Profilometer
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Showing 61–90 of 93 results
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | Zeta-300 |
| Product Type | Non-contact profilometer / surface roughness analyzer |
| Measurement Principle | Multi-mode optical interferometry (ZDot™, white-light interferometry, Nomarski differential interference contrast, shear interferometry) |
| Optical Capabilities | Simultaneous high-resolution 3D topography and true-color surface imaging |
| Vertical Resolution | Sub-nanometer (ZIC/ZSI), <0.1 nm (PSI), ≤1 nm (VSI) |
| Step Height Range | 0.8 nm to 1 mm |
| Surface Roughness Range | <0.05 nm RMS to >100 µm Sa |
| Film Thickness Range (ZFT) | 30 nm – 100 µm (transparent films) |
| Defect Detection Limit | ≥1 µm lateral resolution |
| Maximum Sample Size | Up to 280 mm Z-height |
| Compliance | ISO 25178, ISO 4287/4288, ASME B46.1, NIST-traceable calibration standards |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CS1 |
| Pricing | Available Upon Request |
| Substrate Diameter Range | 2 in. – 200 mm |
| Substrate Thickness Range | 350 μm – 1,100 μm |
| Material Compatibility | Opaque or transparent polished surfaces with ≥10% light scattering efficiency |
| Defect Detection Sensitivity | 0.3 μm PSL sphere equivalent (≥95% capture rate on bare Si) |
| Minimum Detectable Features | Scratches (100 μm × 0.1 μm × 50 Å), Pits (20 μm Ø × 50 Å depth), Stains (20 μm Ø × 10 Å thickness) |
| Signal Threshold | Defect signal amplitude >3× peak-to-valley background noise |
| Brand | Klocke Nanotechnik |
|---|---|
| Origin | Germany |
| Product Type | Contact-Mode 3D Profilometer / Surface Topography & Roughness Measuring System |
| Measurement Range (X/Y/Z) | 10–50 mm / 10–50 mm / 10–20 mm |
| Extended XY Travel | 100 × 100 mm² or 350 × 350 mm² |
| Motion Resolution | 1 nm |
| Tip Resolution | 0.5 nm |
| Probe Types | Metallic wire tip (radius < 100 nm), hook-type wire tip (radius < 100 nm), spherical tip (Ø 0.12–0.3 mm), diamond tip (for indentation) |
| Sensor Configuration | Dual-axis (horizontal & vertical) capacitive displacement sensors |
| Software Features | Automated tip calibration & approach, 2D/3D visualization, quantitative surface analysis, optional sequence generator for automated measurement routines |
| Brand | Leica |
|---|---|
| Origin | Germany |
| Model | DM4 M |
| Type | Upright Metallurgical Microscope |
| Measurement Principle | Reflected Light Optical Microscopy (Not White Light Interferometry) |
| Automation Level | Semi-Automatic (Motorized Objective Turret, Motorized XY Stage, Adjustable LED Illumination) |
| Application Domain | Metallographic Structure Observation, Grain Size Analysis, Phase Identification, Failure Analysis, QC/QA in Metals & Alloys |
| Compliance | Designed for ISO 9001, ASTM E3, ASTM E112, ASTM E1245, ISO 643, ISO 10770-1, and GLP-compliant documentation workflows |
| Brand | LUMINA |
|---|---|
| Origin | USA |
| Model | AT1 |
| Type | Non-contact Profilometer / Surface Metrology System |
| Measurement Principle | Multi-modal Optical Scattering, Ellipsometry, Reflectometry, and Surface Slope Analysis |
| Sample Compatibility | Transparent (e.g., fused silica, sapphire, glass), semi-transparent (e.g., GaN, SiC), and opaque substrates (e.g., Si, GaAs, InP, metals) |
| Scan Area | Up to 300 × 300 mm |
| Wafer Handling | Supports 150 mm wafers (full-surface scan in ≤ 3 min), 50 × 50 mm samples in ≤ 30 s |
| Detection Sensitivity | Sub-nanometer vertical resolution for film thickness uniformity |
| Mechanical Architecture | Fixed-optics, non-rotating platform with high inertial damping |
| Regulatory Alignment | Designed for GLP/GMP-compliant environments |
| Brand | Mahr |
|---|---|
| Origin | Germany |
| Model | MarSurf LD 130 Series |
| Measurement Principle | Stylus-based profilometry |
| Probe Type | Contact stylus |
| Max. Measuring Length | 130 mm (with 100 mm stylus) / 260 mm (with 200 mm stylus) |
| Vertical Travel | 13 mm / 26 mm |
| Vertical Resolution | Sub-nanometer |
| Residual Noise | <20 nm Rz |
| Probe Exchange | Magnetic quick-lock system |
