Profilometer
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White Light Interferometry (WLI) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm RMS noise) |
| Lateral Resolution | Diffraction-limited, dependent on objective magnification (e.g., 0.49 µm at 50×) |
| Camera | 5 MP high-speed CMOS sensor |
| Stage | Motorized XY stage with 100 mm × 100 mm travel |
| Field of View | Up to 4.8 mm × 3.6 mm (with 2.5× objective), scalable via 5×–100× objectives |
| Compliance | Fully supports ISO 25178-2, ISO 4287, ASME B46.1, and NIST-traceable calibration protocols |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | ContourX-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Key Features | Encoder-equipped XY stage, motorized auto-tilting optical head, auto-brightness adjustment, USI universal scanning mode, pneumatic vibration isolation base, magnification-independent Z-resolution |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Automation Features | Motorized XY Stage with Encoders, Programmable Auto-Tilt Optical Head, Auto-Brightness Control, Pneumatic Vibration Isolation Base |
| Software Platform | VisionXpress™ and Vision64® |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dektak Pro |
| Type | Contact Stylus Profilometer |
| Operating Principle | Mechanical Stylus Scanning (Tactile Profilometry) |
| Category | Precision Geometric Measurement Instrument |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NP Flex |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-Light Interferometry (WLI) |
| Maximum Measurement Volume | Up to 300° Angular Access |
| Vertical Resolution | Sub-nanometer |
| Field of View | Full-Area (2D/3D) Acquisition |
| Sample Compatibility | Large, Freeform, and Asymmetric Components |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX 3D |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | Sub-nanometer |
| Measurement Mode | Full-field 3D Topography |
| Sample Flexibility | Large-format, Angled, and Complex-Geometry Samples |
| Optional Modules | Tilted Measurement Head, Through-Transmissive Media (TTM) Module, Folded-Objective Lens |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX-1000 |
| Measurement Principle | White Light Interferometry (WLI) |
| Type | Non-contact 3D Surface Profilometer / Roughness Analyzer |
| Sample Stage Travel | 300 mm X-Y |
| Design | Floor-standing Open-bridge Configuration |
| Software Platform | VisionXpress™ with Adaptive USI Mode and One-click Advanced Surface Find™ |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1392, and USP <1058> analytical instrument qualification frameworks |
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Form Talysurf Inductive |
| Price Range | USD 27,000 – 41,000 (est.) |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Measurement Length | 0.1 mm – 120 mm |
| Drive Method | Joystick or Computer-Controlled Motorized Traverse |
| Vertical Resolution | Up to 0.6 nm |
| Traverse Options | 50 mm / 120 mm / 200 mm Carriages |
| Measurement Modes | 2D Profile, 3D Areal Topography |
| Automation | Fully Programmable Auto-Operation for Batch Testing |
| Software | Multi-Option Analysis Suite with ISO 4287/4288, ISO 25178, ASME B46.1, and EN ISO 11562 Compliance |
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Form Talysurf Intra |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Sensor Type | Inductive |
| Vertical Measurement Range | 1 mm (standard, with 60 mm stylus) / 2 mm (optional, with 120 mm stylus) |
| Vertical Resolution | 16 nm (at 1 mm range), 3.2 nm (at 0.2 mm range) |
| Range-to-Resolution Ratio | 65,536:1 |
| Stylus Force | 0.7–1 mN |
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Form Talysurf PGI |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Travel Length | 200 mm or 120 mm |
| Measurement Principle | Stylus-based Inductive Displacement Sensing |
| Aspheric Measurement Mode | Phase-Grating Interferometric Reconstruction (Reverse Engineering) |
| Profile Range | 4 mm (60 mm diamond stylus, simultaneous roughness & form) / 8 mm (120 mm spherical stylus, form-only) |
| Software Capabilities | 2D/3D surface topography analysis, aspheric deviation mapping, sag table export compliant with optical design software (e.g., Zemax, Code V) |
| Brand | Hexagon |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | CALIPRI C42 |
| Product Category | Non-Contact Profilometer / Surface Topography Analyzer |
| Operating Principle | Laser Triangulation (Triple-Line Optical Sectioning) |
| Profile Accuracy | ±15 µm |
| Measurement Method | Multi-Angle Rotational Scanning with Real-Time Geometric Compensation |
| Compliance | Designed for EN 15663, UIC 515-4, ISO 10012, and applicable railway maintenance standards |
| Brand | Hexagon |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | CALIPRI RCx |
| Price Range | USD 28,000 – 70,000 |
| Product Type | Portable |
| Operating Principle | Laser Triangulation (Non-Contact Optical Profilometry) |
| Lateral Resolution | < 0.2 mm |
