Profilometer
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| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM45505 |
| Type | Contact Profilometer Stylus |
| Operating Principle | Mechanical Stylus Scanning |
| Compliance | Designed for ISO 4287, ISO 11562, and ASME B46.1 surface texture measurement standards |
| Stylus Tip Radius | 2 µm (nominal) |
| Shank Diameter | 3.2 mm |
| Total Length | 25 mm |
| Material | Single-crystal diamond |
| Mounting Interface | Standard M2.5 threaded shank |
| Compatibility | Interchangeable with Accretech SE300/SE350/SP150 series profilometers and compatible third-party CMM-based surface metrology systems |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | DM45505 |
| Type | Contact Stylus Probe for Surface Profilometry and Roughness Measurement |
| Compliance | Designed for ISO 25178, ISO 4287, ASME B46.1, and JIS B 0601-compliant profilometric systems |
| Mounting Interface | Standard 8-32 UNC threaded shank (compatible with Accretech SJ-410/SJ-510/SJ-610 series, Formtracer series, and other OEM profilometers) |
| Tip Geometry | Spherical diamond tip, nominal radius 2 µm or 5 µm (standard variant), 90° included angle conical backup geometry |
| Shank Diameter | 3.0 mm |
| Total Length | 25 mm |
| Maximum Tracking Force | ≤ 1.5 mN (adjustable via instrument feedback loop) |
| Material | High-purity synthetic diamond tip bonded to hardened stainless steel shank |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Type | Contact Profilometer & Roundness/Cylindricity Measuring Instrument |
| Model | Rondcom GRANDE DUO / GRANDE |
| Bearing System | High-Precision Air Bearing Spindle |
| R-Axis | Flexible Radial Traverse Mechanism (Small to Large Diameter Workpieces) |
| Application Focus | Precision Evaluation of Large-Scale Bearings for Wind Turbines and Heavy Machine Tools |
| Compliance | Designed for ISO 1101, ISO 5436-1, and ASME B89.3.1 standards |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Type | Contact Profilometer / Roughness Tester |
| Model | Rondcom GRANDE DUO / GRANDE |
| Bearing Type | High-Precision Air Bearing |
| R-Axis Flexibility | Adjustable Radial Traverse for Small-to-Large Diameter Components |
| Application Focus | Roundness, Cylindricity, Surface Roughness, and Form Error Measurement of Large-Heavy Industrial Parts |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM 1800G |
| Z-axis Range | 800 mm (Profile) / 50 mm (Roughness) |
| X-axis Range | 100 mm (standard), up to 200 mm (optional -22 system) |
| Z-axis Indication Accuracy | ±0.25% FS (±4 µm within 5 mm range) |
| Z-axis Resolution | 0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm) |
| X-axis Indication Accuracy | ±(1 + 2L/100) µm (L in mm) |
| Straightness Accuracy | (0.05 + 1.5L/1000) mm |
| Measurement Principle | Differential Voltage (Z), Moiré Interferometric Scale (X) |
| Stylus Force | 0.75 mN (roughness), ≤30 mN (profile) |
| Stylus Radius | 2 µm (roughness), 25 µm (profile) |
| Stylus Material | Diamond (roughness), Tungsten Carbide (profile) |
| Vertical Feed Direction | Upward/Downward |
| Horizontal Feed Direction | Pull/Push |
| Filtering Standards | JIS B 0601:2001, ISO 4287, ISO 13565, ASME B46.1, DIN 4768, CNOMO |
| Roughness Parameters | Ra, Rq, Rz, Rmax, Rt, Rv, Rp, Rc, R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR |
| Profile Evaluation | Coordinate transformation, symmetry analysis, intersection detection (line-line, line-circle, circle-circle, etc.), GD&T deviation mapping with on-graph dimensioning, shape synthesis, CNC measurement replay, AI-assisted feature recognition |
| Software Compliance | Supports audit trail, user access control, and data integrity per FDA 21 CFR Part 11 requirements for regulated environments |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM 1800G |
| Z-Axis Range | 50 mm |
| X-Axis Range | 100 mm (200 mm optional) |
| Z-Axis Indication Accuracy | ±0.25% FS (±4 µm within 5 mm) |
| Z-Axis Resolution | 0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm) |
| X-Axis Indication Accuracy | ±(1 + 2L/100) µm (L in mm) |
| X-Axis Straightness | (0.05 + 1.5L/1000) mm |
| Measurement Principle | Contact stylus profilometry with Moiré fringe interferometric X-axis positioning and differential voltage displacement sensing on Z-axis |
| Stylus Force | 0.75 mN (standard), ≤30 mN (max) |
| Stylus Tip Radius | 2 µm or 25 µm (interchangeable) |
