 125 µm XY / 5.0 µm Z), PF50 (40 µm × 40 µm XY / 20 µm Z) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | oIR3-s |
| Instrument Type | Laboratory-Based Fourier Transform Infrared Spectrometer |
| Wavenumber Range | 900–3600 cm⁻¹ |
| Spatial Resolution | <10 nm |
| Spectral Resolution | <1 cm⁻¹ |
| Acquisition Speed | 10 s per spectrum |
| Signal-to-Noise Ratio | 200:1 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ULTRA Speed 3 |
| Instrument Type | Biological Atomic Force Microscope |
| Category | Scanning Probe Microscope (SPM) |
| Architecture | Modular, Multi-Functional SPM Platform |
| Compliance | Designed for GLP/GMP-relevant environments with audit-trail-capable software |
| Data Format | Native HDF5 storage with metadata embedding |
| Automation Level | Fully integrated hardware-software automation for unattended operation |
| Software Framework | JPK Instruments’ BioAFM Suite (licensed and co-developed with Bruker) |
| Microscope Integration | Compatible with inverted optical microscopes (e.g., Zeiss Axio Observer, Nikon Ti2, Olympus IX83) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Filmtek 4000 |
| Measurement Angles | 0° (normal incidence) and 70° (grazing incidence) |
| Spectral Range | 400–1650 nm |
| Spot Size | 1 mm (0°), 2 mm (70°) |
| Thickness Range | 100 nm – 150 µm |
| Thickness Accuracy | ≤3 Å (1σ), Repeatability: ≤0.5 nm (1σ) |
| Refractive Index Resolution | 2×10⁻⁵ @ TE, 4×10⁻⁵ @ TM (1σ) |
| Stage Travel | 200 mm × 200 mm, Positioning Resolution: 1 µm |
| Light Source | Halogen lamp, Lifetime ≥2000 h |
| Detectors | Dual visible CCDs (380–950 nm, 0.3 nm resolution, 2048 px) + Dual IR InGaAs detectors (950–1650 nm, 2 nm resolution, 512 px) |
| Software | Filmtek 4000 Suite with DPSD, Cauchy, Sellmeier, Drude, Lorentz, Tauc, EMA, Graded, Superlattice, and NK modeling |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | X-Y ≤ 0.15 nm RMS, Z = 35 pm RMS |
| Typical Imaging Bandwidth | Up to 625 Hz |
| Sample Diameter | 210 mm (vacuum chuck), Max Thickness: ≤ 15 mm |
| Stage Travel Range | 180 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX 3D |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | Sub-nanometer |
| Measurement Mode | Full-field 3D Topography |
| Sample Flexibility | Large-format, Angled, and Complex-Geometry Samples |
| Optional Modules | Tilted Measurement Head, Through-Transmissive Media (TTM) Module, Folded-Objective Lens |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | FilmTek 2000M TSV |
| Optical Configuration | Collimated Beam Reflectometry |
| Spot Size Range | 2 × 1 µm to >100 µm (adjustable via microscope objectives) |
| Spectral Range | 190–1100 nm |
| Spectral Resolution | <1.5 nm FWHM |
| Thickness Measurement Range | 5 nm – 350 µm |
| Compliance | ASTM E2476, ISO/IEC 17025 (when operated in accredited lab environments), supports GLP/GMP data integrity requirements |
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