Electron Microscope Accessories Peripherals
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Showing 31–60 of 72 results
| Brand | MULLER-BBM |
|---|---|
| Origin | Germany |
| Model | MACOM II® |
| Frequency Range | 0 Hz to 50 kHz |
| Operating Axes | 3-axis (X, Y, Z) |
| Interface | RS-232 serial + Ethernet (TCP/IP) |
| Display | Integrated LCD for real-time monitoring and parameter adjustment |
| Control | Local front-panel + remote via LAN/internet |
| Maintenance | Maintenance-free after commissioning |
| Compliance | Designed for GLP/GMP-adjacent environments |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | ADT-3D |
| Compatible TEM Voltage | 120–300 kV |
| Compatible Sources | LaB6, W, FEG |
| Minimum Crystal Size (Organic) | ~100 nm |
| Minimum Crystal Size (Inorganic) | ~20 nm |
| Tilt Range (Cell Parameter Determination) | −15° to +15°, 1° step |
| Recommended Tilt Range (Structure Solution) | −45° to +45°, 1° step or continuous rotation (MicroED) |
| Data Acquisition Modes | Manual or automated PED |
| Detector Compatibility | CCD cameras ≥1k × 1k resolution |
| Sample Holder Support | Single-tilt, tomography, cryo holders |
| Output | 3D reciprocal space reconstruction, unit cell parameters (2–5% error), space group assignment, integrated 3D reflection intensities |
| Compliance | Fully compatible with standard TEM workflows under GLP-aligned data handling practices |
| Brand | NanoMEGAS |
|---|---|
| Origin | Imported (Non-China) |
| Manufacturer Type | Authorized Distributor |
| Model | DigiSTAR |
| Pricing | Upon Request |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | TopSPIN STRAIN |
| Application | Automated High-Resolution Strain Mapping in Scanning Transmission Electron Microscopy (STEM) using 4D Scanning Precession Electron Diffraction (4D-SPED) |
| Spatial Resolution | 2–3 nm (FEG-TEM) |
| Strain Sensitivity | < 2 × 10⁻⁴ |
| Typical Acquisition Time | 5–10 min (150 × 150 pixels) |
| Pixel Dwell Time | 10–40 ms |
| Strain Quantification Accuracy | ±0.02% (at 200 kV FEG-TEM) |
| Analysis Engine | AppFive proprietary algorithm |
| Output Modalities | Point, line, and 2D strain tensor maps (εₓₓ, ε_zz, ε_xz), orientation/phase/strain/STEM co-registration |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fast-Scan Scanning Capacitance Microscope (SCM) |
| Price Range | USD 25,000 – 65,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecWave |
| Detector Type | Wavelength Dispersive Spectrometer (WDS) with Integrated EDS Compatibility (Ultim Max) |
| Roland Circle Radius | 210 mm |
| Energy Resolution | <10 eV (Mn Kα, typical) |
| Detection Limit | <100 ppm (matrix-dependent) |
| Peak-to-Background Ratio | >10,000:1 (typical for major elements) |
| Optical Geometry | Focusing Johann-type spectrometer with bent crystals |
| Incident Slit | Motorized, variable width |
| Installation | Tilt-mounted for minimal working distance dependency |
| Software Platform | AZtecWave v4.x or later |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniGIS II |
| Gas Port Configuration | Single-port, multi-source compatible |
| Gas Capacity | Up to 3 primary gas sources + 2 auxiliary gases |
| Control Architecture | Pressure-feedback regulated flow control |
| Vacuum Compatibility | Adaptive operation across wide chamber pressure range (10⁻⁷ mbar to 10⁻¹ mbar) |
| Integration | Designed for SEM and FIB platforms |
| Compliance | CE-marked |
| Software Interface | Native integration with AZtec GIS Control Suite (v5.0+) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniProbe (OP350, OP400, Cryo) |
| Drive Technology | Piezoelectric actuation |
| Positioning Resolution | Sub-nanometer |
| Operating Temperature Range (Cryo) | –180 °C to room temperature |
| Port Compatibility | Standard SEM/FIB vacuum feedthroughs (e.g., 60 mm, 80 mm) |
