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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN |
| Application | Field-Portable Soil & Environmental Analysis |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm (typical for heavy metals in soil matrices) |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | RSD ≤ 0.1% (for major elements under optimized conditions) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN600 |
| Application | Handheld/Portable |
| Element Range | Na–U |
| Detection Limit | 1 ppm |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Regulatory Compliance | RoHS II (2011/65/EU), CPSIA 2008, EPA Method 6200, California Proposition 65, US Safe Drinking Water Act |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN |
| Application | Field-Portable Ore & Geochemical Analysis |
| Elemental Range | Mg–U |
| Detection Limit | 1 ppm (typical, matrix-dependent) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX Portable Benchtop XRF Analyzer |
| Application Mode | Benchtop/Portable |
| Industry Type | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Visiconsult |
|---|---|
| Origin | Germany |
| Model | XRHGantry |
| Maximum Tube Voltage | 450 kV |
| Axes | 7 CNC-Programmable Motorized Axes |
| Detector Compatibility | Broad Spectrum (Flat-Panel, Line-Scan, High-Resolution Scintillator-Based) |
| Installation Type | Top-Mounted Gantry Configuration |
| Shielding Requirement | Lead-Lined Room or Dedicated Radiation-Shielded Enclosure |
| Custom Layout Support | Yes |
| Application Scope | Non-Destructive Inspection of Large & Complex Industrial Components |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Innova |
| Instrument Type | Atomic Force Microscope (AFM) |
| Sample Stage Travel Range | 90 µm |
| Positional Detection Noise | < 0.1 nm (RMS, Z-axis, typical in air) |
| Maximum Sample Size Compatibility | 90 mm diameter × 25 mm height |
| Closed-Loop Scan Linearity | ±0.05% over full range |
| Z-Range | 10 µm (standard), upgradable to 15 µm |
| Optical Navigation Resolution | 1.3 MP color CCD with 4×–40× motorized zoom |
| AFM Mode Support | Contact, Tapping, Phase Imaging, Force Modulation, Lateral Force, Conductive AFM, Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M4 TORNADO PLUS |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | C (Z=6) to Am (Z=95) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Compliance | CE, RoHS, IEC 61000-4 series |
| Safety | IEC 62471 (LED/X-ray emission), EN 61326-1 |
| Brand | COX Analytical Systems |
|---|---|
| Origin | Sweden |
| Model | Itrax XRF |
| Configuration | Benchtop/Floor-standing |
| Application Domain | Geological & Sediment Core Analysis |
| Elemental Range | Na (11) – U (92) |
| Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | S1 TITAN |
| Application | Handheld/Portable |
| Industry Type | General-Purpose |
| Elemental Range | Mg–U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN |
| Element Range | Mg–U |
| Detection Limit | 1 ppm–99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ±0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | 50 kV microfocus tube |
| Form Factor | Handheld (1.23 kg) |
| Compliance | ASTM F963, RoHS, USP <232>/<233>, EPA Method 6200, ISO 12885, IEC 62321 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Type | Total Reflection X-ray Fluorescence (TXRF) Spectrometer |
| Model | Blood Heavy Metal Analyzer |
| Element Range | Al (13) to U (92) |
| Detection Limit | 2 pg |
| Sample Volume (Liquid/Suspension) | 1–50 µL |
| Sample Mass (Powder) | <10 µg |
| Detector | 4th-Generation XFlash® SDD Silicon Drift Detector |
| Cooling | Peltier (No Liquid Nitrogen Required) |
| Energy Resolution | <160 eV at Mn Kα (100 kcps) |
| Automation Options | 1-position or 25-position Auto-sampler |
| Compliance | ASTM D7782, ISO 17294-2, USP <232>/<233>, GLP/GMP-ready data integrity features |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Floor-Standing |
| Element Range | Mg–U |
| Detection Limit | 1 ppm |
| Quantitative Range | 0.0001–99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability (RSD) | ≤0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Excitation | Dual X-ray Tube Option with Up to 6 Automatic Filter Positions |
