Ultraviolet Visible Spectrophotometer
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Showing 511–535 of 535 results
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | OEM Manufacturer |
| Model | U9 |
| Instrument Architecture | Dual-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ≤ ±0.3 nm |
| Stray Light | ≤ 0.03% T at 220 nm and 360 nm |
| Wavelength Repeatability | ≤ ±0.1 nm |
| Wavelength Data Resolution | 0.1/0.2/0.5/1/2/5 nm |
| Scan Speed | 2–1600 nm/min |
| Absorbance Range | –3 to +5 A |
| Noise | ≤ 0.0002 A |
| Baseline Stability | ≤ 0.0003 A/hr (at 700 nm) |
| Photometric Modes | Transmittance (%T), Absorbance (A), Concentration, Energy |
| Sample Compartment | Motorized 8-Cell Auto-Changer |
| Display | 10.1″ Capacitive Touchscreen (1280 × 800 px) |
| Operating Environment | 15–30 °C, ≤70% RH |
| Power Supply | 100–240 VAC, 50–60 Hz |
| Net Weight | 10 kg |
| Warranty | 3 Years |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector | Photodiode Array |
| Wavelength Range | 320–1020 nm |
| Wavelength Selection | Manual |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤1 nm |
| Photometric Accuracy (Transmittance) | ±0.5% T |
| Photometric Linearity | 0–200% T, –0.3 to 3 A, 0–9999 C |
| Stray Light | ≤0.3% T @ 360 nm |
| Baseline Stability | ±0.004 A/h @ 500 nm |
| Noise Level | ≤0.2% T |
| Light Source | Imported Tungsten Halogen Lamp |
| Sample Compartment | Accommodates up to 10 cm pathlength cuvettes |
| Interface Options | RS232 (optional) |
| Dimensions & Weight | Approx. 8 kg |
| Compliance | Designed for routine laboratory compliance with ISO/IEC 17025 supporting practices and GLP documentation workflows |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | UV1810 |
| Instrument Architecture | Pseudo-Double-Beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Stray Light | ≤0.03% T |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Architecture | Pseudo-double-beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm (at D₂ line, 656.1 nm) |
| Spectral Bandwidth | Adjustable at 0.5 / 1.0 / 2.0 / 4.0 / 5.0 / 6.0 nm |
| Stray Light | ≤0.03% T |
| Photometric Accuracy | ±0.002 A (0–0.5 A), ±0.004 A (0.5–1.0 A), ±0.2% T (0–100% T) |
| Photometric Repeatability | ±0.001 A (0–0.5 A), ±0.002 A (0.5–1.0 A), ±0.15% T (0–100% T) |
| Baseline Flatness | ±0.0015 A |
| Drift | ±0.0005 A/h (at 500 nm) |
| Sample Compartment | Accommodates cuvettes from 5 mm to 100 mm pathlength |
| Data Interface | USB 2.0 |
| Display | 6-inch high-brightness LCD, 320 × 240 pixels |
| Light Sources | Imported long-life tungsten halogen lamp and deuterium lamp |
| Weight | 18 kg |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Manufacturer |
| Model | UV1900 |
| Optical System | Dual-beam |
| Detector | Photodiode Array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm (at D₂ 656.1 nm), ±0.3 nm (full range) |
| Spectral Bandwidth | 2 nm |
| Stray Light | ≤0.02 %T |
| Photometric Accuracy | ±0.002 A (0–0.5 A), ±0.004 A (0.5–1 A), ±0.2 %T (0–100 %T) |
| Photometric Repeatability | ±0.001 A (0–0.5 A), ±0.002 A (0.5–1 A), ±0.1 %T (0–100 %T) |
| Baseline Flatness | ≤±0.0005 A |
| Drift | ≤±0.0004 A/h |
| Noise | ≤0.0004 A/h |
| Wavelength Repeatability | ≤0.1 nm |
| Photometric Range | 0–200 %T, –4 to +4 A |
| Operating Modes | Transmittance (T), Absorbance (A), Concentration (C), Energy (E) |
| Display | 320 × 240 pixel, 6-inch high-brightness LCD |
| Data Interface | USB and parallel port |
| Power Supply | AC 220 V/50 Hz or AC 110 V/60 Hz |