| Stylus Material | Diamond or superhard alloy |
| Traverse Speeds | 0.03–6 mm/s (8-step programmable) |
| Vertical Column Speed | 3 mm/s |
| Filter Types | 2RC standard, 2RC phase-corrected, Gaussian |
| Cutoff Wavelengths | 0.025–25 mm (7 standard values) |
| Standards Compliance | JIS B 0601:2001/1994/1982, ISO 4287, ISO 13565, DIN 4768, ASME B46.1, CNOMO |
| Roughness Parameters | Ra, Rq, Rv, Rp, Rc, Rz, Rmax, Rt, Rz(JIS), R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR |
| Profile Evaluation | Straightness, flatness, roundness, curvature, slope, angle, radius, distance, coordinate difference, polar coordinate difference, symmetry (point-point, point-circle, line-line, circle-circle, etc.), envelope wave profile, motif analysis (roughness & waviness), load curve, power spectral density (PSD), amplitude distribution |
| Software Functions | Auto-condition setup (patented AI function), CNC measurement sequence recording & playback, automatic feature recognition & dimensioning, shape synthesis, tilt compensation (linear, R-surface, front/rear/both-end, spline), macro programming, peak/valley search, workpiece trajectory mapping, design vs. actual comparison, mirror inversion |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | SURFCOM NEX 001 |
| Type | Contact Profilometer / Surface Roughness Tester |
| Drive System | Patented High-Precision Linear Motor |
| Temperature Compensation Range | 20 °C ± 5 °C |
| Maintenance | Oil-free, Lubrication-Free Drive Mechanism |
| Compliance | Designed for ISO 25178, ISO 4287, ISO 4288, ASME B46.1, JIS B 0601, and GLP/GMP-aligned metrology workflows |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | SURFCOM NEX 031SD |
| Measurement Principle | Stylus-based profilometry |
| Sensor Type | Dual-purpose (contour + roughness) |
| Standard Stylus Force | 0.75 mN |
| Roughness Vertical Range | ±500 µm |
| Drive Mechanism | Linear motor |
| Temperature Compensation | Yes (20 ± 5 °C operational range) |
| Sensor Mounting | V-groove + three-point ball-pin定位 |
| Quick-change Arm | Yes, with collision detection and auto-stop |
| Measurement Orientation | Upward, downward, lateral (via bracket or stylus reorientation) |
| Compliance Ready | Designed for ISO 4287, ISO 4288, ISO 25178-2, JIS B 0601, ASME B46.1, and GLP/GMP-aligned data integrity workflows |
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Model | SURFCOM NEX |
| Type | Contact Stylus Profilometer |
| Measurement Principle | Mechanical Stylus Tracing (ISO 3274, ISO 4287 compliant) |
| Vertical Resolution | Sub-nanometer (typical ≤0.1 nm) |
| Vertical Range | ±5 mm |
| Scan Length | Up to 100 mm (standard), extendable to 200 mm |
| Stylus Tip Radius | 2 µm (standard diamond tip, 90° included angle) |
| Force | Adjustable from 0.5 mN to 15 mN |
| Surface Roughness Parameters | Ra, Rz, Rq, Rp, Rv, Rt, Rsk, Rku, Rmr, etc. (per ISO 4287/ISO 25178-2) |
| Profile Analysis | Form error, waviness, slope, radius, step height, angle, bearing ratio (Abbott-Firestone curve) |
| Compliance | Fully supports ISO, JIS, ASME B46.1, and DIN standards |
| Software | SURFPAK-SV with GLP/GMP-compliant audit trail, user permission levels, and 21 CFR Part 11-ready electronic signatures |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | NEX |
| Type | Contact Profilometer / Surface Roughness Tester |
| Drive System | Patented Linear Motor-Based X-Axis Drive |
| Measurement Principle | Stylus-Based Profile Tracing with High-Resolution Vertical Displacement Sensing |
| Compliance | Designed for ISO 25178, ISO 4287, ISO 11562, ASME B46.1, and JIS B 0601 Standards |
| Software Platform | SURFCOM Data Analysis Suite with GLP/GMP-Ready Audit Trail (FDA 21 CFR Part 11 Optional) |
| Configuration | Integrated All-in-One Benchtop System (DX or SD variants) |
| Environmental Robustness | Vibration-Isolated Base with Optional PC Enclosure in Anti-Vibration Substructure |
| Brand | ACCRETECH |
|---|---|
| Origin | Japan |
| Model | SURFCOM NEX |
| Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Category | Imported Precision Geometric Measurement Instrument |
| Distributor Status | Authorized General Distributor |
| Price Range | USD 68,000 – 136,000 (FOB Japan) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM Series |
| Type | CNC-Controlled Contact Profilometer with Dual-Mode Sensor Architecture |
| Axes | Up to 5-Axis Synchronized Motion |
