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| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrumentation |
| Model | C11011 Series |
| Pricing | Available Upon Request |
| Measurement Principle | Laser Interferometry (Infrared, 1300 nm) |
| Max. Measurement Speed | 60 Hz |
| Spot Size | ≈ Ø60 µm |
| Working Distance | 155 mm (standard), optional 1000 mm |
| Thickness Range (Glass) | 25 µm – 2.9 mm |
| Thickness Range (Silicon) | 10 µm – 1.2 mm |
| Repeatability (Glass) | ±250 nm |
| Repeatability (Silicon) | ±100 nm |
| Accuracy (Silicon) | ±0.5 µm (≤500 µm), ±0.1% (>500 µm) |
| Max. Layers Measurable | 10 |
| Interface Options | RS-232C, Ethernet, USB 2.0, PIP (Hamamatsu Proprietary Interface Protocol) |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Power Consumption | ~50 VA |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer | Hamamatsu Photonics K.K. |
| Type | Imported |
| Model | C12562-04 |
| Measurable Thickness Range (on glass substrate, n=1.5) | 500 nm – 300 µm |
| Measurement Repeatability (1 µm glass film) | ±0.2 nm |
| Measurement Accuracy | ±0.4% (per VLSI Standard Measurement Assurance Documentation) |
| Light Source | Halogen lamp |
| Spot Size | ~φ1 mm |
| Working Distance | 10 mm |
| Maximum Layers Analyzable | 10 |
| Analysis Modes | FFT, Curve Fitting, Optical Constant (n, k) Extraction |
| Measurement Speed | Up to 100 Hz (3 ms/point) |
| External Trigger Support | Enhanced TTL-compatible input |
| Interface | RS-232C, Ethernet |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Power Consumption | ~80 VA |
| Fiber Connector | FC |
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