| Structural Design | Modular architecture |
| Origin | China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | MC012-XZ-150 |
| Motion System | Air-bearing Z-axis & Precision Linear Stage |
| Vertical Resolution | 1/65536 (equivalent to ≤0.03 µm typical interpolation resolution) |
| Vertical Range | 6 mm (extendable) |
| Horizontal Travel (X) | 150 mm |
| Z-axis Linearity Error | ≤0.2 µm over 80 mm |
| X-axis Encoder Accuracy | ≤5 µm over 150 mm |
| Workpiece Capacity | Ø1–100 mm shafts, up to Ø200 mm rings, max length 140 mm |
| Traverse Speed | 0.2–0.4 mm/s (3-step mechanical speed control) |
| Power Supply | 220 V, 50 Hz, 0.5 kW |
| Pneumatic Requirement | Clean, dry air ≥0.5 MPa |
| Origin | China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | MC012-XZ-150G |
| Quotation | Upon Request |
| Z-Axis Linear Motion Accuracy | ≤0.2 µm / 100 mm |
| X-Axis Grating Resolution | ≤3 µm / 150 mm |
| Sensor Range | 6 mm (expandable) |
| Maximum Workpiece Diameter | Ø100 mm (shaft), Ø200 mm (sleeve) |
| Effective Measurement Length | 140 mm |
| Air Bearing Stage | Closed-type Pneumatic Float |
| Traverse Speed | 0.2–0.4 mm/s (3-step mechanical speed control) |
| Power Supply | 220 V, 50 Hz, 0.5 kW |
| Clean Air Requirement | ≥0.5 MPa |
| Origin | China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | MC012-XZ-230 |
| Motion Platform | Precision Air-Bearing Stage (Open-Type) |
| Vertical (Z) Motion Accuracy | ≤0.2 µm / 100 mm |
| Horizontal (X) Positioning Accuracy (via Linear Encoder) | ≤5 µm / 220 mm |
| Sensor Range | 12 mm |
| Resolution | 1/65536 steps |
| Measurable Shaft Diameter | Φ1–180 mm |
| Max Workpiece Outer Diameter | ≤Φ200 mm |
| Max Measurable Length | 200 mm |
| Traverse Speed | 0.05–0.4 mm/s (4-step microcomputer-controlled speed regulation) |
| Power Supply | 220 V, 50 Hz, 0.5 kW |
| Pneumatic Supply | Clean, oil-free air ≥0.5 MPa |
| Brand | MVP |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Models | Supra E, Ultra 850G, Spectra, Ultra |
| Pricing | Upon Request |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NanoFocus μScan |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Scan Modules | SC 50 (50×50 mm XY range, 0.5 µm XY resolution, 100 mm Z positioning, 50 mm/s max speed) |
| Z-Sensors | Confocal Point (CF 4: 0.02 µm Z res, 1 µm XY res, 4 mm WD, 1.0 mm Z range |
| CF 13 | same Z res, 13 mm WD) |
| Autofocus (AF 2 | 0.025/0.011 µm Z res, 2 mm Z range, dual WD modes) |
| Chromatic White Light (CRT 5 | 0.010 µm Z res, 4 µm XY res, 5 mm Z range, 0.3 mm WD) |
| Holographic (CP 15 | 3.0 µm Z res, 12 µm XY res, 12 mm Z range) |
| System Controller | Industrial PC with Windows XP Professional, DVD writer, Ethernet |
| Mechanical Platforms | MT 70 cabinet (1550×800×750 mm), MP 100 granite stand (660×450×497 mm) for SC 50–SC 150, MP 200 (680×480×385 mm) for SC 200 |
| Software | NF μsoft (DIN EN ISO-compliant roughness analysis, profile & topography rendering), NF 3D-Plus (OpenGL-based photorealistic 3D visualization), NF ActiveX (VBA/Excel integration), NF Hybridmaster (SMT thick-film SPC & teach-in), NF Flatmaster (flatness/warpage automation), NF Solder (offline solder paste inspection), NF AutoScan (arbitrary-point profiling) |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Nanofocus μSurf |
| Pricing | Upon Request |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP Series |
| Product Type | Non-contact Profilometer / Roughness Analyzer |
| Working Principle | White-light Interferometry |
| Camera Resolution | 5 MP Auto-Focus CCD |
| Lateral Sampling Resolution | Adjustable down to 0.05 µm |
| Optical Contrast Modes | Brightfield, Darkfield, Optical DIC |
| Objective Compatibility | Long-working-distance telecentric objectives |
| Application Scope | Transparent thin films, high-aspect-ratio structures, steep slopes, reflectivity-agnostic surface topography |
| Stability | High mechanical and thermal stability |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP Series |
| Measurement Principle | White-Light Interferometry |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Standard Stage | 150 × 150 mm motorized XY stage (optional 210 × 310 mm) |