| Max. Traverse Speed | 100 mm/s |
| Z-Range | Up to 60 mm (NEX040), 10 mm (CREST LP), 13 mm (CREST DX) |
| X-Range | Up to 200 mm |
| Vertical Resolution | 0.31 nm (CREST DX, laser interferometric sensor) |
| Z-Axis Resolution | 0.02 µm (NEX040, laser diffraction grating encoder) |
| Measurement Modes | Simultaneous roughness & contour (dual-sensor hybrid), upward measurement (with auto-stop), lateral tracing |
| Compliance | ISO 25178-605 (areal surface texture), ISO 4287/4288 (profile-based roughness), ISO 11562 (filtering), ISO 12781 (flatness), ISO 12780 (straightness) |
| Sensor Options | NEX001 (1000 µm range, 500,000× magnification), NEX030 (universal profilometry, high-accuracy linear scale), NEX040 (high-precision, auto-force adjustment), CREST LP (non-contact autofocus mode for low-reflectivity/color-insensitive surfaces) |
| Brand | Accretech Tokyo Seimitsu |
|---|---|
| Origin | Japan |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Variants | 1600G, S1400G, 1800G |
| Distribution Status | Authorized Distributor Supply |
| Compliance Context | Designed for ISO 4287, ISO 4288, ISO 25178-2, and JIS B 0601-compliant surface metrology |
| Brand | Accretech Tokyo Seimitsu |
|---|---|
| Origin | Japan |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Range | 1600G, S1400G, 1800G |
| Compliance | Designed for ISO 25178, ISO 4287, ISO 4288, and JIS B 0601-compliant surface metrology |
| Brand | AEP Technology |
|---|---|
| Origin | USA |
| Model | NANOMAP 500LS |
| Type | Contact-mode profilometer / surface roughness analyzer |
| Vertical Resolution | ≤0.1 nm |
| Lateral Scan Range (Tip Scan) | 10 µm × 10 µm to 500 µm × 500 µm |
| Lateral Scan Range (Stage Scan) | up to 50 mm |
| Maximum Vertical Dynamic Range | 500 µm |
| Measurement Speed | High-speed scanning from 1 nm to 10 mm profiles |
| Sample Handling | No specialized preparation required |
| Brand | AEP Technology |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | NANOMAP D |
| Price Range | USD 65,000 – 130,000 |
| Type | Non-contact + Contact Hybrid Profilometer / Surface Roughness & 3D Topography Analyzer |
| Brand | Alicona |
|---|---|
| Origin | Austria |
| Model | IF-Sensor R25 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Z-Axis Travel | 26 mm (motorized) |
| Max. Scan Height | 25 mm |
| Best Vertical Resolution | 20 nm |
| Min. Measurable Radius | 2 µm |
| Min. Measurable Wedge Angle | 20° |
| Min. Measurable Ra | 80 nm |
| Min. Measurable Sa | 50 nm |
| Max. Tilt Angle Tolerance | 87° |
| Interface Standard | QDAS (Quality Data Acquisition Standard) |
| Brand | Alicona |
|---|---|
| Country of Origin | Austria |
| Model | InfiniteFocus SL |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Tester |
| X/Y Travel Range | 50 mm × 50 mm (motorized) |
| Z Travel Range | 130 mm (26 mm motorized) |
| Best Vertical Resolution | 20 nm |
| Max. Scan Height | 25 mm |
| Working Distance | 17.5 mm (with 5× objective) |
| Max. Field of View Expansion | 2500 mm² |
| Max. Single-direction Measurement Range | 50 mm |
| Min. Measurable Radius | 2 µm |
| Min. Measurable Wedge Angle | 20° |
| Min. Measurable Roughness (Ra) | 80 nm |
| Min. Measurable Areal Roughness (Sa) | 50 nm |
| Brand | ASIDA |
|---|---|
| Model | Manual Vision Measuring Machine (2010/3020/4030/5040 Series) |
| Measurement Principle | Optical Coordinate Metrology with CCD Imaging |
| Base Material | Natural Granite |
| Motion System | Precision Linear Rolling Guides + Friction-Driven Stage |
| Illumination | Adjustable Ring LED Cold Light Source |
| Optics | Manual Zoom Objective (0.7×–4.5× or 0.7×–5.0×) + Interchangeable Eyepieces (0.5×, 1×, 2×) |
| Encoder Resolution | 1 µm |
| XY Axis Accuracy | (3 + L/200) µm (L in mm) |
| Repeatability | ≤ ±3 µm |
| Z-Axis Travel | 150–200 mm |
| XY Travel Range | 200×100 mm to 500×400 mm |
| Stage Load Capacity | 25 kg |
| Working Distance | 90 mm |
| Software | ASIDA VMM3.0D (Multilingual: English, Simplified Chinese, Traditional Chinese) |
| Compliance | Designed for ISO 10360-7 and GB/T 16857.7 alignment with geometric dimensioning and tolerancing (GD&T) workflows |
| Brand | ASIDA |
|---|---|
| Model | VMA Series |
| Type | Fully Automated Vision Measuring Machine |
| Origin | Guangdong, China |
| Construction | Granite Base & Column |
| Motion System | Panasonic Servo Motors (X/Y/Z) |
| Optical System | 0.7×–4.5× Zoom Objective with 25×–225× Total Magnification |
