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Global Analytical Technology Co., Ltd.

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BrandPCS Instruments
OriginUnited Kingdom
ModelMTM-EC
Instrument TypeMulti-Functional Tribological Tester
Maximum Friction Force75 N
Temperature RangeAmbient to 150 °C
Contact Pressure Range0–1.25 GPa (standard), up to 3.1 GPa (optional)
Sliding Speed−4 to +4 m/s
Electrochemical Potential Range±60 V (high range), ±10 V (low range)
Current Range0–3.5 A (high), 0–200 mA (low)
Measurement Noise±120 mV / ±20 mA (high), ±20 mV / ±0.4 mA (low)
Sample Volume30 mL (10 mL with optional filler kit)
Dimensions (H×W×D)400 × 400 × 600 mm
Weight30 kg
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BrandPCS Instruments
OriginUnited Kingdom
ModelHPR
Instrument TypeReciprocating Tribological Tester
Maximum Friction Force1–10 N
Temperature RangeAmbient to 130 °C
Load Range1–10 N
Contact Pressure0–1.4 GPa
Frequency Range10–200 Hz
Stroke Length20 µm–1.8 mm
Chamber Pressure Range10⁻⁵ torr to 10 bar
Sample Volume Capacity15 mL
Chamber DesignFully Sealed, Removable & Pressure/Vacuum-Retentive
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BrandERICHSEN
OriginGermany
Model145-60 / 145-100
Maximum Punch Force600 kN / 1000 kN
Maximum Blank Holder Force600 kN / 1000 kN
Maximum Shearing Force700 kN / 1000 kN
Max. Punch Diameter100 mm
Max. Stroke150 mm (250 mm optional)
Blank Holder Stroke38 mm
Ejection Stroke150 mm
Max. Specimen Diameter220 mm
Punch Speedup to 750 mm/min
Cupping Test Thickness Range0.1–6.0 mm
Deep Drawing Thickness Range0.2–3.0 mm (up to 6.0 mm for 145-100)
Hole Expansion Thickness Range0.2–3.0 mm
Operating Temperatureup to 550 °C (high-temp module available)
Control ModeManual & PC-based real-time control
Safety ComplianceEN ISO 13857, EN 692
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BrandVIALUX
OriginGermany
Modelcomsmart
Camera Resolution5.7 MP (standard)
Measurement Area (single capture)390 × 340 mm²
Node Processing Speed15,000 nodes/min
Calibration Time~3 min (fully automated)
Measurement Duration3–5 min per part
Strain Rangeup to >100% (major/minor/eq. thickness strain)
Output FormatsBMP, TIFF, PNG, JPG, VRML, PS, EPS (images)
ComplianceDesigned for ISO/IEC 17025-aligned QA workflows, supports GLP/GMP audit trails via timestamped metadata and user-logged calibration records
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