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| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Dektak XT |
| Price Range | USD 55,000–68,000 (FOB Hamburg) |
| Vertical Measurement Repeatability | <5 Å |
| Vertical Resolution | 1 Å |
| Accuracy | ±1% of measured step height |
| Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg (adjustable in 0.1 mg increments) |
| Maximum Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Diameter | 50 mm |
| Vertical Measurement Range | Up to 1 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-X |
| Pricing | Upon Request |
| Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | DEKTAK XT |
| Measurement Principle | Contact Stylus Profilometry |
| Vertical Resolution | 1 Å |
| Step Height Repeatability | <4 Å |
| Vertical Measurement Range | Up to 1 mm |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN (adjustable) |
| Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Size | 50 mm diameter |
| Accuracy | ±1% of measured value |
| Horizontal Positioning Resolution | 10 nm |
| Data Acquisition Speed | 40% faster than previous generation |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | ContourX-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Key Features | Encoder-equipped XY stage, motorized auto-tilting optical head, auto-brightness adjustment, USI universal scanning mode, pneumatic vibration isolation base, magnification-independent Z-resolution |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XTL |
| Pricing | Available Upon Request |
| Measurement Principle | Capacitive Transduction |
| Measurement Capability | 2D Surface Topography (Optional 3D Reconstruction) |
| Accuracy | ±0.5% of measured step height |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg |
| Maximum Scan Length | 55 µm |
| Step Height Repeatability | 5 Å (1σ, on 1 µm step) |
| Vertical Resolution | Up to 1 Å (within 6.55 µm vertical range) |
| Maximum Sample Size | 300 mm diameter |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dektak Pro |
| Measurement Repeatability | 4 Å |
| Accuracy | ±1% |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.03–15 mg |
| Scan Length | 55 mm |
| Step Height Repeatability | 4 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 200 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NP Flex |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-Light Interferometry (WLI) |
| Maximum Measurement Volume | Up to 300° Angular Access |
| Vertical Resolution | Sub-nanometer |
| Field of View | Full-Area (2D/3D) Acquisition |
| Sample Compatibility | Large, Freeform, and Asymmetric Components |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XT |
| Measurement Principle | Capacitive Transduction |
| Vertical Repeatability | ≤ 5 Å |
| Vertical Resolution | 1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2-inch) |
| Maximum Sample Size | 50 mm |
| Operating Temperature | 10–30 °C |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Measurement Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| XY Stage | Motorized |
| Z-Axis Resolution | Sub-nanometer |
| Field of View | Large, Magnification-Independent |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | VisionXpress™ and Vision64 |
| Surface Reflectivity Range | 0.05% – 100% |
| Sensor Array | 1200 × 1000 pixels |
| Measurement Mode | Universal Scanning Interferometry (USI) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Dektak XT-10th |
| Measurement Principle | Capacitive Probe Sensing |
| Measurement Capability | 2D Surface Topography Profiling |
| Vertical Accuracy | ±1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2 in) |
| Step Height Repeatability | < 5 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 50 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XTL |
| Price Range | USD 95,000 – 135,000 (FOB Hamburg) |
| Measurement Principle | Capacitive Transduction |
| Measurement Capability | 2D Surface Profiling (Optional 3D Reconstruction) |
| Accuracy | ±0.5% of measured step height |
| Probe Tip Radius | 50 nm – 25 µm (interchangeable stylus options) |
| Normal Force Range | 0.3 – 15 mg (motorized force control) |
| Maximum Scan Length | 55 µm (standard) |
| Step Height Repeatability | 5 Å (1σ) on 1 µm step |
| Vertical Resolution | ≤1 Å (at full 6.55 µm vertical range) |
| Maximum Sample Size | Ø300 mm (flat wafers or rectangular substrates up to 300 × 300 mm) |
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