Precision Geometric Measurement Instruments
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| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | QC20-W |
| Type | Precision Geometric Measurement Instrument |
| Core Technology | Dual-Point Kinematic Interferometric Displacement Measurement |
| Communication | Bluetooth 5.0 (Class 1, up to 30 m range in line-of-sight) |
| Sensor Principle | Non-contact capacitive linear displacement sensing with integrated thermal compensation |
| Mechanical Design | Telescopic carbon-fiber arm (standard 100 mm–300 mm extension range, ISO 230-4 compliant length stability ±0.1 µm/°C) |
| Compliance | Fully compatible with ISO 230-4:2022, ANSI B5.54-2020, and VDI/VDE 2617 Part 6 |
| Software Platform | Renishaw Ballbar20 v4.x (Windows 10/11, 64-bit), supports FDA 21 CFR Part 11 audit trail, GLP/GMP-compliant report generation, and automated test sequence scripting |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | REVO™ |
| Pricing | Upon Request |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | RM44 |
| Housing Material | Stainless Steel |
| Protection Rating | IP67 (IEC 60529) |
| Operating Temperature Range | −40 °C to +85 °C |
| EMC Compliance | EN 61000-6-2 / EN 61000-6-4 |
| Shock Resistance | 100 g (6 ms, half-sine) |
| Vibration Resistance | 10 g (10–2000 Hz, random) |
| Output Interface | Incremental (A/B/Z quadrature), Optional Sinusoidal 1 Vpp or RS422 |
| Maximum Resolution | Up to 131,072 counts/rev (configurable via interpolation) |
| Bearing Type | Dual-sealed, maintenance-free ball bearings |
| Electrical Connection | M12 connector (4-pin or 8-pin, depending on interface) |
| Shaft Configuration | Hollow shaft (standard), solid shaft (optional) |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | RMB28 |
| Type | Non-contact, Two-part Optical Encoder Module |
| Mounting | OEM-integrated, Direct-mount Design |
| Environmental Rating | IP64 (when fully assembled with compatible readhead and scale) |
| Output Interface | Analog 1 Vpp Sin/Cos or Digital A/B/Z TTL/RS422 (configurable per variant) |
| Typical Scale Pitch | 20 µm |
| Maximum Speed | >3 m/s (dependent on resolution and interface) |
| Operating Temperature | 0 °C to +50 °C |
| Thermal Expansion Coefficient Matching | Optimized for aluminum and stainless steel substrates |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | RMC |
| Output Signals | RS422 differential quadrature (A/B/Z) + commutation (U/V/W) |
| IP Rating | IP67 (standard), optional IP69K |
| Mounting | Hollow-shaft or servo-mount compatible |
| Electrical Interface | 5 VDC or 10–30 VDC supply |
| Operating Temperature | −20 °C to +85 °C |
| Shock Resistance | 100 g, 6 ms (half-sine) |
| Vibration Resistance | 10 g RMS, 10–2000 Hz |
| Compliance | RoHS, CE, UL Recognized (E330024) |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | RTP20 |
| Probe Type | Integrated TP20 Touch Trigger Probe |
| Indexing Increment | 15° |
| Compatibility | Fully Supported by Standard CMM Controllers (e.g., Renishaw UCC Series) |
| Module Exchange | Compatible with MCR20 Automatic Module Changer Rack |
| Actuation Method | CMM-Motion-Driven Mechanical Engagement (No Internal Motor or Encoder) |
| Classification | Precision Geometric Measurement Instrument — Coordinate Measuring Machine (CMM) Peripheral |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | RX10 |
| Compatible Laser Systems | XL-80 or ML10 Laser Interferometer |
| Angular Accuracy | ≤1 arcsecond (standard), optional 0.5 arcsecond |
| Measurement Cycle Time | ≤25 minutes per full axis check |
| Mounting Orientation | Horizontal, vertical, or inverted |
| Built-in Calibration Routine | Yes |
| Automation Level | Fully motorized axis locking, unlocking, and rotation with auto-alignment and real-time tracking |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | SiGNUM™ |
| Enclosure Rating | IP64 (SR readhead) |
| Thermal Operating Range | −10 °C to +85 °C |