| Control Interface | Digital USB/Ethernet with real-time image-synchronized calibration |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Relate Correlative Imaging Software |
| Data Format Support | Aztec H5oina, AFM native formats (e.g., Gwyddion, Nanoscope, SPIP) |
| Primary Function | Multi-modal correlative analysis of SEM/TEM, EDS, EBSD, and AFM datasets |
| Compatibility | Integrated with Oxford Instruments Aztec and Symmetry platforms |
| Licensing | Node-locked or floating license options |
| Compliance | Supports GLP/GMP-aligned documentation workflows, audit-trail-ready metadata logging |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TKD |
| Price Range | USD 1,400 – 7,000 |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Automated Image Mapping |
| Pricing | Available Upon Request |
| Max Scan Area | 100 mm × 100 mm |
| Imaging Modes | Backscattered Electron (BSE), Secondary Electron (SE) |
| Focus Mode | Auto-focus |
| Stitching | Fully Automated, Sub-pixel Registration |
| Stage Control | High-precision Motorized XY Stage |
| UI | Integrated Touch-Optimized Interface |
| Compatible With | Phenom Desktop SEM Series (e.g., Phenom XL, Phenom Pharos, Phenom Pure) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Avizo Trueput |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Charge Reduction Sample Holder |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ChemiPhase |
| Type | SEM-EDS Statistical Phase Analysis Software |
| Compliance | Designed for ASTM E1508, ISO 16700, and USP <1058> analytical instrument qualification frameworks |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ChemiSEM |
| Type | Integrated SEM-EDS Real-Time Quantitative Mapping Solution |
| Compliance | CE, ISO 9001 (Manufacturer), GLP-Compatible Data Acquisition |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Automated Tilt-Rotate Sample Holder |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Imported |
| Model | Standard Sample Holder |
| Pricing | Contact for Quote |
| Brand | Phenom |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Phenom FiberMetric |
| Pricing | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom MAPS |
| Type | Automated Multimodal Mapping & Stitching Software for Desktop SEM |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Metallurgical Mount Sample Holder |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Micro Electronics Insert |
| Price | Upon Request |
| Key | Brand: Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Electron Microscope Accessory |
| Model | Temperature Controlled Sample Holder |
| Temperature Range | −25 °C to +50 °C (standard), optional −50 °C to +50 °C |
| Accuracy | ±1.5 °C |
| Resolution | 0.1 °C |
| Max Cooling Rate | 20 °C/min |
| Max Sample Dimensions | Ø25 mm × 5 mm |
| Operating Principle | Peltier-based thermoelectric control |
| Compliance | Designed for integration with Phenom desktop SEM platforms |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Tensile Sample Holder |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Vacuum Sample Holder |
| Pricing | Upon Request |
| Dimensions | 70 × 60 × 20 mm (L×W×H) |
| Operating Vacuum Range | 10⁻¹–10⁻³ Pa |
| Optional Integrated Functions | Heating (RT to ≥100 °C, ±0.5 °C stability), In-Situ Charge/Discharge (0–30 V / 0–0.5 A), Mechanical Force Application (0–250 N with force curve logging) |
| Brand | Phenom |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X-view Insert |
| Pricing | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | Phenom XL Sample Holder |
| Pricing | Available Upon Request |
| Brand | point electronic |
|---|---|
| Origin | Germany |
| Model | 3D Calibration Kit |
| Compliance | VDI/VDE 2656 |
| Software | microCal Calibration Suite |
| Compatibility | SEM, AFM, CLSM, 3D-SEM |
| Calibration Type | Geometric Metrology (X/Y/Z Scale, Shear, Coupling) |
| Traceability | NIST-traceable reference data provided |