Thickness Gauge
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| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | XDV-SDD |
| Price Range | USD 27,000 – 68,000 |
| Origin | Shanghai, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | GW |
| Pricing | Available Upon Request |
| Measurement Principle | Ultrasonic Pulse-Echo |
| Standards Compliance | ASTM D6132, ISO 2808 |
| Measurement Range | 13–1000 µm |
| Accuracy | ±(2 µm + 3% of reading) |
| Measurement Speed | Up to 45 readings/minute |
| Data Storage | 10,000 readings (up to 1,000 batches) |
| Display | Backlit LCD with dual-color status LED |
| Environmental Rating | IP5X (dust-protected, water-splashing resistant) |
| Interface | USB, RS-232, and infrared |
| Power | Two AA batteries (typical life: 100+ hours) |
| Dimensions & Weight | 146 × 64 × 31 mm / 105 g |
| Units | Metric (µm) and Imperial (mils), switchable |
| Language Support | English, Spanish, French, German, Chinese, Japanese |
| Calibration | NIST-traceable certificate included |
| Warranty | 2 years (instrument and probe) |
| Brand | QiaoBang Instrument |
|---|---|
| Origin | Jiangsu, China |
| Model | XAD |
| Price Range | USD 125,000 – 210,000 |
| Measurement Principle | Total External Reflection X-Ray Fluorescence (TXRF) with Multi-Channel Capillary Optics |
| Minimum Spot Size | 10 µm |
| Excitation Intensity Gain | 10²–10³× vs. conventional collimators |
| Compliance | ASTM F1689, ISO 3497, IPC-4552A, USP <232>/<233>, GLP/GMP-ready data audit trail |
| Brand | QiaoBang Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | XD1000 |
| Price Range | USD 16,500 – 27,500 |
| Brand | QINGTAO |
|---|---|
| Model | QT-N1 |
| Measurement Principle | Dual-mode (Eddy Current for Non-Magnetic Substrates, Magnetic Induction for Ferrous Substrates) |
| Measurement Range | 0–1250 µm |
| Resolution | 0.1 µm |
| Accuracy | ±(3% H + 1.5 µm) with Single-Point Calibration |
| Substrate Compatibility | Ferrous metals (Fe, steel) and non-ferrous non-magnetic metals (Al, Cu, Zn, Sn) |
| Coating Types | Non-conductive (paint, enamel, plastic, rubber) and non-magnetic metallic (e.g., Cr, Zn on steel) |
| Probe Options | F1, F1/90°, F10, N1, N1/90°, N10 |
| Data Storage | 500 readings |
| Statistical Functions | MEAN, MAX, MIN, NO, S.DEV |
| Calibration Modes | Single-point & two-point |
| Operating Temperature | −10 °C to 50 °C |
| Power | 2 × AA (1.5 V) |
| Dimensions | 125 × 67 × 31 mm |
| Weight | ~340 g |
| Compliance | GB/T 4956–1985, GB/T 4957–1985 & –2003, JB/T 8393–1996, JJG 889–1995, JJG 818–1993 |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QuaNix 4500 |
| Pricing | Upon Request |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | 8500 Basic |
| Pricing | Available Upon Request |
| Measurement Range | 0–2000 µm (standard), 0–5000 µm (optional) |
| Resolution | 0.1 µm / 1 µm / 0.01 mm |
| Substrate Compatibility | Ferrous (Fe): steel, iron (min. thickness 0.2 mm) |
| Non-ferrous (NFe) | aluminum, zinc, copper, brass (min. thickness 0.05 mm) |
| Measurement Area | 20 × 20 mm² |
| Probe Types | 5 modular interchangeable probes (magnetic induction, eddy current, or dual-mode) |
| Memory Capacity | 100 readings |
| Calibration | Single- or dual-point user-defined curve |
| Display | High-resolution backlit LCD with 180° flip orientation |
| Indicators | Dual-color (red/green) LED status feedback |
| Keypad | Illuminated 4-directional navigation keys |
| Compliance | ISO 2178, ISO 2360, DIN 50981, BS 3900-E7, ASTM B499, ASTM D7091 |
| Certification | Traceable calibration certificate issued by PTB (Physikalisch-Technische Bundesanstalt, Germany) |