| Maximum Speed | >3600 rpm (at Ø52 mm) |
| Angular Accuracy | ±0.5 arc seconds |
| Repeatability | 0.02 arc seconds |
| Subdivision Error | <±40 nm |
| Scale Pitch | 20 µm |
| Scale Material | Stainless Steel (RESM ring) |
| Installation Flexibility | Tapered Mounting System |
| Signal Processing | SiGNUM™ Intelligent Interpolation |
| Zero Reference | IN-TRAC™ Bidirectional Optical Reference Marks |
| Compliance | RoHS, CE, UKCA |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | SP25M |
| Probe Type | Dual-mode (scanning + touch-trigger) |
| Sensor Integration | Integrated capacitive scanning sensor + mechanical trigger sensor |
| Compatible Shank Lengths | 20 mm to 400 mm |
| CMM Interface | Standard M3, M4, or HSK shank options (per OEM integration) |
| Operating Principle | Capacitive displacement sensing (scanning mode) |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | TP200 |
| Probe Type | Modular Trigger (Kinematic) Probe for CMMs |
| Sensor Technology | Micro-strain Gauge |
| Repeatability | < 0.5 µm (3σ, under controlled conditions) |
| Overtravel Force Options | Standard Force (SF) or Low Force (LF) |
| Interface | PI 200 (Proprietary Renishaw CMM Interface) |
| Toolchanging Compatibility | SCR200 Automatic Probe Change Rack |
| Electronics | ASIC-based Signal Conditioning and Debounce Circuitry |
| Operating Life | > 10⁶ triggers (typical, per module) |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | XL-80 |
| Measurement Principle | Stabilized HeNe laser interferometry (wavelength 632.991 nm, traceable to SI meter) |
| System Accuracy | ±0.5 ppm (0–40 °C, compensated) |
| Resolution | 0.001 µm |
| Max Linear Velocity | 4.0 m/s |
| Sampling Rate | 50 kHz |
| Measurement Range | 0–80 m |
| Laser Warm-up Time | ~6 min |
| Environmental Compensation | XC-80 sensor (updates compensation every 7 s) |
| Laser Source Stability | ±0.05 ppm |
| Beam Height & Optical Compatibility | Fully compatible with ML10 optics and mounts |
| Software Suite | LaserXL™ (step-by-step metrology workflows), QuickViewXL™ (real-time display) |
| Warranty | 3 years standard, extendable to 5 years |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | XL-80 |
| Weight | 12 kg (complete system in portable case) |
| Linear Accuracy | ±0.5 ppm |
| Maximum Linear Velocity | 4 m/s |
| Data Acquisition Rate | 50 kHz |
| Linear Resolution | 1 nm |
| Environmental Compensation | Integrated XC-80 compensator via USB |
| Interface | Native USB connection to PC (no external interface required) |
| Warranty | 3-year standard warranty |
| Compliance | Fully traceable to SI units |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | XL80 |
| Measurement Speed | up to 4.0 m/s |
| Sampling Rate | up to 50 kHz |
| Linear Accuracy | ±0.5 ppm (0–40 °C) |
| Laser Stabilization Accuracy | ±0.05 ppm |
| Resolution | 0.001 µm |
| Maximum Linear Measurement Range | 80 m |
| Warm-up Time | ~6 minutes |
| Environmental Compensation | via XC-80 sensor (7-second update interval) |
| Wavelength Reference | Stabilized HeNe laser (traceable to SI meter) |
| Optical Compatibility | Fully backward-compatible with ML10 interferometer optics |
| Software | LaserXL™ (step-by-step machine tool verification), QuickViewXL™ (real-time display) |
| Portability | Total system weight <15 kg (laser head + XC-80 + cables + power supply + sensors) |
| tripod weight | 6.2 kg |
| Warranty | 3-year standard, extendable to 5 years |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | XR20-W |
| Weight | ~1 kg (unit device), <7 kg (full system in Peli™ case) |
| Measurement Accuracy | ±1 arcsecond |
| Power | Rechargeable battery |
| Connectivity | Bluetooth® 4.0 |
| Compatible Laser Interferometers | XL-80 (standard), ML10 (USB interface version forthcoming) |
| Compliance | Fully calibrated and certified per ISO 10360 and ISO 230-4 prior to shipment |
| Software | Renishaw XCalibrator v3.x with ISO 230-4 / ASME B5.54 preconfigured test templates, automatic alignment calibration, GLP-compliant audit trail |
