- All
- Favorite
- Popular
- Most rated
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-X |
| Pricing | Upon Request |
| Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | ContourX-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Key Features | Encoder-equipped XY stage, motorized auto-tilting optical head, auto-brightness adjustment, USI universal scanning mode, pneumatic vibration isolation base, magnification-independent Z-resolution |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NP Flex |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-Light Interferometry (WLI) |
| Maximum Measurement Volume | Up to 300° Angular Access |
| Vertical Resolution | Sub-nanometer |
| Field of View | Full-Area (2D/3D) Acquisition |
| Sample Compatibility | Large, Freeform, and Asymmetric Components |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Measurement Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| XY Stage | Motorized |
| Z-Axis Resolution | Sub-nanometer |
| Field of View | Large, Magnification-Independent |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | VisionXpress™ and Vision64 |
| Surface Reflectivity Range | 0.05% – 100% |
| Sensor Array | 1200 × 1000 pixels |
| Measurement Mode | Universal Scanning Interferometry (USI) |
Show next