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| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Innova |
| Instrument Type | Atomic Force Microscope (AFM) |
| Sample Stage Travel Range | 90 µm |
| Positional Detection Noise | < 0.1 nm (RMS, Z-axis, typical in air) |
| Maximum Sample Size Compatibility | 90 mm diameter × 25 mm height |
| Closed-Loop Scan Linearity | ±0.05% over full range |
| Z-Range | 10 µm (standard), upgradable to 15 µm |
| Optical Navigation Resolution | 1.3 MP color CCD with 4×–40× motorized zoom |
| AFM Mode Support | Contact, Tapping, Phase Imaging, Force Modulation, Lateral Force, Conductive AFM, Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard® 4 XP BioScience |
| Instrument Type | Biological Atomic Force Microscope |
| Software Platform | V7 |
| Category | Scanning Probe Microscope |
| Import Status | Imported |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Price Range | USD 135,000 – 205,000 (est.) |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| Position Detection Noise | <0.15 nm RMS (at typical imaging bandwidth up to 625 Hz) |
| Sample Diameter | Up to 210 mm |
| Sample Thickness Limit | ≤5 mm |
| XY Stage Travel Range | 180 mm × 150 mm |
| XY Repeatability | 2 µm (unidirectional), 3 µm (bidirectional) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | MultiMode 8 |
| Instrument Type | Materials-Focused AFM |
| XY Positioning Noise | ≤0.15 nm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤5 mm |
| Sample Stage Travel Range | 180 mm × 180 mm (visible area) |
| Controller | NanoScope® V |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| XY Positioning Noise | ≤0.15 nm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
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