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| Brand | Bruker |
|---|---|
| Origin | USA |
| Product Type | AFM Cantilever Probes |
| Material | Single-Crystal Silicon or Silicon Nitride |
| Tip Radius | 1 nm – 30 nm (model-dependent) |
| Spring Constant | 0.25 N/m – 450 N/m |
| Resonant Frequency | 10 kHz – 525 kHz |
| Coating Options | Al, Au, PtIr, Cr/Au, Conductive Diamond, DLC, Magnetic CoCr, Ptlr |
| Packaging | Individual Box (10 pcs), Wafer (300–400 pcs), or Custom Sets |
| Compliance | ISO/IEC 17025 traceable calibration available for certified probes |
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