Empowering Scientific Discovery

Shenzhen Huaputongyong Technology Co., Ltd.

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BrandSPECTRO
OriginGermany
ModelSPECTROLAB S
Instrument TypeFloor-Standing
Excitation MethodSpark
Detector TypeCMOS
Focal Length750 mm
Grating Groove Density3600 lines/mm
Wavelength Range120–800 nm
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BrandSPECTRO
OriginGermany
ModelTEST
Instrument TypePortable / Mobile
Excitation SourceSpark
DetectorCCD (Charge-Coupled Device)
Focal Length400 mm
Grating Groove Density3600 lines/mm
Wavelength Range185–520 nm
Spectral CoverageFull-Spectrum
ComplianceCE, RoHS, ISO/IEC 17025-compatible operation
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BrandSPECTRO
OriginGermany
ModelGENESIS
Instrument TypeFull-Spectrum Simultaneous ICP-OES
Detection Limitppb–ppm
Repeatability≤0.2%
Stability≤0.2%
Wavelength Range130–770 nm
Optical Resolution1 pm
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BrandSPECTRO
OriginGermany
ModelGREEN
Instrument TypeFull-Spectrum Direct-Reading ICP-OES
Detection Limitsub-ppb
Precision (RSD)<1.5%
Stability (RSD)<1.5%
Wavelength Range165–770 nm
Optical Resolution<0.008 nm across full spectrum
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BrandSPECTRO
OriginGermany
ModelARCOS
Instrument TypeFull-Spectrum Direct-Reading ICP-OES
Detection LimitSub-ppb to ppm
Precision (RSD)≤1%
Long-Term Stability (Drift)≤0.1%
Wavelength Range130–770 nm
Optical Resolution≤0.008 nm
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BrandSPECTRO
OriginGermany
ModelSPECTRO MAXx (LMX10)
Instrument TypeFloor-standing
Excitation MethodSpark
Detector TypeCMOS
Focal Length750 mm
Grating Groove Density3600 lines/mm
Wavelength Range120–670 nm
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BrandSPECTRO
OriginGermany
ModelPORT
Instrument TypePortable / Mobile
Excitation SourceSpark
Detector TypeDual Detector (PMT + CCD)
Focal Length400 mm
Grating Groove Density3600 lines/mm
Wavelength Range178–530 nm
Spectral CoverageFull-Spectrum Acquisition
ComplianceDesigned for ISO/IEC 17025-compliant metal analysis workflows, supports ASTM E415, E1086, and EN 10315 traceability requirements
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BrandSPECTRO
OriginGermany
ModelxSORT
TypeHandheld ED-XRF Spectrometer
Safety ComplianceCE, IEC 62471, EN 61000-6-3/6-4
Regulatory ConformanceRoHS/WEEE Compliant, ASTM E2857, ISO 21043, USP <232>/<233> for Elemental Impurities
Detection RangeMg (12) to U (92)
Light Element CapabilityMg, Al, Si, P analyzed in air
Typical Analysis Time2–60 s
Sample FormSolids, powders, soils, sludges, filters, thin films, alloys, ores
CalibrationBuilt-in ICAL self-calibration reference
Data StorageOnboard memory with timestamp, GPS coordinates, and CCD image capture
SoftwareSPECTRO XRF Analyzer Suite (supports GLP/GMP audit trails, 21 CFR Part 11 optional modules)
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BrandSPECTRO
OriginGermany
ModelSPECTRO CHECK
Instrument TypeBenchtop
Excitation SourceSpark
Detector ConfigurationDual Detector (PMT + CCD)
Focal Length1000 mm
Grating Groove Density3600 lines/mm
Wavelength Range120–589 nm
Spectral CoverageFull-Spectrum Acquisition
ComplianceDesigned and manufactured in Germany per ISO 9001-certified production processes
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BrandSPECTRO
OriginGermany
ModelSPECTRO MAXx Desktop
Excitation SourceSpark
Detector TypeCMOS
Focal Length500 mm
Grating Groove Density3600 lines/mm
Wavelength Range120–670 nm
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BrandSPECTRO
OriginGermany
ModelSPECTROMAXx
Instrument TypeFloor-standing
Excitation SourceSpark Discharge
DetectorCharge-Coupled Device (CCD)
Focal Length400 mm
Grating Groove Density3600 lines/mm
Wavelength RangeUser-configurable
Number of ChannelsUser-configurable
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OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported Instrument
ModelGDA 150 HR
Price RangeUSD 210,000 – 280,000
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OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported Instrument
ModelGDA 750 HR
Price RangeUSD 195,000 – 260,000
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BrandSPECTRO
OriginGermany
ModelMAXx
Instrument TypeFloor-standing
Excitation MethodSpark
Detector TypeCCD (Charge-Coupled Device)
Focal Length400 mm
Grating Line Density3600 lines/mm
Wavelength RangeCustomizable (140–670 nm)
Number of ChannelsUser-configurable
Optical ArchitectureOptimized Paschen-Runge Mount
Environmental ControlThermostatically Stabilized & Pressure-Compensated Enclosure
Argon ConsumptionReduced by up to 50% vs. conventional systems
Calibration ProtocolICAL Intelligent Calibration (single-standard, multi-matrix)
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