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| Brand | AYAO Instruments |
|---|---|
| Origin | Hubei, China |
| Model | OPA |
| Type | Optical Power-Based Thermal Dilatometer & Phase Transition Analyzer |
| Measurement Principle | Optical Interferometry (for thermal expansion) + Reflectance Power Monitoring (for phase transition) |
| Sample Form | Free-standing films, substrate-supported thin films, bulk materials |
| Minimum Film Thickness | 1 nm |
| Non-Destructive Testing | Yes |
| Dual-Parameter Output | Coefficient of Thermal Expansion (CTE) and Phase Transition Temperature (e.g., crystallization, melting, glass transition) |
| Compliance Context | Designed for R&D environments requiring traceable, repeatable thermal property data in accordance with ISO 11359 (thermomechanical analysis), ASTM E831 (linear thermal expansion), and GLP-aligned data integrity practices |
| Brand | AiYao Instruments |
|---|---|
| Origin | Hubei, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | TRT |
| Pricing | Available Upon Request |
| Brand | Aiyao Instruments |
|---|---|
| Origin | Hubei, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | PCA |
| Pricing | Available Upon Request |
| Brand | Aiyao Instruments |
|---|---|
| Model | TEA |
| Measurement Principle | Optical Interferometry |
| Sample Type | Transparent Bulk & Thin-Film Materials |
| Heating Method | IR Heater with PID + Fuzzy Logic Control |
| Temperature Control Mode | Programmable Ramp & Isothermal Hold |
| Vacuum Port | Yes |
| Cooling Interface | Water-Cooled Heat Exchanger & Optional Cryogenic/Gas Purge Connection |
| Origin | Hubei, China |
| Distributor Type | Authorized Domestic Distributor |
| Compliance | Designed for ISO 11359-2 and ASTM E228 Conformance Context |
| Brand | Aiyao Instruments |
|---|---|
| Model | TCT |
| Measurement Principle | 3ω Method |
| Sample Form | Micro/Nano Thin Films (Supported & Freestanding) |
| Temperature Range | Ambient to 400 °C (Optional Cryogenic Extension Available) |
| Thermal Conductivity Range | 0.1–1000 W/(m·K) |
| Resolution | <0.5% of Full Scale |
| Data Acquisition | High-Precision Digital Source Meter + Dual-Phase Lock-in Amplifier |
| Compliance | ASTM E1461, ISO 22007-2 (Adapted), GLP-Compatible Audit Trail Logging |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | Profilm 3D |
| Measurement Principle | Vertical Scanning Interferometry (VSI) & Phase-Shifting Interferometry (PSI) |
| Thickness Range (VSI) | 50 nm – 100 mm |
| Thickness Range (PSI) | 0 – 3 µm |
| Reflectance Range | 0.05% – 100% |
| Piezo Scan Range | 500 µm |
| XY Stage Options | 100 mm × 100 mm or 200 mm × 200 mm |
| Compliance | ISO 25178-604, ISO 9000, ASME B46.1 |
| Roughness Parameters | 47 standardized (ASME Y14.36M, ISO 4287, ISO 25178-2) |
| Software | ProfilmOnline cloud-based analysis platform |
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