| Net Weight | 25 kg |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Manufacturer |
| Model | UV1900PC |
| Optical System | Dual-beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ≤ ±0.1 nm (at D₂ line, 656.1 nm) |
| Spectral Bandwidth | 1 nm |
| Stray Light | ≤ 0.03 %T |
| Auto-wavelength Scanning | Yes |
| Photometric Range | –3 to +3 A |
| Baseline Flatness | ≤ ±0.001 A |
| Photometric Accuracy | ±0.3 %T (0–100 %T) |
| Photometric Repeatability | 0.001 Abs (0–0.5 Abs) |
| Drift | ≤ ±0.0004 Abs/h |
| Noise | ≤ 0.0004 Abs/h |
| Wavelength Repeatability | ≤ 0.2 nm |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Model | UV752 |
| Optical System | Single-beam |
| Detector | Photodiode Array |
| Wavelength Range | 200–1000 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤1 nm |
| Spectral Bandwidth | 2 nm |
| Stray Light | ≤0.5% (at 220 nm, using NaI solution) |
| Display | Digital LED/LCD readout |
| Sample Compartment | Accommodates cuvettes from 5 mm to 100 mm pathlength |
| Automation Level | Manual wavelength selection |
| Key Components | Imported optical and electronic components |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 195–1020 nm |
| Wavelength Selection | Manual (Mechanical Knob) |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±2 nm |
| Stray Light | ≤0.2% T |
| Wavelength Repeatability | 1 nm |
| Photometric Accuracy | ±0.5% T |
| Photometric Repeatability | ±0.2% T |
| Photometric Range | 0–200% Transmittance, –0.301 to 2.000 Absorbance |
| Baseline Drift | ≤0.1% T/h |
| Baseline Linearity | ±0.002 A/h @ 500 nm |
| Noise (100% T) | ≤0.2% T |
| Stability | ±0.002 A/h @ 500 nm |
| Light Sources | Imported Tungsten Lamp & Deuterium Lamp |
| Lamp Switching | Manual |
| Sample Compartment Dimensions | Accommodates Cuvettes from 5 mm to 100 mm Pathlength |
| Display | 4-Digit LED LCD |
| Interface | Parallel Port for Thermal Printer (Optional) |
| Net Weight | 12 kg |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Domestic |
| Model | UV752 |
| Price Range | USD 700–1,400 (FOB) |
| Optical Design | Single-Beam |
| Detector | Photodiode Array |
| Wavelength Range | 195–1020 nm |
| Wavelength Selection | Manual |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ±2 nm |
| Stray Light | ≤0.3% T |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Model | UV752N |
| Optical System | Czerny-Turner monochromator with 1200 lines/mm grating |
| Beam Type | Single-beam |
| Detector | Photodiode array |
| Wavelength Range | 195–1020 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤1 nm |
| Spectral Bandwidth | 2 nm (stated in specs) / 5 nm (in parameter list — reconciled as 2 nm per primary spec sheet |
| Stray Light | ≤0.3%T at 220 nm (NaI) |
| Photometric Accuracy | ±0.5%T |
| Photometric Repeatability | ±0.2%T |
| Photometric Range | 0–200%T, –3 to +3 A |
| Baseline Drift | ±0.004 A/h at 500 nm |
| Noise | ≤0.3%T (RMS) |
| Wavelength Drive | Manual |
| Display | 4-digit LED |
| Lamp Source | Imported deuterium lamp (UV) and tungsten-halogen lamp (VIS-NIR) |
| Lamp Switching | Automatic |
| Sample Compartment | Accommodates 5–100 mm pathlength cuvettes |
| Interface | Parallel port for optional thermal printer |
| Net Weight | 12 kg |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Domestic |
| Model | UV752N |
| Price Range | USD 700–1,400 (FOB) |
| Optical Design | Single-beam |
| Detector | Photodiode Array |
| Wavelength Range | 195–1020 nm |
| Wavelength Selection | Manual via precision wavelength dial |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±2 nm |
| Stray Light | ≤0.2% T |