| Measurement Accuracy | < 0.2 mm |
| Frame Dimensions | 630 × 710 × 215 mm |
| Frame Weight | < 10 kg |
| Max Measurable Section | Ø170 mm or 135 × 135 mm |
| Measurement Time | 10–20 s per profile |
| Sensor | LLS (Laser Line Scanner) |
| Data Transfer | Wi-Fi (sensor ↔ tablet), Ethernet & USB (data export) |
| Report Output | PDF, XML, CSV, DXF |
| Tablet Display | 10.1″ WUXGA (1920 × 1200), Touch + Stylus Support |
| Tablet Weight | 1300 g |
| Battery Life | ~5 h (Li-ion) |
| Tablet Dimensions | 270 × 188 × 38 mm |
| IP Rating | IP65 |
| Brand | KEYENCE |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | LJ-V7000 |
| Pricing | Available Upon Request |
| Brand | KEYENCE |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | VR-6000 |
| Measurement Principle | Confocal Chromatic Aberration + High-Dynamic-Range (HDR) Optical Scanning |
| Vertical Resolution | 100 nm |
| Lateral Resolution | 100 nm |
| Product Type | Non-Contact 3D Profilometer / Surface Roughness & Form Measuring System |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | Alpha-Step D-600 |
| Measurement Principle | Stylus-based mechanical profilometry with optical lever amplification |
| Vertical Range | Up to 1200 µm |
| Vertical Resolution | Sub-nanometer (typical) |
| Stylus Normal Force | Adjustable from 0.03 mg to 15 mg |
| Optical System | Integrated 5 MP color camera with trapezoidal distortion correction and arc trajectory compensation |
| Footprint | Compact desktop configuration |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1077, ASTM E1316, and semiconductor industry metrology workflows (SEMI, JEDEC) |
| Software | Alpha-Step Analysis Suite with audit trail, user access control, and export compliance per FDA 21 CFR Part 11 requirements |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Range | D-500, D-600, P-7, P-17 |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1093, USP <1056>, and GLP/GMP-aligned workflows |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | Fimetrics P3D |
| Measurement Principle | White-Light Interferometry |
| Type | Non-Contact 3D Surface Profilometer / Roughness Analyzer |
| Key Resolution | Sub-nanometer vertical resolution (≤0.1 nm typical) |
| Field-of-View Scalability | Multi-field stitching enabled |
| Optical Configuration | Phase-shifting and vertical-scanning interferometry (CSI) |
| Compliance Basis | Designed for ISO 25178-2, ISO 4287, ASTM E1392, and VDI/VDE 2634 Part 3 |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | HRP®-260 |
| Measurement Principle | Stylus-based contact profilometry with dual-stage scanning (macro-stage + high-resolution piezo stage) |
| Scan Range | 200 mm (macro), 90 µm (high-res piezo) |
| Step Height Range | 0.1 nm to 327 µm |
| Normal Force Range | 0.03–50 mg |
| Sample Diameter Support | 75–200 mm (opaque & transparent substrates) |
| Automation | Fully automated wafer handling, pattern recognition, SECS/GEM compliance |
| Software | Integrated metrology suite with ISO 4287/4288, ASME B46.1, and SEMI E10/E126 compliant analysis modules |
| Data Management | Audit-trail enabled, FDA 21 CFR Part 11 ready, GLP/GMP traceable reporting |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | HRP®-260 |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Horizontal Scan Range (Long-Range Stage) | 200 mm (no stitching required) |
| High-Resolution Stage Travel | 90 µm × 90 µm |
| Vertical Resolution | 1 nm |
| Stylus Normal Force Range | 0.03–50 mg |
| Step Height Measurement Range | <1 nm to 327 µm |
| Stylus Tip Radius Options | 20 nm – 50 µm |
| Stylus Included | DuraSharp® diamond stylus (40 nm radius) |
| Wafer Handling | Automatic robotic loading for 75–200 mm opaque (e.g., Si, GaAs) and transparent (e.g., sapphire) substrates |
| Compliance | SEMI E4, E5, E30, E37 |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | P-17 |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Scan Range | Up to 200 mm (no image stitching required) |
| Step Height Range | 1 nm to 1000 µm |
| Stylus Force Control | 0.03–50 mg |
| Camera Resolution | 5 MP color, optical zoom |
| Compliance | SEMI E4, E5, E30, E37 |
| Software Platform | Apex Analysis Software (ISO/ASME-compliant), Offline Analysis Module, SECS/GEM & HSMS support |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | P-170 |
| Product Category | Contact Stylus Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-based Contact Profilometry |
| Brand | KLA |
|---|---|
| Model | Profilm 3D |
| Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White Light Interferometry (WLI) with Vertical Scanning Interferometry (VSI) and Phase-Shifting Interferometry (PSI) |
| Vertical Range | VSI: 50 nm – 100 mm |
| PSI | 0 – 3 µm |
| Reflectance Range | 0.05% – 100% |
| Piezo Scan Range | 500 µm |
| XY Stage Travel | 100 mm × 100 mm |
| Compliance | ISO 25178-604, ISO 4287, ISO 4288, ASME B46.1, ASTM E2923 |
| Software | ProfilmOnline™ Cloud-Based Analysis Platform |
| Data Export | CSV, TIFF, BMP, OBJ, STP, DXF |