| Optics | Polycapillary Focusing Lens |
| Sample Stage | Motorized X-Y-Z with Turbo Drive |
| Imaging Mode | Real-time Elemental Mapping “On-the-Fly” |
| Vacuum Capability | Integrated Vacuum Chamber |
| Quantification Method | Fundamental Parameters (FP) Algorithm without Standards |
| Compliance | Fully Compatible with ISO 17025, ASTM E1621, and USP <233> for Elemental Impurities |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN |
| Application | Handheld/Portable |
| Element Range | Mg–U |
| Concentration Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | 0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Brand | smartcube |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SmartDIS |
| Pricing | Available Upon Request |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | S2 PICOFOX (TXRF) |
| Configuration | Benchtop |
| Application Scope | General-Purpose |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | Down to 2 pg |
| Quantification Range | ppb to 100% |
| Energy Resolution | <125 eV at Mn Kα (FWHM, 100 kcps), <135 eV typical |
| Repeatability | ≤0.1% RSD |
| Detector | Fourth-Generation XFlash® Silicon Drift Detector (SDD) with Peltier Cooling |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN 300 |
| Application | Handheld/Portable |
| Industry-Specific Type | Non-Ferrous & Alloy Metals |
| Elemental Range | Mg–U (High-Performance Configuration) / Ti–U (Standard Configuration) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CUBE |
| Form Factor | Monolithic ASIC |
| Operating Modes | Pulse-reset and continuous-reset (externally configurable) |
| Input Capacitance Options | Multiple variants available (e.g., 0.1–5 pF range) |
| Power Consumption | 6–60 mW (configurable per variant) |
| Rise Time (detectorless) | 7 ns |
| Die Dimensions | 750 µm × 750 µm × 250 µm |
| Output Drive Capability | Low-impedance, suitable for long interconnects |
| Target Detectors | Silicon Drift Detectors (SDD), PIN diodes, Si(Li), CdTe, CZT, and other solid-state radiation sensors |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITA |
| Application | Handheld/Portable |
| Element Range | Na (11) – U (92) |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Weight | 1.5 kg |
| Compliance | API RP 578, ASTM E2857, ISO 17025 (when operated under accredited conditions), FDA 21 CFR Part 11–ready software configuration |
| Brand | Seaward |
|---|---|
| Origin | United Kingdom |
| Model | Solar Utility Pro |
| Voltage Range | Up to 1500 V DC |
| Current Range | Up to 40 A DC |
| Automation Level | Fully Automatic |
| Compliance | IEC 62446-1, IEC 61587, EN 61000-6-3 |
| Data Storage | Internal memory for up to 999 CSV-formatted test records |
| Interface | Integrated display with real-time IV curve preview |
| Accessories Included | 1.5 m MC4-to-alligator-clip conversion lead, rugged carry case, USB-C data export port |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | S1 TITAN |
| Application | Handheld / Portable |
| Industry Type | General-Purpose |
| Elemental Range | Mg–U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | 50 kV |
| Weight | 1.23 kg |
| Display | Integrated Color Touchscreen |
| Key Technologies | SharpBeam® X-ray Geometry Optimization, SMART®Grade Timing Algorithm, X-Flash® SDD |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Dektak XT |
| Price Range | USD 55,000–68,000 (FOB Hamburg) |
| Vertical Measurement Repeatability | <5 Å |
| Vertical Resolution | 1 Å |
| Accuracy | ±1% of measured step height |
| Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg (adjustable in 0.1 mg increments) |
| Maximum Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Diameter | 50 mm |
| Vertical Measurement Range | Up to 1 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S1 TITAN |
| Application | Handheld/Portable |
| Elemental Range | Mg–U |
| Detection Limit | 1 ppm to 99.99% w/w |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ±0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | 50 kV microfocus |
| Weight | 1.23 kg |
| Compliance | ASTM F963, RoHS, EU Directive 2011/65/EU, California Proposition 65, TPCH, USP <232>/<233>, ISO 17025-aligned operation |
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