| Vertical Range | Up to 100 mm |
| Tilt Stage | ±6° |
| XY Stage Resolution | 0.1 µm |
| Imaging Modes | White-Light Interferometry, Rotating-Disk Confocal Microscopy, Dark-Field Microscopy, Bright-Field Microscopy |
| Sensor Heads | Sigma Head (WLI only), Lambda Head (WLI + Confocal + Dark-Field + Bright-Field) |
| Automated Stitching Capability | Yes |
| Software Compliance | ASTM E1250, ISO 25178-2, ISO 4287, USP <1059>, FDA 21 CFR Part 11 audit trail support |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SI-F |
| Pricing | Available Upon Request |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Model | SpectrumTEQ-EL |
| Spectrometer Options | QE Pro or QE65 Pro |
| Spectral Range | 350–1100 nm |
| Signal-to-Noise Ratio | 1000:1 (QE Pro) |
| Optical Resolution (FWHM) | 2.5 nm |
| Dynamic Range | 85,000:1 (QE Pro, single acquisition) |
| 25,000 | 1 (QE65 Pro, single acquisition) |
| ADC Resolution | 18-bit (QE Pro) |
| Integrating Sphere Diameter | 3.3" |
| Sphere Coating Material | Spectralon® |
| Source Measure Unit | Keithley 2400 |
| Brand | Ocean Optics |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | SpectrumTEQ-PL |
| Spectrometer Options | QE Pro or QE65 Pro |
| Spectral Range | 350–1100 nm |
| SNR | 1000:1 |
| Optical Resolution (FWHM) | 2.5 nm |
| Dynamic Range | 85,000:1 (QE Pro, single acquisition) |
| 25,000 | 1 (QE65 Pro, single acquisition) |
| ADC Bit Depth | 18-bit (QE Pro) |
| Integrating Sphere Diameter | 3.3" |
| Sphere Coating | Spectralon® |
| Excitation Source | Fiber-coupled high-power LEDs, tunable wavelength range 365–880 nm, typical FWHM = 14 nm @ 405 nm |
| Brand | Image Metrology |
|---|---|
| Origin | USA |
| Model | SPIP v6.0.14 |
| File Format Support | 92 native SPM/AFM/STM data formats |
| Compliance | ASTM E2528-22 (Standard Guide for SPM Data Analysis), ISO/IEC 17025-aligned workflows |
| Deployment | Windows 10/11 (64-bit), MATLAB R2018a+ integration supported |
| Licensing | Concurrent floating license or node-locked perpetual license |
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Talysurf CCI |
| Pricing | Available Upon Request |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CCI MP-HS |
| Pricing | Available Upon Request |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | PGI Freeform |
| Type | Contact Profilometer / Surface Roughness Tester |
| Measurement Principle | Stylus-based Scanning Interferometry with Radial & Grid Scan Modes |
| Vertical Range | 28 mm |
| Vertical Resolution | 0.8 nm |
| Tilt Capability | ±50° |
| Form Error Accuracy | <150 nm PV (as per ISO 5436-1 and ISO 25178-2) |
| Compliance | ASTM E1155, ISO 10360, ISO 25178, ISO 5436-1, USP <1058> for metrological validation |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | LuphoScan 260HD / 420HD |
| Measurement Principle | Multi-Wavelength Interferometry (MWLI®) |
| Maximum Measurable Diameter | 260 mm / 420 mm |
| Vertical Resolution | < 50 nm |
| Typical Measurement Time (30 mm spherical lens) | < 120 s |
| Typical Measurement Time (130 mm spherical lens) | < 330 s |
| Sample Type | Rotationally Symmetric Optics (aspheres, spheres, flats, freeforms) |
| Sensor Compatibility | Transparent optics, polished metals, ground surfaces |
| Software Platform | Form Talysurf® with LuphoScan Module |
| Compliance | ISO 10110-5, ISO 14999-2, ISO 25178, ASTM E2925, supports GLP/GMP audit trails |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | LuphoScan120 / LuphoScan260 / LuphoScan420 |
| Measurement Principle | Multi-Wavelength Interferometry (MWLI®) |
| Maximum Workpiece Diameter | 120 mm / 260 mm / 420 mm |
| Vertical Resolution | < 0.1 nm (sub-nanometer) |
| Shape Accuracy | ≤ ±50 nm (traceable to NPL/PTB standards) |
| Scan Speed | Full 3D topography of 30 mm spherical surface < 2 min |
| Surface Compatibility | Transparent optics (fused silica, CaF₂, BK7), polished metals, ground surfaces, coated substrates |
| Software Platform | Form Talysurf® with LuphoScan Module (ISO 10110-5, ISO 14999-1, ISO 25178 compliant) |