| Optional Accessories | QuaNix PC software, USB interface cable |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | FT-100 |
| Thickness Range | 1 nm – 1.8 mm |
| Wavelength Range | 200 nm – 1700 nm |
| Precision | <0.01 nm or 0.01% |
| Stability | <0.02 nm or 0.03% |
| Spot Size | 4 µm – 200 µm (optional 2 mm field) |
| Measurement Capabilities | Single/multilayer thickness, refractive index (n), extinction coefficient (k), reflectance, transmittance |
| Sample Compatibility | Transparent, semi-transparent, low-absorption films—including liquid films and air-gap layers |
| Platform Integration | Compatible with XY motorized stages for full-sample thickness mapping |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP-WLI |
| Imaging Modes | White Light Interferometry (WLI), Confocal Microscopy, Dark-Field Microscopy, Bright-Field Microscopy |
| Vertical Measurement Range | up to 100 mm |
| XY Stage Resolution | 0.1 µm |
| Standard Motorized Stage | 150 × 150 mm (optional 210 × 310 mm) |
| Tilt Stage | ±6° |
| Automated Stitching Capability | Yes |
| Head Options | Sigma Head (WLI-only) / Lambda Head (WLI + Confocal + Dark-Field + Bright-Field) |
| Compliance | ASTM E2923, ISO 25178-2, ISO 4287, USP <1059>, FDA 21 CFR Part 11 (software audit trail enabled) |
| Brand | Saicheng |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | CHY-CA |
| Measuring Foot Diameter | 0–4 mm (selectable) |
| Brand | LANScientific |
|---|---|
| Model | ScopeX PC7 |
| Origin | Jiangsu, China |
| Manufacturer | LANScientific |
| Type | Benchtop ED-XRF Coating Thickness Analyzer |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Geometry | Bottom-illumination (upward irradiation) |
| Sample Handling | Manual X-Y stage with 25 µm resolution |
| Detection Depth Range | Up to 30 mm in recessed features |
| Optional Configurations | Micro-focus X-ray source, interchangeable collimators (φ0.1 mm to φ2.0 mm), automatic filter wheel (Al, Cu, Ti, Ni, Mo, Sn, Pb) |
| Compliance | Designed for ISO 3497, ASTM B568, ASTM F136, EN 14571, and GB/T 1764–2022 conformance |
| Software | Multi-FP fundamental parameters quantification engine with matrix correction, spectral deconvolution, and GLP-compliant audit trail |
| Brand | SEARCHING |
|---|---|
| Origin | Shandong, China |
| Model | CHY-G |
| Measurement Range | 0–12.7 mm |
| Resolution | 0.001 mm |
| Sample Diameter | 5–300 mm (customizable) |
| Sample Height | 5–330 mm (customizable) |
| Power Supply | AC 220 V, 50 Hz |
| Dimensions | 400 × 360 × 700 mm (L×W×H) |
| Display | 7-inch color touchscreen LCD |
| Data Output | Built-in thermal printer, USB interface, PC software support (Excel export, curve plotting, audit-trail-capable user permission management) |
| Brand | Senbe |
|---|---|
| Model | T300S |
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Detector | Si-Pin Semiconductor |
| Measurable Elements | S (16) to U (92) |
| X-ray Tube Voltage | 0–50 kV (intelligent programmable HV system) |
| Collimator | Standard Φ0.5 mm |
| Optical Magnification | 30× (industrial CCD camera) |
| Energy Resolution | ≤129 eV ±5 eV |
| Analysis Layers | Up to 5 simultaneous layers |
| Analyzable Elements per Measurement | Up to 24 |
| Algorithm | Fundamental Parameters (FP) method |
| Signal Processing | Digital Multi-Channel Analyzer (MCA) technology |
| Chamber Dimensions | 268 × 307 × 97 mm |
| Overall Dimensions | 414 × 416 × 362 mm |
| Safety Systems | Multi-dimensional thermal dissipation + dual interlock radiation shielding + real-time hardware status monitoring |
| Brand | SHANG ZHUN |
|---|---|
| Origin | Guangdong, China |
| Model | DM49-60 |