| Brand | Renishaw |
|---|---|
| Origin | United Kingdom |
| Model | RESOLUTE™ |
| Encoder Type | True Absolute, Fine-Pitch Optical Encoder |
| Maximum Rotational Speed | 36,000 rpm |
| Position Resolution | 27-bit (134,217,728 counts/rev) |
| Output Interface | BiSS-C, EnDat 2.2, or proprietary Renishaw serial protocol |
| Contamination Resistance | Engineered for high-dust, oil-mist, and condensation-prone industrial environments |
| Compliance | Designed to support ISO 9001 manufacturing processes |
| Brand | RHK Technology |
|---|---|
| Origin | USA |
| Model | R10 |
| Type | Integrated Digital SPM Control Platform |
| FPGA Architecture | Reconfigurable Xilinx UltraScale+ |
| Data Channels | 64+ synchronized analog/digital I/O |
| Scan Speed | Up to 5× faster than R9 |
| HV Output Noise | ≤25% of R9 baseline |
| Dual SPM System Support | Yes |
| Position Resolution (Z modulation) | Down to 10 pm RMS |
| Bias Modulation | 10 µV–10 Vpp, DC–10 MHz |
| ADC/DAC Resolution | 16–24 bit, adaptive sampling up to 100 MS/s |
| Compliance | Fully compatible with ASTM E2531, ISO/IEC 17025 workflows, and GLP/GMP data integrity requirements (21 CFR Part 11 audit trail ready via optional software module) |
| Origin | China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | MC012-Y9025D |
| Spindle Radial Error | ±0.02 µm |
| System Accuracy | 0.06 µm |
| Maximum External Diameter | Ø200 mm (expandable) |
| Minimum Internal Diameter | Ø3 mm |
| Maximum Height | 300 mm (extendable) |
| Measurement Range | ≤400 µm (radial deviation) |
| Sensor Resolution | 0.01 µm |
| Maximum Load Capacity | 15 kg |
| Rotational Speed | 6 rpm |
| Power Supply | 220 V, 50 Hz, 250 W |
| Air Supply Pressure | ≥0.45 MPa |
| Encoder | Imported HEIDENHAIN precision rotary encoder |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP Series |
| Product Type | Non-contact Profilometer / Roughness Analyzer |
| Working Principle | White-light Interferometry |
| Camera Resolution | 5 MP Auto-Focus CCD |
| Lateral Sampling Resolution | Adjustable down to 0.05 µm |
| Optical Contrast Modes | Brightfield, Darkfield, Optical DIC |
| Objective Compatibility | Long-working-distance telecentric objectives |
| Application Scope | Transparent thin films, high-aspect-ratio structures, steep slopes, reflectivity-agnostic surface topography |
| Stability | High mechanical and thermal stability |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP Series |
| Measurement Principle | White-Light Interferometry |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Standard Stage | 150 × 150 mm motorized XY stage (optional 210 × 310 mm) |
| Vertical Range | Up to 100 mm |
| Tilt Stage | ±6° |
| XY Stage Resolution | 0.1 µm |
| Imaging Modes | White-Light Interferometry, Rotating-Disk Confocal Microscopy, Dark-Field Microscopy, Bright-Field Microscopy |
| Sensor Heads | Sigma Head (WLI only), Lambda Head (WLI + Confocal + Dark-Field + Bright-Field) |
| Automated Stitching Capability | Yes |
| Software Compliance | ASTM E1250, ISO 25178-2, ISO 4287, USP <1059>, FDA 21 CFR Part 11 audit trail support |
| Brand | Scantech |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Laser-Based 3D Scanner |
| Model | KSCAN-Magic |
| Measurement Speed | 4,150,000 measurements/sec |
| Scanning Accuracy | 0.020 mm |
| Resolution | 0.010 mm |
| Maximum Scan Area | 1440 mm × 860 mm |
| Laser Class | Class II (Eye-Safe) |
| Built-in Photogrammetry System | Standard |
| Volumetric Accuracy | 0.015 mm + 0.030 mm/m (with 1 m high-precision reference bar) |
| Output Formats | STL, PLY, OBJ, IGS, WRL, XYZ, DAE, FBX, MA, ASC |
| Interface | USB 3.0 |
| Operating Temperature | −10 °C to 40 °C |
| Brand | SHINING 3D |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | China |
| Model | EINSTAR VEGA |
| Measurement Speed | 20 FPS |
| Resolution | 0.05 mm – 3 mm |
| Unit Weight | 535 g |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SI-F |