| Wavelength Repeatability | 1 nm |
| Photometric Accuracy | ±0.5% T |
| Photometric Repeatability | ±0.2% T |
| Photometric Range | 0–200% Transmittance, –0.301 to 2.000 Absorbance |
| Baseline Linearity | ±0.002 A/h @ 500 nm |
| Noise Level | ≤0.2% T |
| Stability | ±0.002 A/h @ 500 nm |
| Display | 4-digit LED |
| Light Sources | Imported tungsten lamp and deuterium lamp |
| Lamp Switching | Automatic |
| Interface | Parallel port for thermal printer (optional) |
| Net Weight | 12 kg |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | UV754N |
| Optical System | Single-Beam |
| Detector | Photodiode Array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | 0.5 nm |
| Spectral Bandwidth | 4 nm |
| Photometric Accuracy | ±0.5% T |
| Photometric Repeatability | 0.2% T |
| Absorbance Range | –0.030 to 3.0 A |
| Transmittance Range | 0.0–200% T |
| Stray Light | ≤0.3% T at 220 nm and 360 nm |
| Baseline Stability | ±0.002 A/h |
| Display | 128 × 64 Dot-Matrix LCD |
| Interface | RS-232 Serial Port |
| Optional Peripheral | Thermal Printer Support |
| Data Storage | Onboard Microcontroller (51-series) with Standard Curve & Measurement Data Retention |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Model | UV754N |
| Optical System | Single-beam |
| Detector Type | Photodiode Array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | 0.5 nm |
| Spectral Bandwidth | 4 nm |
| Stray Light | ≤0.3% T at 220 nm and 360 nm |
| Automation Level | Automatic Wavelength Scanning |
| Data Storage | Onboard Microcontroller (51-series) with Curve & Measurement Memory |
| Compliance | Designed for GLP-supporting labs |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Drive | Automatic |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | 0.5 nm |
| Photometric Accuracy (Transmittance) | ±0.5% T |
| Photometric Repeatability (Transmittance) | 0.2% T |
| Transmittance Range | 0.0–200% T |
| Absorbance Range | −0.030 to 3.0 A |
| Stray Light | ≤0.3% T at 220 nm and 360 nm |
| Baseline Stability | ±0.002 A/h |
| Display | 128 × 64 dot-matrix LCD |
| Interface | RS-232 serial port |
| Printer Support | Standard parallel printer interface |
| Data Storage | Onboard microcontroller with curve & measurement data retention |
| Self-Diagnostic Function | Yes |
| Power Failure Protection | Yes |
| Built-in Quantitative Analysis Software | Yes |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Model | UV754PC |
| Optical System | Czerny-Turner monochromator with 1200 lines/mm grating |
| Beam Type | Single-beam |
| Detector | Photodiode array |
| Wavelength Range | 190–1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤1 nm |
| Stray Light | ≤0.5% T (at 220 nm, using NaI) |
| Photometric Accuracy | ±0.3% T |
| Photometric Repeatability | 0.3% T |
| Baseline Stability | ±0.004 A/h (at 500 nm, after 1 h warm-up) |
| Absorbance Range | 0–1.999 A |
| Transmittance Range | 0–199.0% T |
| Concentration Range | 0–1999 C |
| Display | 4-digit LCD |
| Interface | RS-232C serial port |
| Light Sources | 6 V/10 W halogen lamp (Philips) and long-life deuterium lamp |
| Power Supply | 220/110 V AC, 50–60 Hz |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Drive | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±1 nm |
| Wavelength Repeatability | ±0.2 nm |
| Photometric Accuracy (Transmittance) | ±0.5% T |
| Photometric Repeatability (Transmittance) | ±0.2% T |
| Transmittance Range | 0.0–200.0% T |
| Absorbance Range | –0.30 to 3.00 A |
| Concentration Display Range | 0–1999 units |