| Roughness Parameters | 47 ISO/ASME/EUR-compliant parameters |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Profilm3D |
| Product Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry |
| Measurement Modes | Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI) |
| Z-Stage Travel | 100 mm |
| Objective Turret | 5×–100× (Michelson 5×, Mirau 10×/20×/50×/100×) |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZETA-20 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-light Interferometry |
| Key Imaging Technology | ZDot™ 3D Imaging |
| Vertical Resolution | Sub-Ångström (≤0.1 nm) |
| Measurement Modes | Six Integrated Optical Modules |
| Surface Reflectivity Range | 0.5% – >85% |
| Output | True-color 2D/3D Images |
| Compliance | ASTM E2921, ISO 25178-2, ISO 4287, USP <1056>, FDA 21 CFR Part 11 Ready (via optional software module) |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | Zeta-20 |
| Product Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principles | ZDot™ Multi-Mode Imaging, White Light Interferometry (WLI), Nomarski Differential Interference Contrast (DIC), Shear Interference, Broadband Reflectometry, Automated Optical Inspection (AOI) |
| Vertical Resolution | Sub-nanometer (typical, dependent on mode) |
| Lateral Resolution | ~0.4 µm (optical diffraction-limited) |
| Step Height Range | 1 nm – 10 mm |
| Surface Roughness Range | Ra 0.01 nm – 50 µm |
| Film Thickness Range | 30 nm – 100 µm (transparent films) |
| Defect Detection Limit | ≥1 µm |
| Field of View | Up to 8 mm × 6 mm (configurable via objective lenses) |
| Objective Lenses | 2.5×, 5×, 10×, 20×, 50×, 100× (motorized turret) |
| Software Platform | ZetaWare™ v6.x (GLP/GMP-compliant, 21 CFR Part 11 ready) |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Zeta-20 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | Multi-Mode Optical Interferometry (ZDot™, White-Light Interferometry, Nomarski DIC, Shear Interference), Spectral Reflectometry |
| Key Capabilities | 3D Topography, True-Color Imaging, Step Height (0.008 nm – 10 mm), Surface Roughness (Ra down to sub-Å), Film Thickness (30 nm – 100 µm), Automatic Defect Detection (>1 µm), Wafer-Scale Warpage & Stress Analysis |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Zeta-300 |
| Product Type | Non-contact profilometer / surface roughness analyzer |
| Measurement Principle | Multi-mode optical interferometry (ZDot™, white-light interferometry, Nomarski differential interference contrast, shear interferometry) |
| Optical Capabilities | Simultaneous high-resolution 3D topography and true-color surface imaging |
| Vertical Resolution | Sub-nanometer (ZIC/ZSI), <0.1 nm (PSI), ≤1 nm (VSI) |
| Step Height Range | 0.8 nm to 1 mm |
| Surface Roughness Range | <0.05 nm RMS to >100 µm Sa |
| Film Thickness Range (ZFT) | 30 nm – 100 µm (transparent films) |
| Defect Detection Limit | ≥1 µm lateral resolution |
| Maximum Sample Size | Up to 280 mm Z-height |
| Compliance | ISO 25178, ISO 4287/4288, ASME B46.1, NIST-traceable calibration standards |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CS1 |
| Pricing | Available Upon Request |
| Substrate Diameter Range | 2 in. – 200 mm |
| Substrate Thickness Range | 350 μm – 1,100 μm |
| Material Compatibility | Opaque or transparent polished surfaces with ≥10% light scattering efficiency |
| Defect Detection Sensitivity | 0.3 μm PSL sphere equivalent (≥95% capture rate on bare Si) |
| Minimum Detectable Features | Scratches (100 μm × 0.1 μm × 50 Å), Pits (20 μm Ø × 50 Å depth), Stains (20 μm Ø × 10 Å thickness) |
| Signal Threshold | Defect signal amplitude >3× peak-to-valley background noise |
| Brand | Klocke Nanotechnik |
|---|---|
| Origin | Germany |
| Product Type | Contact-Mode 3D Profilometer / Surface Topography & Roughness Measuring System |
| Measurement Range (X/Y/Z) | 10–50 mm / 10–50 mm / 10–20 mm |
| Extended XY Travel | 100 × 100 mm² or 350 × 350 mm² |
| Motion Resolution | 1 nm |
| Tip Resolution | 0.5 nm |
| Probe Types | Metallic wire tip (radius < 100 nm), hook-type wire tip (radius < 100 nm), spherical tip (Ø 0.12–0.3 mm), diamond tip (for indentation) |
| Sensor Configuration | Dual-axis (horizontal & vertical) capacitive displacement sensors |
| Software Features | Automated tip calibration & approach, 2D/3D visualization, quantitative surface analysis, optional sequence generator for automated measurement routines |
| Brand | Leica |
|---|---|
| Origin | Germany |
| Model | DM4 M |
| Type | Upright Metallurgical Microscope |
| Measurement Principle | Reflected Light Optical Microscopy (Not White Light Interferometry) |
| Automation Level | Semi-Automatic (Motorized Objective Turret, Motorized XY Stage, Adjustable LED Illumination) |
| Application Domain | Metallographic Structure Observation, Grain Size Analysis, Phase Identification, Failure Analysis, QC/QA in Metals & Alloys |
| Compliance | Designed for ISO 9001, ASTM E3, ASTM E112, ASTM E1245, ISO 643, ISO 10770-1, and GLP-compliant documentation workflows |