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| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension IconIR |
| Type | Modular Scanning Probe Microscope (SPM) with Integrated AFM-IR |
| Measurement Principle | Photothermal Induced Resonance (PTIR) / Nanoscale Fourier Transform Infrared (nano-FTIR) |
| Spatial Resolution | <10 nm |
| Sensitivity | Monolayer-level chemical detection |
| Compatibility | PeakForce Tapping® for nanomechanical & nanoelectrical correlative mapping |
| Software Platform | NanoScope Analysis with IR spectral library integration |
| Compliance | Supports GLP/GMP audit trails, ASTM E2987 (for nanoscale spectroscopic imaging), ISO/IEC 17025 traceability frameworks |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope (AFM) |
| Vertical Noise Floor (Z-sensor, closed-loop) | <35 pm RMS |
| Typical Imaging Bandwidth | 625 Hz |
| Sample Stage | 210 mm vacuum chuck (Ø210 mm × 15 mm thick) |
| Stage Travel Range (X-Y visual field) | 180 mm × 180 mm |
| X-Y Scan Range (typical) | 90 µm × 90 µm |
| Z Scan Range (typical) | 10 µm |
| X-Y Positioning Noise (closed-loop) | <0.15 nm RMS (625 Hz) |
| Z Sensor Noise (closed-loop) | <35 pm RMS (625 Hz) |
| Overall Linearity Error (X-Y-Z) | 0.5% (typical) |
| Optical System | 5 MP digital camera, 180–1465 µm field of view, digital zoom & auto-focus |
| Controller | NanoScope V |
| Integrated Vibration Isolation | Monolithic pneumatic isolation table |
| Acoustic Enclosure | Rated for continuous ambient noise up to 85 dBC |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Innova |
| Instrument Type | Atomic Force Microscope (AFM) |
| Positioning Detection Noise | <2 µm (with standard 10× objective) |
| Sample Dimensions | 50 mm × 50 mm × 18 mm (X × Y × Z) |
| Z-Axis Stage Travel | 18 mm |
| Closed-Loop Scanner Range | XY > 90 µm, Z > 7.5 µm |
| Open-Loop Scanner Range | XY > 5 µm, Z > 1.5 µm |
| Optical Field of View | 1.24 mm × 0.25 mm (motorized zoom, 10× objective) |
| Optical Resolution | <2 µm (10×), <0.75 µm (50×) |
| Controller | 20-bit DAC, 100 kHz ±10 V ADCs |
| Software | SPMLab™ v7.0 (Windows® XP) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard PURE |
| Instrument Type | Biological Atomic Force Microscope |
| Category | Scanning Probe Microscope (SPM) |
| Architecture | Modular, Optically Compatible SPM Platform |
| Key Capabilities | Correlative Optical-AFM Imaging, Quantitative Nanomechanics, Multi-Modal Functional Imaging (PFM, MFM, EFM, KPFM, C-AFM, SSRM, STS, sThermal-AFM), Nanomanipulation & Nanolithography |
| Software Suite | JPK Instruments (now part of Bruker) SPMLab+, ExperimentalPlanner, RampDesigner, DirectOverlay2, DirectTiling |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Edge |
| Instrument Type | Material-Focused AFM |
| Positioning Noise | X-Y ≤ 50 pm RMS, Z ≤ 50 pm RMS |
| Sample Diameter | 150 mm (vacuum chuck), Thickness: ≤ 15 mm |
| Scan Area | 150 mm × 150 mm |
| Imaging Bandwidth | Typical high-speed acquisition capability |
| Category | Scanning Probe Microscope (SPM) / Atomic Force Microscope (AFM) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NanoRacer |
| Instrument Type | Biological Atomic Force Microscope |
| XY Position Detection Noise | <0.09 nm RMS |
| Z Position Detection Noise | <0.04 nm RMS |
| Typical Sample Diameter | 4 mm |
| Software Version | V7 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | MultiMode 8 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Z-Direction Positioning Noise | <0.3 Å RMS (Tapping Mode, 0 nm scan size, with active vibration isolation) |
| Maximum Sample Size | 15 mm × 15 mm × 5 mm |
| XY Stage Travel Range | 15 mm × 15 mm |
| Optional Scan Heads | AS-0.5 (0.4 µm × 0.4 µm XY / 0.4 µm Z), AS-12 (10 µm × 10 µm XY / 2.5 µm Z), AS-130 (125 µm × 125 µm XY / 5.0 µm Z), PF50 (40 µm × 40 µm XY / 20 µm Z) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ULTRA Speed 3 |
| Instrument Type | Biological Atomic Force Microscope |
| Category | Scanning Probe Microscope (SPM) |
| Architecture | Modular, Multi-Functional SPM Platform |
| Compliance | Designed for GLP/GMP-relevant environments with audit-trail-capable software |