| Pricing | Available Upon Request |
| [Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | SICK Ruler X R100–R600 Series |
| Scan Rate | Up to 46 kHz |
| Repeatability | ≤ ±1 µm |
| Laser Wavelength | 405 nm (blue) or 660 nm (red, configurable) |
| Pixel Resolution | 2560 px (X-axis) |
| Compliance | CE, RoHS, IEC 60947-5-2] |
| Brand | CREAFORM |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | SmartAxis Series |
| Pricing | Upon Request |
| Brand | CREAMFORM |
|---|---|
| Model | SmartFlash |
| Type | High-Precision Vision-Based Displacement & Dimensional Metrology Sensor |
| Origin | Guangdong, China |
| Construction | Full Aluminum Alloy Frame with Crossed-Roller Bearings and Linear Motor Drive |
| Optical System | Dual Telecentric Lenses with Distortion Correction Algorithm |
| Illumination | Multi-Angle + Low-Angle Custom LED Source |
| Image Processing | Sub-Pixel Edge Detection, Burr Filtering, Adaptive Contrast Enhancement |
| Automation | CAD-Driven Program Generation (No Coding Required), Auto-Focus, Automatic Feature Registration |
| Measurement Mode | Parallel Feature Extraction (≥100 Parts, ≥300 Features per Batch) |
| Data Output | Multi-Format Reports (PDF/Excel/CSV), PLC Integration (Modbus TCP, EtherNet/IP, PROFINET) |
| Compliance | Designed for ISO 10360-7 & VDI/VDE 2634 Part 2 Conformance Testing |
| Software | Proprietary Real-Time Metrology Suite with Audit Trail Logging (21 CFR Part 11 Ready) |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Model | SpectrumTEQ-EL |
| Spectrometer Options | QE Pro or QE65 Pro |
| Spectral Range | 350–1100 nm |
| Signal-to-Noise Ratio | 1000:1 (QE Pro) |
| Optical Resolution (FWHM) | 2.5 nm |
| Dynamic Range | 85,000:1 (QE Pro, single acquisition) |
| 25,000 | 1 (QE65 Pro, single acquisition) |
| ADC Resolution | 18-bit (QE Pro) |
| Integrating Sphere Diameter | 3.3" |
| Sphere Coating Material | Spectralon® |
| Source Measure Unit | Keithley 2400 |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | SpectrumTEQ-PL |
| Spectrometer Options | QE Pro or QE65 Pro |
| Spectral Range | 350–1100 nm |
| SNR | 1000:1 |
| Optical Resolution (FWHM) | 2.5 nm |
| Dynamic Range | 85,000:1 (QE Pro, single acquisition) |
| 25,000 | 1 (QE65 Pro, single acquisition) |
| ADC Bit Depth | 18-bit (QE Pro) |
| Integrating Sphere Diameter | 3.3" |
| Sphere Coating | Spectralon® |
| Excitation Source | Fiber-coupled high-power LEDs, tunable wavelength range 365–880 nm, typical FWHM = 14 nm @ 405 nm |
| Brand | Image Metrology |
|---|---|
| Origin | USA |
| Model | SPIP v6.0.14 |
| File Format Support | 92 native SPM/AFM/STM data formats |
| Compliance | ASTM E2528-22 (Standard Guide for SPM Data Analysis), ISO/IEC 17025-aligned workflows |
| Deployment | Windows 10/11 (64-bit), MATLAB R2018a+ integration supported |
| Licensing | Concurrent floating license or node-locked perpetual license |
| Origin | USA |
|---|---|
| Supplier Type | Authorized Distributor |
| Import Status | Imported |
| Model | FPI 100 |
| Pricing | Upon Request |
| Brand | SPL |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Transient (Pulsed) Laser Wavefront Distortion Interferometer |
| Pricing | Upon Request |
| Wavelength Range | UV to Mid-Far IR (customizable per application) |
| Aperture Diameter | 10 mm (standard), scalable per user specification |
| Wavefront RMS Accuracy | < λ/15 |
| Maximum Wavefront Deviation Measurement Range | 50 mm |
| Pulse Width Compatibility | Down to 1 ns |
| Laser Damage Threshold | High |
| Camera Resolution | ≥1024 × 1024 (scientific-grade CCD) |
| Interferometric Architecture | Common-path shearing interferometry |
| Software Output | 3D wavefront phase map, contour plot, PV & RMS values, wavefront gradient, Strehl ratio, OTF, PSF |
| Operating System | Windows 2000 or later |
| Compliance | Compatible with ISO 10110-5, ISO 21254 (Laser Damage Threshold Testing), ASTM E284 (Standard Terminology for Optics), supports GLP/GMP audit trails via optional logging modules |