| Stray Light | ≤0.2% T at 220 nm and 360 nm |
| Baseline Stability | ±0.002 A/h at 500 nm |
| RS232 Interface | Standard |
| Software Support | Built-in Quantitative Analysis Module |
| Data Storage | Onboard Microcontroller (51-series) with Curve & Measurement Memory |
| Power Failure Protection | Enabled |
| Self-Diagnostic Functionality | Integrated |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.5 nm |
| Spectral Bandwidth | 2 nm |
| Stray Light | ≤0.3% T at 220 nm and 360 nm |
| Wavelength Repeatability | ±0.2 nm |
| Photometric Accuracy | ±0.5% T |
| Photometric Repeatability | ±0.2% T |
| Absorbance Range | –0.031 to 2.5 A |
| Transmittance Range | 0.0–125% T |
| Baseline Stability | ±0.002 A/h |
| Data Storage | 50 measurement sets + 10 calibration curves |
| Interface | RS-232 serial port |
| Display | 128 × 64 dot-matrix LCD |
| Software Support | Optional PC-based analysis suite with quantitative module and curve fitting |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | UV756 |
| Instrument Architecture | Pseudo-Double-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Stray Light | 0.05%T at 220 nm and 360 nm |
| Wavelength Repeatability | ±0.2 nm |
| Photometric Accuracy | ±0.5%T |
| Photometric Repeatability | ±0.2%T |
| Transmittance Range | 0.0–200%T |
| Absorbance Range | −0.30 to 3.0 A |
| Concentration Range | 0–1999 units |
| Baseline Stability | ±0.001 A/h at 500 nm |
| Interface | USB |
| Software Compatibility | Yoke UV Analysis Suite |
| Optional Accessories | Thermal Printer Module |
| Warranty | 12 months standard, lifetime technical support and calibration guidance |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic (China-made) |
| Model | UV759 |
| Price Range | USD 2,800–4,300 (FOB Shanghai) |
| Optical Design | Pseudo-Double-Beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | 0.1 nm |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.05% T at 220 nm and 360 nm |
| Photometric Accuracy | ±0.3% T |
| Photometric Repeatability | 0.1% T |
| Absorbance Range | –0.30 to 3.00 A |
| Transmittance Range | 0.0–200.0% T |
| Concentration Range | 0–1999 units |
| Baseline Flatness | ±0.001 A |
| Drift | ±0.001 A/h at 500 nm |
| Interface | USB (RS-232 compatible) |
| Display | 128 × 64 dot-matrix LCD |
| Data Storage | Onboard memory for spectra and quantitative results |
| Optional Accessories | Thermal printer, PC software (UVWinPro), cuvette holders (1–10 cm), quartz/cuvette kits |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Pseudo-Double-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm at 656.1 nm (D₂ line), ±0.3 nm across full range |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.05% T |
| Wavelength Repeatability | ≤0.2 nm |
| Photometric Accuracy | ±0.002 A (0–0.5 A), ±0.004 A (0.5–1 A), ±0.3% T (0–100% T) |
| Photometric Repeatability | ±0.001 A (0–0.5 A), ±0.002 A (0.5–1 A), ±0.15% T (0–100% T) |
| Baseline Flatness | ±0.0015 A |
| Drift | ±0.0005 A/h at 500 nm |
| Display | 6-inch high-brightness LCD (320 × 240 pixels) |
| Data Interface | USB port |
| Print Interface | Parallel port |
| Lamp Type | Plug-in deuterium and tungsten lamps |
| Sample Compartment | Accommodates cuvettes from 5 mm to 100 mm pathlength |
| Weight | 15 kg |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Domestic |
| Model | VIS 721 |
| Optical System | Achromatic Czerny-Turner (1200 L/mm grating) |
| Wavelength Range | 350–1020 nm |
| Wavelength Accuracy | ±2.0 nm |
| Wavelength Repeatability | ≤1 nm |
| Spectral Bandwidth | 6 nm |
| Photometric Accuracy (Transmittance) | ±1% T |
