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| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Detector Type | Scintillator-based Detector |
| Scan Mode | Translation-Rotation (TR) |
| Spatial Resolution | 0.5 µm |
| Minimum Voxel Size | 40 nm |
| Sample Dimensions (X/Y/Z) | 50 mm × 50 mm × 100 mm |
| Maximum Sample Weight | 25 kg |
| Dual Magnification Architecture | Optical + Geometric |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model Series | BOSELLO |
| Detector Type | High-Resolution CMOS Semiconductor Sensor |
| Scan Mode | Translation-Rotation (TR) |
| Accuracy | Nanometer-Level |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | METROTOM 1500 |
| Detector Type | Flat-Panel Detector |
| Scanning Mode | Translation-Rotation (TR) |
| Accuracy | Micron-Level |
| Maximum Penetration | Up to 50 mm Steel Equivalent |
| Spatial Resolution | 4 µm |
| Measurement Volume | Ø770 mm × H1350 mm |
| Dimensional Measurement Uncertainty | (4.5 + L/50) µm |
| Sample Weight Capacity | 50 kg |
| System Dimensions (W×L×H) | 1810 × 3700 × 2440 mm |
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