| Measurement Range | 0–2.5 mm / 0–6 mm / 0–12 mm (selectable single range per unit) |
| Resolution | 0.1 µm |
| Accuracy | ±1 µm or ±0.1% of reading (whichever is greater) |
| Parallelism Between Measuring Surfaces | ±0.1 µm |
| Test Speed | 10 tests/min (adjustable) |
| Contact Pressure | 17.5 ± 1 kPa (for films, 0.875 N force) or 100 ± 5 kPa (for paper) |
| Contact Area | 50 mm² (Φ8 mm for films) or 200 mm² (for paper) |
| Power Supply | AC 220 V, 50 Hz, 80 W |
| Dimensions | 461 × 334 × 357 mm (L×W×H) |
| Net Weight | ~32 kg |
| Interface | Color touchscreen, bilingual (Chinese/English), unit switching (mm/mil/µm/inch) |
| Data Output | USB/RS232, PC connectivity, remote control, real-time data transfer |
| Software | Optional SHANG ZHUN Thickness Analysis Suite v49-60-1 |
| Brand | Shashin Kagaku |
|---|---|
| Origin | Japan |
| Model Type | Reflective or Transmissive Configuration |
| Application Scope | Photoresist, ITO, porous membranes, polycrystalline silicon, battery electrodes, glass substrates, bonded wafers, patterned wafers, adhesive layers |
| Compliance | Designed for semiconductor process monitoring and R&D environments |
| Software Features | Real-time endpoint detection, histogram-based statistical analysis, contour & 3D thickness mapping, region-of-interest (ROI) thickness calculation, optional auto-calibration module |
| Mechanical Compatibility | Standard wafer handling for φ100–300 mm circular substrates |
| Optical Architecture | Non-contact, optical interference-based measurement (white-light reflectometry for reflective mode |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | EDX 2000A |
| Pricing | Upon Request |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | Thick 800A |
| Pricing | Available Upon Request |
| Brand | Starwood |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | PG70ABDL |
| Pricing | Upon Request |
| Brand | SYCS |
|---|---|
| Model | DC-1000B |
| Measurement Range | 0.8–200 mm |
| Display Resolution | 0.1 mm |
| Sound Velocity Range | 1000–9999 m/s |
| Dimensions | 108 × 61 × 25 mm |
| Power Supply | 220 V, 50 Hz |
| Display | Backlit LCD with Chinese menu |
| Auto Power-Off | Yes |
| Brand | Thermo Fisher |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | 21Plus-C Online X-ray Thickness Gauge |
| Pricing | Available Upon Request |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Thermo Scientific Process Thickness Gauge |
| Price Range | USD 70,000 – 140,000 |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Progage |
| Pricing | Upon Request |
| Brand | Thwing-Albert |
|---|---|
| Origin | USA |
| Model | ProGage Touch Thickness Tester |
| Measuring Range | 40–500 mil (1–12.7 mm) |
| Accuracy | ±0.00004–±0.0005 in (±0.001–±0.013 mm) |
| Display Resolution | 0.00001–0.0001 in (0.01–0.1 µm) |
| Parallelism | ±0.00004–±0.0005 in (±0.001–±0.013 mm) |
| Pressure Foot Diameter | 0.19–2.221 in (4.83–56.41 mm) |
| Anvil Diameter | 2.5 in (63.5 mm) standard, 4.25 in (107.9 mm) optional |
| Dwell Time | 0–20 s adjustable |
| Measurement Speed | 0.013–12.7 mm/sec |
| Sampling Rate | 128 Hz |
| Power | 120–230 VAC, 50–60 Hz, 36 VA |
| Dimensions | 255 × 318.5 × 403.9 mm |
| Net Weight | 24.7 kg |
| Origin | Netherlands |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LD6057 / LD6058 |
| Pricing | Upon Request |
| Measurement Principles | Magnetic Induction (for ferrous substrates) & Eddy Current (for non-ferrous substrates) |
| Display | Monochrome High-Contrast LCD (LD6057) / Reversible Color LCD (LD6058) |
| Data Storage Capacity | 250 readings (LD6057) / 100,000 readings (LD6058) |