| Regulatory Compliance | Supports GLP/GMP audit trails, 21 CFR Part 11 electronic signature readiness, full measurement traceability per ISO/IEC 17025 |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | PGI Freeform |
| Type | Contact Profilometer / Surface Roughness & Form Measuring System |
| Measurement Principle | Precision Stylus-Based Scanning with Radial and Grid Mapping |
| Vertical Range | 28 mm |
| Vertical Resolution | 0.8 nm |
| Tilt Capability | ±50° |
| Form Error Accuracy | <150 nm PV (as per ISO 5436-1, ISO 25178) |
| Compliance | ASTM E1155, ISO 10360-5, ISO 21920-2, ISO 25178-600 |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | PGI Freeform |
| Measurement Principle | Contact Stylus Profilometry with Radial & Grating-Scan Modes |
| Vertical Range | 28 mm |
| Vertical Resolution | 0.8 nm |
| Tilt Capability | ±50° |
| Form Error Accuracy | <150 nm PV |
| Motion Architecture | FEA-Optimized Ultra-Stiff Mechanical Axes |
| Compliance | ISO 10360, ISO 1101, ISO 16610, ISO 25178 (Part 2, Part 601–607), ASTM E1155, USP <1059>, GLP/GMP-ready audit trail support in software |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | PGI Matrix 1 / PGI Matrix 3 / PGI Matrix 5 |
| Type | Contact Profilometer / Surface Roughness Tester |
| Measurement Principle | Precision Stylus-Based Topographic Profiling with PGI (Precision Geometry Interferometry) Signal Processing |
| Software Platform | Form Talysurf Intra (v6.0+) with Advanced Aspheric Analysis Unit (AAU) |
| Compliance | ISO 25178-2, ISO 4287, ISO 11562, ISO 12780, ASTM E1158, USP <1058> (Analytical Instrument Qualification), FDA 21 CFR Part 11 (Audit Trail & Electronic Signatures Enabled) |
| Environmental Compensation | Real-time X-axis & radius thermal drift compensation algorithm |
| Key Output Metrics | Residual form error (sub-micron), aspheric deviation (nm-level), slope error (µrad), ring zone depth, diffraction step height reconstruction, reverse-coefficient fitting for aspheric/diffractive surfaces |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | PGI Matrix 1 / PGI Matrix 3 / PGI Matrix 5 |
| Category | Precision Geometric Measurement Instrument (Optical Profilometer) |
| Compliance | ISO 25178-2, ISO 10110-5, ISO 1101, ASTM E2923, USP <1058> (for instrument qualification), FDA 21 CFR Part 11 ready (with optional audit trail module) |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | S116 / S128 |
| Type | Contact Profilometer & Surface Roughness Tester |
| Drive Mechanism | Stainless Steel Linear Actuator |
| Probe Lift Range | 50 mm |
| Maximum Measurement Depth | 70 mm |
| Display | 4.3-inch TFT Touchscreen (Rotatable 360°) |
| Battery | High-Capacity Lithium-Polymer (≥2000 measurements per charge |
| Interface | USB-A 2.0 (printer/data export), Micro-USB 2.0 (charging/data transfer) |
| Environmental Durability | Rubberized Shock-Absorbing Housing, Polyester Touchscreen Overlay, Wear-Resistant Gearing |
| Mounting Flexibility | V-Groove Feet for Flat or Curved Surfaces, Inverted Probe Capability |
| Parameter Display | Up to 7 roughness parameters simultaneously on single screen |
| Brand | Taylor Hobson |
|---|---|
| Origin | United Kingdom |
| Model | S116 / S128 |
| Battery Life | ≥2000 measurements per charge |
| Standby Time | Up to 5000 hours |
| Vertical Travel | 50 mm (with optional right-angle probe for up to 70 mm depth access) |
| Display | 4.3-inch capacitive touchscreen, rotatable in four orientations |
| Interface | USB Type-A 2.0 (printer/data storage), Mini-USB 2.0 (charging/data transfer) |
| Housing | Rubberized impact-resistant polymer casing |
| Touchscreen Overlay | Durable polyester film |
| Drive Mechanism | Stainless steel gear-and-bearings assembly |
| Probe Orientation | Standard and inverted (underside measurement capability) |
| Foot Design | V-groove anti-slip base for flat or curved surfaces |
| Compliance | Designed for ISO 4287, ISO 4288, ISO 25178-2, ASME B46.1, and relevant EN standards |
| Origin | Taiwan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Regional Classification | China-sourced |
| Model | YT9511 |
| Pricing | Available Upon Request |