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| Brand | AppNano |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | VertiSense |
| Instrument Type | Material Science AFM-Compatible SThM Module |
| Primary Function | Nanoscale Thermal Property Mapping (Topography + Thermal Conductivity + Temperature Distribution) |
| Brand | Accurion |
|---|---|
| Origin | Germany |
| Model | Nanofilm_EP4 |
| Spectral Range | 190–2750 nm |
| Spot Size | 1 µm |
| Angle of Incidence | 38°–90° |
| Sample Diameter | 2–12 inches |
| Spectral Resolution | 0.1 nm |
| Thickness Measurement Accuracy | 0.1 nm |
| Thickness Repeatability | 0.01 nm |
| Brand | Accurion |
|---|---|
| Origin | Germany |
| Model Series | Atlas (Heavy-Duty Modular), Reactio Plus (Desktop) |
| Load Capacity | Atlas Module: 300–1000 kg/unit |
| Reactio Plus | 120–150 kg |
| Vibration Isolation Range | ≥1 Hz |
| Isolation Performance | ≥12 dB at 1 Hz |
| Module Dimensions (Atlas) | 240 × 240 × 110 mm |
| Application Target | High-Precision Optical Benches, Moving XY Stages, Audio Equipment, Electron Microscopy, Interferometry |
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