| Illumination | Ring-type LED Cold Light Source |
| Linear Accuracy | (3 + L/200) µm |
| Repeatability | ≤ ±0.003 mm |
| Encoder Resolution | 1 µm |
| Measurement Range (X×Y×Z) | 200×100×150 mm to 500×400×300 mm |
| Software | ASIDA VMA3.00.01 (Multilingual: EN/CN/TC) |
| Output Formats | DXF, Excel, Word |
| Compliance | Designed for ISO 1101, ISO 10360-2, and GD&T metrology workflows |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | NA-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | Sub-nanometer (≤ 0.03 nm) |
| Scan Speed | Up to 400 µm/s |
| Measurement Range | Large-Range Vertical Scanning (Typical Z-range > 10 mm) |
| Compliance | ISO 25178-2, ISO 4287, ASTM E1392, USP <1058> (for instrument qualification) |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | WPM Series |
| Pricing | Upon Request |
| Instrument Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | 0.001 nm |
| Surface Topography Repeatability (PSI mode, 3×3 filter, 1M points, Sqj/� | 2): 0.03 nm |
| Step Height Accuracy (12 µm NIST-traceable step standard, n=50) | ±0.3% |
| XY Positional Repeatability | <0.19 µm |
| Maximum Vertical Scan Speed | 400 µm/s |
| Typical Vertical Scan Speed | 35 µm/s |
| Maximum Lateral Resolution | 0.19 µm |
| Multi-Layer Thin-Film Measurement Capability | Up to 10 layers |
| Roughness Standards Compliance | ISO 25178, ISO 4287, ISO 287 |
| Overlay Measurement Support | Custom algorithm-enabled |
| Bump & RDL Profile Reconstruction | Enabled via phase-resolved interferometric imaging |
| CMP Uniformity Analysis | Full-wafer die-level topography mapping with dishing/erosion quantification |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour Elite |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-light Interferometry (WLI) based on proprietary Wyko® technology |
| Software Platform | Vision64® |
| Configuration Options | Contour Elite K (benchtop, enhanced stability), Contour Elite I (fully automated benchtop with integrated vibration isolation), Contour Elite X (floor-standing configuration with active or passive vibration isolation platform) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour-GT |
| Measurement Principle | White Light Interferometry (WLI) |
| Application Domain | R&D and Production QC/QA in Semiconductor, LED, Solar, Ophthalmic, and Medical Device Manufacturing |
| Compliance Framework | Supports ISO 25178-2:2012, ISO 4287, ASTM E1316, and GLP/GMP-aligned data integrity workflows |
| Software Platform | Bruker Vision64™ (64-bit, multi-threaded analysis engine) |
| Optical Resolution | Sub-micron lateral resolution |
| Vertical Resolution | <0.1 nm (typical) |
| Scan Range | Up to 10 mm vertical, 100 mm lateral (configurable with motorized stages) |
| Field of View | 0.1–10 mm² (objective-dependent) |
| Data Acquisition Speed | Up to 120 frames/sec (full-field WLI) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-X |
| Pricing | Upon Request |
| Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Interface | VisionXpress™ and Vision64® software platforms |
| Vibration Isolation | Integrated passive damping architecture |
| Z-axis Resolution | Sub-nanometer (independent of magnification) |
| Field of View | Maximum standard FOV among benchtop WLI systems |
| Surface Reflectivity Range | 0.05% to 100% |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Principle | White Light Interferometry (WLI) |
| Optical Head | Motorized Tilt & Pitch Adjustment |
| Illumination | Dual-source (broadband white light) |
| Automation | Auto-focus, Auto-surface detection (Advanced Find Surface™), Adaptive USI mode |
| Calibration | Integrated self-calibrating laser reference |
| Vibration Isolation | Built-in active/passive vibration isolation platform |
| Software | VisionXpress™ with guided workflows and ISO-compliant analysis modules |
| Compliance | Fully supports ISO 25178 (areal surface texture), ISO 4287/4288 (profile roughness), ASTM E2926, and GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Measurement Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| XY Stage | Motorized |
| Z-Axis Resolution | Sub-nanometer |
| Field of View | Large, Magnification-Independent |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | VisionXpress™ and Vision64 |
| Surface Reflectivity Range | 0.05% – 100% |
| Sensor Array | 1200 × 1000 pixels |
| Measurement Mode | Universal Scanning Interferometry (USI) |