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| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus 400 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Maximum Sample Diameter | 400 mm |
| Maximum Sample Thickness | 50 mm |
| Maximum Sample Mass | 30 kg |
| Measurement Spot Size | 0.5–30 mm (5-step motorized selection) |
| Compliance | SEMI, CE |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZSX Primus IIInext |
| Instrument Type | Floor-standing |
| Instrument Kind | Scanning-type |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO CUBE |
| Instrument Type | Polarized ED-XRF |
| Elemental Range | Na to U |
| Detection Range | ppm to 100% |
| Energy Resolution | 130 eV |
| Detector | Silicon Drift Detector (SDD) |
| Form Factor | Benchtop/Floor-standing |
| Application Scope | General-purpose |
| Compliance Support | RoHS, ELV, ASTM D7464, ISO 8258, USP <232>/<233>, EPA Method 6200 |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be–U |
| Scan Speed | 2400°/min |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IV |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be to U |
| Scan Speed | 2400°/min |
| Detector Linear Range | SC 1800 kcps, FPC 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | WDA-3650 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Detector Configuration | High-sensitivity AD-Boron channel for boron analysis |
| Instrument Architecture | Hybrid scanning + fixed-channel (multi-channel) WD-XRF |
| Sample Compatibility | Up to 200 mm wafers and magnetic/optical disks |
| Automation | Fully automated daily calibration (AutoCal), C-to-C robotic handler compatible (optional), SECS/GEM interface support |
| Vacuum & Thermal Stability | Integrated vacuum stabilization and active cooling systems |
| Footprint | 1.12 m (W) × 1.45 m (H) × 0.89 m (D) |
| Mass | 600 kg |
| Power Supply | 3-phase 200 VAC 50/60 Hz, 30 A or single-phase 220–230 VAC 50/60 Hz, 40 A |
| Regulatory Compliance | Designed for GLP/GMP environments |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini 200 |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Oxygen (O, Z=8) to Uranium (U, Z=92) |
| Instrument Class | Scanning-type WDXRF |
| Compliance | CE certified |
| Cooling | Air-cooled tube |
| Gas Consumption | Low-flow P-10 gas (Ar/CH₄) |
| Sample Handling | 12-position automatic sampler |
| Operating Environment | Vacuum or He-purged |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 15 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Analytical Element Range | Be (4) to U (92) |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Detector Configuration | Simultaneous Multi-channel (Standard 30 channels, upgradable to 40) |
| Optional Features | XRD Channel, Curved Crystal Optics, Automatic Pressure Control (APC), Background Measurement (BG), Compton Scattering Ratio Calibration, Unattended Operation with 48-position ASC |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Type | Handheld/Portable |
| Model | xSORT |
| Element Range | Mg–U (47 elements) |
| Detection Limit | 7 ppm |
| Concentration Range | 7 ppm – 99.99% |
| Energy Resolution | 140 eV (at Mn Kα) |
| Repeatability | ≤ 0.1% RSD |
| Safety Compliance | EN 62471, IEC 61010-1, EU RoHS Directive |
| Weight | 1.64 kg (3.62 lb) |
| Dimensions (H×W×D) | 270 × 93 × 230 mm |
| Light Element Analysis | Mg, Al, Si, P in air |
| Analysis Time | 2–60 s |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IVi |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | MIDEX |
| Configuration | Benchtop / Floor-Standing |
| Excitation Source | Mo-target X-ray tube (max. 48 kV, 30 W) |
| Measurement Spot Size | 0.2–3.3 mm (optional collimator exchange) |
| Standard Spot | 0.7 mm (Midex SD) / 1.0 mm (Midex LD) |
| Detector | Peltier-cooled Si drift detector (SDD), 10 mm² (SD) / 30 mm² (LD) |
| Energy Resolution | FWHM < 160 eV at Mn Kα (10,000 cps) |
| Max. Count Rate | 250,000 cps |
| Sample Chamber Dimensions | 520 × 310 × 160 mm (L×W×H) |
| XYZ Motorized Stage | 240 × 178 × 160 mm travel, 3 kg max load |
| Operating Temp. | 5–30 °C |
| Relative Humidity | 10–80 % RH (non-condensing) |
| Power Supply | 95–240 V AC, 50/60 Hz, 200 W |
| Instrument Weight | 55–70 kg |
| Software | FP-based quantification (alloys, RoHS, halogen-free polymers), real-time spectral evaluation, spatial mapping, GLP-compliant reporting |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO XEPOS |
| Configuration | Benchtop/Floor-standing |
| Application Scope | Universal |
| Elemental Range | Na to U (11–92) |
| Quantification Range | 0.1 ppm – 100 wt% |
| Energy Resolution | <130 eV (Mn Kα) |
| Detector | High-resolution Peltier-cooled Silicon Drift Detector (SDD) |
| Maximum Count Rate | 1,000,000 cps |
| Coating Analysis | Up to 8 layers, down to 1 nm thickness, 55 elements supported |
| Software Platform | Windows-based SPECTRO XRF Suite with TURBOQUANT, FP, Compton Normalization, Lucas-Tooth, α-empirical, MAC, and Average Atomic Number correction models |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Application | Field-Portable ED-XRF Analysis |
| Element Range | Na (11) to U (92) |
| Detection Range | ppm to 100% |
| Energy Resolution | <140 eV |
| Detector | Silicon Drift Detector (SDD) |
| Weight | 12 kg |
| Dimensions | 270 × 306 × 306 mm |
| Integrated Touchscreen PC | Yes |
| Battery-Operated | Yes |
| Optional Integrated Imaging System | Yes |
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