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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Benchtop Laboratory Analyzer |
| Detection Principle | Total Reflection X-Ray Fluorescence (TXRF) |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | 2 pg |
| Sample Volume (Liquid) | 1–50 µL |
| Sample Mass (Solid/Powder) | ≤10 µg |
| Analysis Time | ≤20 min per sample |
| Accuracy | ≤±10% for aqueous matrices |
| Resolution | <160 eV at Mn Kα (100 kcps) |
| Detector | 4th-generation XFlash® Silicon Drift Detector (SDD), Peltier-cooled |
| Calibration | Factory-predefined quantitative calibration curves, matrix-independent quantification enabled by TXRF physics |
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