| Data Format | Native HDF5 storage with metadata embedding |
| Automation Level | Fully integrated hardware-software automation for unattended operation |
| Software Framework | JPK Instruments’ BioAFM Suite (licensed and co-developed with Bruker) |
| Microscope Integration | Compatible with inverted optical microscopes (e.g., Zeiss Axio Observer, Nikon Ti2, Olympus IX83) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Filmtek 4000 |
| Measurement Angles | 0° (normal incidence) and 70° (grazing incidence) |
| Spectral Range | 400–1650 nm |
| Spot Size | 1 mm (0°), 2 mm (70°) |
| Thickness Range | 100 nm – 150 µm |
| Thickness Accuracy | ≤3 Å (1σ), Repeatability: ≤0.5 nm (1σ) |
| Refractive Index Resolution | 2×10⁻⁵ @ TE, 4×10⁻⁵ @ TM (1σ) |
| Stage Travel | 200 mm × 200 mm, Positioning Resolution: 1 µm |
| Light Source | Halogen lamp, Lifetime ≥2000 h |
| Detectors | Dual visible CCDs (380–950 nm, 0.3 nm resolution, 2048 px) + Dual IR InGaAs detectors (950–1650 nm, 2 nm resolution, 512 px) |
| Software | Filmtek 4000 Suite with DPSD, Cauchy, Sellmeier, Drude, Lorentz, Tauc, EMA, Graded, Superlattice, and NK modeling |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | X-Y ≤ 0.15 nm RMS, Z = 35 pm RMS |
| Typical Imaging Bandwidth | Up to 625 Hz |
| Sample Diameter | 210 mm (vacuum chuck), Max Thickness: ≤ 15 mm |
| Stage Travel Range | 180 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | FilmTek 2000M TSV |
| Optical Configuration | Collimated Beam Reflectometry |
| Spot Size Range | 2 × 1 µm to >100 µm (adjustable via microscope objectives) |
| Spectral Range | 190–1100 nm |
| Spectral Resolution | <1.5 nm FWHM |
| Thickness Measurement Range | 5 nm – 350 µm |
| Compliance | ASTM E2476, ISO/IEC 17025 (when operated in accredited lab environments), supports GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | nanoIR3 |
| Instrument Type | Nano-Fourier Transform Infrared Spectrometer |
| Category | Scanning Probe Microscope–Integrated Optical Spectroscopy System |
| Compliance | ASTM E2947-21 (Standard Guide for Nanoscale Infrared Spectroscopy), ISO/IEC 17025–Accredited Measurement Capability Context |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard 4 XP |
| Instrument Type | Biological Atomic Force Microscope |
| Position Detection Noise | X-Y direction RMS < 0.09 nm, Z direction RMS < 0.04 nm |
| Sample Scan Area | 100 µm × 100 µm × 15 µm |
| Stage Travel Range | 20 × 20 mm² |
| Software | V7 |
| Controller | Vortis™ 2 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Nexus |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| Architecture | Modular, Multi-Mode Scanning Probe Microscope |
| Controller Platform | NanoScope 6 |
| Core Imaging Modes | PeakForce Tapping®, PeakForce QNM®, PeakForce MFM®, ScanAsyst® Auto-Optimization |
| Environmental Operation | Air, Liquid, Controlled Atmosphere |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard V |
| Instrument Type | Biological Atomic Force Microscope |
| Sample Stage Travel Range | 20 × 20 mm² |
| Maximum Sample Height (with Head-Up Stage) | 140 mm Ø × 18 mm thickness |
| Free Sample Space | Ø140 × 18 mm³ |
| Software | V8 |
| Key Capabilities | PeakForce-QI, PeakForce Tapping®, PeakForce QNM®, Quantitative Imaging (QI), Single-Molecule Force Spectroscopy, Single-Cell Force Spectroscopy, DirectOverlay 2 for AFM–Optical Correlative Imaging, ExperimentPlanner & ExperimentControl modules, Integrated High-NA Optical Microscopy, Multi-Dimensional Environmental Control |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoTracker 2 |
| Laser Class | Class 1 |
| Positional Resolution | Sub-nanometer (closed-loop) |
| Force Sensitivity | < 0.1 pN/√Hz |
| Trap Stiffness Range | 0.01–100 pN/µm |
| Detection Bandwidth | Up to 100 kHz |
| Sample Stage Options | Piezo-driven XYZ stage (optional) |
| Illumination | LED-based Köhler illumination with condenser lens |
| Control Interfaces | TTL-triggered external devices (cameras, spectrometers, PMTs, APDs) |
| Software Compliance | FDA 21 CFR Part 11–ready audit trail, GLP/GMP-compatible experiment logging |
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