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| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROLAB S |
| Instrument Type | Floor-Standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–800 nm |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus 400 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Maximum Sample Diameter | 400 mm |
| Maximum Sample Thickness | 50 mm |
| Maximum Sample Mass | 30 kg |
| Measurement Spot Size | 0.5–30 mm (5-step motorized selection) |
| Compliance | SEMI, CE |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZSX Primus IIInext |
| Instrument Type | Floor-standing |
| Instrument Kind | Scanning-type |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO CUBE |
| Instrument Type | Polarized ED-XRF |
| Elemental Range | Na to U |
| Detection Range | ppm to 100% |
| Energy Resolution | 130 eV |
| Detector | Silicon Drift Detector (SDD) |
| Form Factor | Benchtop/Floor-standing |
| Application Scope | General-purpose |
| Compliance Support | RoHS, ELV, ASTM D7464, ISO 8258, USP <232>/<233>, EPA Method 6200 |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be–U |
| Scan Speed | 2400°/min |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IV |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be to U |
| Scan Speed | 2400°/min |
| Detector Linear Range | SC 1800 kcps, FPC 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | WDA-3650 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Detector Configuration | High-sensitivity AD-Boron channel for boron analysis |
| Instrument Architecture | Hybrid scanning + fixed-channel (multi-channel) WD-XRF |
| Sample Compatibility | Up to 200 mm wafers and magnetic/optical disks |
| Automation | Fully automated daily calibration (AutoCal), C-to-C robotic handler compatible (optional), SECS/GEM interface support |
| Vacuum & Thermal Stability | Integrated vacuum stabilization and active cooling systems |
| Footprint | 1.12 m (W) × 1.45 m (H) × 0.89 m (D) |
| Mass | 600 kg |
| Power Supply | 3-phase 200 VAC 50/60 Hz, 30 A or single-phase 220–230 VAC 50/60 Hz, 40 A |
| Regulatory Compliance | Designed for GLP/GMP environments |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | TEST |
| Instrument Type | Portable / Mobile |
| Excitation Source | Spark |
| Detector | CCD (Charge-Coupled Device) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 185–520 nm |
| Spectral Coverage | Full-Spectrum |
| Compliance | CE, RoHS, ISO/IEC 17025-compatible operation |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | GENESIS |
| Instrument Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit | ppb–ppm |
| Repeatability | ≤0.2% |
| Stability | ≤0.2% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | 1 pm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | GREEN |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | sub-ppb |
| Precision (RSD) | <1.5% |
| Stability (RSD) | <1.5% |
| Wavelength Range | 165–770 nm |
| Optical Resolution | <0.008 nm across full spectrum |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini 200 |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Oxygen (O, Z=8) to Uranium (U, Z=92) |
| Instrument Class | Scanning-type WDXRF |
| Compliance | CE certified |
| Cooling | Air-cooled tube |
| Gas Consumption | Low-flow P-10 gas (Ar/CH₄) |
| Sample Handling | 12-position automatic sampler |
| Operating Environment | Vacuum or He-purged |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | ARCOS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | Sub-ppb to ppm |
| Precision (RSD) | ≤1% |
| Long-Term Stability (Drift) | ≤0.1% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | ≤0.008 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO MAXx (LMX10) |
| Instrument Type | Floor-standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–670 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | PORT |
| Instrument Type | Portable / Mobile |
| Excitation Source | Spark |
| Detector Type | Dual Detector (PMT + CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 178–530 nm |
| Spectral Coverage | Full-Spectrum Acquisition |
| Compliance | Designed for ISO/IEC 17025-compliant metal analysis workflows, supports ASTM E415, E1086, and EN 10315 traceability requirements |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 15 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Analytical Element Range | Be (4) to U (92) |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Detector Configuration | Simultaneous Multi-channel (Standard 30 channels, upgradable to 40) |
| Optional Features | XRD Channel, Curved Crystal Optics, Automatic Pressure Control (APC), Background Measurement (BG), Compton Scattering Ratio Calibration, Unattended Operation with 48-position ASC |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Type | Handheld/Portable |
| Model | xSORT |
| Element Range | Mg–U (47 elements) |
| Detection Limit | 7 ppm |
| Concentration Range | 7 ppm – 99.99% |
| Energy Resolution | 140 eV (at Mn Kα) |
| Repeatability | ≤ 0.1% RSD |
| Safety Compliance | EN 62471, IEC 61010-1, EU RoHS Directive |
| Weight | 1.64 kg (3.62 lb) |
| Dimensions (H×W×D) | 270 × 93 × 230 mm |
| Light Element Analysis | Mg, Al, Si, P in air |
| Analysis Time | 2–60 s |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | xSORT |
| Type | Handheld ED-XRF Spectrometer |
| Safety Compliance | CE, IEC 62471, EN 61000-6-3/6-4 |
| Regulatory Conformance | RoHS/WEEE Compliant, ASTM E2857, ISO 21043, USP <232>/<233> for Elemental Impurities |
| Detection Range | Mg (12) to U (92) |
| Light Element Capability | Mg, Al, Si, P analyzed in air |
| Typical Analysis Time | 2–60 s |
| Sample Form | Solids, powders, soils, sludges, filters, thin films, alloys, ores |
| Calibration | Built-in ICAL self-calibration reference |
| Data Storage | Onboard memory with timestamp, GPS coordinates, and CCD image capture |
| Software | SPECTRO XRF Analyzer Suite (supports GLP/GMP audit trails, 21 CFR Part 11 optional modules) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO CHECK |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Configuration | Dual Detector (PMT + CCD) |
| Focal Length | 1000 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–589 nm |
| Spectral Coverage | Full-Spectrum Acquisition |
| Compliance | Designed and manufactured in Germany per ISO 9001-certified production processes |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO MAXx Desktop |
| Excitation Source | Spark |
| Detector Type | CMOS |
| Focal Length | 500 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–670 nm |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IVi |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMAXx |
| Instrument Type | Floor-standing |
| Excitation Source | Spark Discharge |
| Detector | Charge-Coupled Device (CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | User-configurable |
| Number of Channels | User-configurable |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | GDA 150 HR |
| Price Range | USD 210,000 – 280,000 |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | MIDEX |
| Configuration | Benchtop / Floor-Standing |
| Excitation Source | Mo-target X-ray tube (max. 48 kV, 30 W) |
| Measurement Spot Size | 0.2–3.3 mm (optional collimator exchange) |
| Standard Spot | 0.7 mm (Midex SD) / 1.0 mm (Midex LD) |
| Detector | Peltier-cooled Si drift detector (SDD), 10 mm² (SD) / 30 mm² (LD) |
| Energy Resolution | FWHM < 160 eV at Mn Kα (10,000 cps) |
| Max. Count Rate | 250,000 cps |
| Sample Chamber Dimensions | 520 × 310 × 160 mm (L×W×H) |
| XYZ Motorized Stage | 240 × 178 × 160 mm travel, 3 kg max load |
| Operating Temp. | 5–30 °C |
| Relative Humidity | 10–80 % RH (non-condensing) |
| Power Supply | 95–240 V AC, 50/60 Hz, 200 W |
| Instrument Weight | 55–70 kg |
| Software | FP-based quantification (alloys, RoHS, halogen-free polymers), real-time spectral evaluation, spatial mapping, GLP-compliant reporting |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | GDA 750 HR |
| Price Range | USD 195,000 – 260,000 |
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