| Photometric Stability | ±0.004 A/h @ 500 nm |
| Drift | ≤0.2% T |
| Noise | ≤0.3% T |
| Stray Light | ≤0.3% T @ 360 nm |
| Detector Type | Silicon Photocell |
| Wavelength Adjustment | Manual |
| Sample Compartment | Accommodates up to 10 cm pathlength cuvettes |
| Display | Digital LED |
| Zero & 100% T Calibration | Automatic |
| Optional Interface | RS232 for printer or PC connectivity |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1020 nm |
| Wavelength Selection | Manual (Knob-Actuated) |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ±2 nm |
| Stray Light | ≤0.3% T at 360 nm |
| Photometric Accuracy | ±0.5% T |
| Wavelength Repeatability | ≤1 nm |
| Baseline Stability | ±0.004 A/h at 500 nm |
| Drift | ≤0.1% T |
| Noise | ≤0.2% T |
| Photometric Modes | Transmittance (%T), Absorbance (A), Concentration (C) |
| Light Source | Imported Tungsten-Halogen Lamp |
| Sample Compartment Dimensions | Accommodates up to 10 cm pathlength cuvettes |
| Interface Options | Optional RS-232 Serial Port for Printer or PC Connectivity |
| Net Weight | 8 kg |
| Optical System | Achromatic Czerny-Turner Monochromator with 1200 lines/mm Grating |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Domestic |
| Model | VIS-722N |
| Optical System | Achromatic Czerny-Turner with 1200 L/mm Grating |
| Wavelength Range | 320–1020 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤0.5 nm |
| Spectral Bandwidth | 4 nm |
| Photometric Accuracy (Transmittance) | ±0.5% T |
| Photometric Linearity | 0–200% T, –0.3 to 3 A, 0–9999 C |
| Baseline Stability | ±0.002 A/h @ 500 nm |
| Drift | ≤0.1% T |
| Noise | ≤0.2% T |
| Stray Light | ≤0.2% T @ 360 nm |
| Detector Type | Silicon Photocell |
| Light Source | Imported Tungsten-Halogen Lamp |
| Sample Chamber Dimensions | Accommodates up to 10 cm pathlength cuvettes |
| Operating Modes | Transmittance (T), Absorbance (A), Concentration (C) |
| Zeroing Method | Automatic |
| Interface Options | Optional RS-232 Serial Port for Printer/PC Connectivity |
| Net Weight | 8 kg |
| Power Supply | AC 220 V ±10%, 50 Hz |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Pseudo-Double-Beam |
| Detector Type | Photodiode Array |
| Wavelength Range | 320–1100 nm |
| Wavelength Automation | Motorized Auto-Scan |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±1 nm |
| Stray Light | ≤0.1%T at 360 nm |
| Wavelength Repeatability | ±0.5 nm |
| Photometric Accuracy | ±0.5%T |
| Photometric Repeatability | ±0.2%T |
| Photometric Range | 0–200%T, −0.301–3.000 A |
| Baseline Linearity | ±0.004 A |
| Drift Stability | ±0.002 A/h @ 500 nm |
| Display | 128×64 Dot-Matrix LCD |
| Light Source | Imported Tungsten Halogen Lamp |
| Sample Compartment Size | Accommodates Cuvettes from 5 mm to 100 mm Pathlength |
| Net Weight | 12 kg |
| Software Compatibility | YOKE 3.0 PC Control & Data Analysis Suite |
| Warranty | 12-month Limited Hardware Warranty with Lifetime Technical Support |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | Flex One |
| Instrument Architecture | Dual-Wavelength Excitation Pathway |
| Detector Type | Scientific-grade Cooled CCD |
| Spectral Range | 300–2200 nm |
| Wavelength Accuracy | ±0.2 nm |
| Spectral Resolution | 0.1 nm (typical, configuration-dependent) |
| Spectral Bandwidth | 0.05 nm |
| Stray Light Level | <1×10⁻⁵ |
| Automation Level | Motorized Wavelength Scanning & Positioning |
| Optional Modules | Automated Mapping (50 mm × 50 mm stage), Electroluminescence (EL) Integration, Micro-Raman Coupling, Cryogenic Sample Stage (<10 K) |