| Data Transfer Interfaces | USB (standard), Wi-Fi & Bluetooth (LD6058 only) |
| Compliance Standards | ISO 2808, GOST R 51694 |
| Alarm Function | Audible and visual Hi/Lo limit alert |
| Calibration | Sensor-integrated, auto-recalled per probe |
| Probe Compatibility | Interchangeable modular probes (sold separately) |
| Brand | TQC Sheen |
|---|---|
| Origin | Netherlands |
| Model | CoatmasterFlex |
| Measurement Principle | Active Thermographic Optical (ATO) |
| Measurable Substrates | Metal, Rubber, Ceramic, Glass, Plastic, Wood |
| Wet Film Range | 1–400 µm |
| Dry/Powder Film Range | 1–1000 µm |
| Measurement Speed | ≥20 ms per reading |
| Standoff Distance Tolerance | 2–15 cm |
| Angular Tolerance | ±70° |
| Relative Standard Deviation (RSD) | <1% |
| Color Independence | Valid for all colors including white |
| Data Access | Real-time via ERP integration and web browser |
| Weight (without battery) | 1.3 kg |
| Dimensions | 374 × 91 × 203 mm |
| Compliance | DIN EN 15042-2 |
| Brand | TQC Sheen |
|---|---|
| Origin | Netherlands |
| Model | Powder Coating Thickness Gauge |
| Measurement Range | 0–300 µm |
| Accuracy | ±3% of reading |
| Resolution | ±1% of reading |
| Standoff Distance | ~35 mm |
| Spot Size | 2 × 2 mm |
| Measurement Speed | 1024–2048 measurements/sec |
| Dimensions | 80 × 180 × 43 mm |
| Weight | 700 g |
| Interface | USB |
| Power Supply | 4 × AA Li-ion batteries (3.7 V each), up to 10 hours continuous operation |
| Substrate Compatibility | Ferrous & non-ferrous metals (e.g., steel, aluminum), MDF |
| Operating Humidity | ≤80% RH at 32°C |
| Storage Temperature | 0–55°C |
| Brand | TQC Sheen |
|---|---|
| Origin | Netherlands |
| Model | PowderTAG |
| Measurement Range | 0–300 µm |
| Accuracy | ±3% of reading |
| Resolution | ±1% of reading |
| Standoff Distance | ~35 mm |
| Spot Size | 2 × 2 mm |
| Measurement Speed | 1024–2048 measurements/s |
| Dimensions | 80 × 180 × 43 mm |
| Weight | 700 g |
| Interface | USB |
| Power Supply | 4 × AA Li-ion batteries (3.7 V each), 10 h continuous operation |
| Substrate Compatibility | Ferrous & non-ferrous metals (e.g., steel, aluminum), MDF |
| Relative Humidity Limit | ≤80% at 32°C |
| Storage Temperature | 0–55°C |
| Measurement Principle | Eddy current + capacitance dual-sensor non-contact technology |
| Brand | TQC Sheen |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SuperPIG III |
| Pricing | Available Upon Request |
| Measurement Range | 2–1800 µm / 0.1–70 mils |
| Microscope Magnification | 50× (calibrated reticle) |
| Scale Range | 0.00–1.80 mm / 0.00–0.07 in |
| Scale Graduation | 0.02 mm / 0.001 in |
| Accuracy | Dependent on blade geometry and operator reading proficiency |
| Power Supply | 4 × AG13/LR44 batteries |
| Housing Material | Titanium-anodized aluminum |
| Dimensions (W × D × L) | 25 × 110 × 65 mm |
| Brand | FRT |
|---|---|
| Origin | Germany |
| Model | MicroProf MHU |
| Wafer Handling | Semi-Automatic with Material Handling Unit (MHU) |
| Throughput | Up to 220 wafers/hour |
| Wafer Diameter Support | 2″ to 8″ |
| Cassette Capacity | Up to 4 open FOUPs/SMIF pods |
| Integrated Options | Pre-aligner, OCR reader |
| Application Focus | Semiconductor, MEMS, Sapphire, LED wafer manufacturing |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | XDLM-PCB 200 / 210 / 220 |
| Price Range | USD 70,000 – 140,000 |
| Standards Compliance | DIN ISO 3497, ASTM B568 |
| Sample Positioning | Motorized XY Stage (210/220), Manual Drawer-Type Stage (200) |
| Imaging System | High-Resolution Color Camera with Real-Time Overlay |
| Software Platform | WINFTM® v5.2 (Windows-based, CFR Part 11 Ready) |