Ultraviolet Visible Spectrophotometer
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Showing 241–270 of 481 results
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | V-5000 |
| Price Range | USD 150–750 (FOB Shanghai) |
| Optical System | Single-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 325–1000 nm |
| Wavelength Selection | Manual via Rotary Knob |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤0.5 nm |
| Stray Light | ≤0.2% T |
| Data Interfaces | USB 2.0 port, Parallel Printer Port |
| Lamp Type | Plug-in Tungsten-Halogen Lamp |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | V-5100 |
| Price Range | USD 700–1,400 (FOB Shanghai) |
| Optical System | Single-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1000 nm |
| Wavelength Accuracy | ±2 nm |
| Spectral Bandwidth | 2 nm or 4 nm (selectable) |
| Stray Light | ≤0.1% T |
| Wavelength Scanning Mode | Automatic |
| Display | 128 × 64 dot-matrix LCD |
| Data Storage Capacity | 200 measurement sets & 200 calibration curves |
| Data Output | USB interface + parallel printer port |
| Lamp Type | Plug-in tungsten halogen lamp |
| Power Supply | AC 220 V ±10%, 50 Hz |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | V-5100B |
| Optical System | Single-beam |
| Detector | Silicon Photocell |
| Wavelength Range | 320–1000 nm |
| Wavelength Accuracy | ±1 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Spectral Bandwidth | 2 nm or 4 nm (selectable) |
| Stray Light | ≤0.1% T |
| Display | 128×64 dot-matrix LCD |
| Data Storage | 200 measurement sets + 200 calibration curves |
| Wavelength Control | Motorized auto-scanning with self-calibration |
| Output Interfaces | USB port + parallel printer port |
| Software Compatibility | Optional Metash Quantitative Analysis Suite (supports photometric analysis, kinetics, multi-wavelength scanning, DNA/protein quantification) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | V-5600(PC) |
| Instrument Architecture | Dual-Beam Ratio-Monitoring Optical System |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1100 nm |
| Automation Level | Automatic Wavelength Scanning & Calibration |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Stray Light | ≤0.05% T at 220 nm and 360 nm |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | V-5800 |
| Instrument Architecture | Dual-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05% T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-6 |
| Optical Design | Pseudo-Double-Beam |
| Detector | Silicon Photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.05% T |
| Photometric Accuracy | ±0.3% T (0–100% T), ±0.002 A (0–0.5 A), ±0.004 A (0.5–1.0 A) |
| Photometric Repeatability | ≤0.15% T (0–100% T), ≤0.001 A (0–0.5 A), ≤0.002 A (0.5–1.0 A) |
| Baseline Drift | ±0.001 A/h at 500 nm |
| Baseline Flatness | ±0.002 A |
| Noise Level | ≤0.4% T |
| Photometric Range | 0–200% T, –3.0 to +3.0 A, 0–9999 C |
| Data Interfaces | USB port, USB flash drive support, optional Bluetooth module, A4 inkjet printer interface |
| Display | 7-inch high-resolution capacitive touchscreen |
| Light Sources | Imported long-life tungsten lamp and deuterium lamp |
| Dimensions | 505 × 375 × 190 mm |
| Weight | 15.5 kg |
| Power Supply | AC 220 V/50 Hz or 110 V/60 Hz |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | X-6D |
| Optical System | Dual-beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05%T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | X-6DS |
| Optical System | Dual-beam |
| Detector | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Automation | Motorized |
| Spectral Bandwidth | 0.8 / 1.8 / 4.0 / 5.0 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05%T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-7 |
| Optical System | Pseudo-Double-Beam |
| Detector | Silicon Photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.03% T |
| Photometric Range | 0–200% Transmittance, –4.0 to +4.0 Absorbance, 0–9999 Concentration Units |
| Display | 10-inch capacitive multi-touch TFT LCD |
| Data Interface | USB 2.0 (for printer, flash drive, and PC connectivity) |
| Lamp Source | Imported long-life tungsten and deuterium lamps |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | X-7S |
| Optical Design | Pseudo-Double-Beam |
| Detector | Silicon Photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm (selectable) |
| Stray Light | ≤0.03% T |
| Photometric Accuracy | ±0.2% T (0–100% T), ±0.002 A (0–0.5 A), ±0.004 A (0.5–1.0 A) |
| Photometric Repeatability | ≤0.1% T, ≤0.001 A (0–0.5 A), ≤0.002 A (0.5–1.0 A) |
| Baseline Drift | ±0.0005 A/h at 500 nm |
| Baseline Flatness | ±0.001 A |
| Noise Level | ±0.0005 A |
| Photometric Range | 0–200% T, –4.0 to +4.0 A, 0–9999 C |
| Display | 10-inch capacitive multi-touch TFT color screen |
| Data Interface | USB 2.0 (host and device) |
| Power Supply | AC 220 V/50 Hz or 110 V/60 Hz |
| Dimensions (W×D×H) | 460 × 380 × 180 mm |
| Weight | 20 kg |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-8 |
| Wavelength Range | 190–1100 nm |
| Optical System | Dual-beam |
| Detector Type | Silicon Photocell |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.15 nm |
| Stray Light | ≤0.03%T |
| Photometric Repeatability | ≤0.1%T |
| Noise Level | ≤0.4%T |
| Display | 10-inch capacitive touchscreen (1024 × 600 resolution, <3 ms response time) |
| Data Interfaces | USB, Bluetooth, Wi-Fi (optional) |
| Lamp Type | Plug-in deuterium and tungsten lamps |
| Base Material | 20 mm machined aluminum optical bench |
| Compliance | GLP/GMP-aligned software architecture, audit-trail-ready user management |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-8D |
| Optical System | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.03%T |
| Photometric Accuracy | ±0.3%T (0–100%T) |
| Photometric Repeatability | ≤0.1%T (0–100%T) |
| Noise Level | ≤0.3%T |
| Display | 10-inch HD True-Color Touchscreen |
| Data Output | USB, U-disk, Bluetooth (optional), A4 Inkjet Printer (HP 1100/1200 series compatible) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | X-8DS |
| Optical System | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm (5-step adjustable) |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.03% T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | X-8S |
| Optical System | Pseudo-Double-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.15 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm |
| Stray Light | ≤0.03%T |
| Display | 10-inch capacitive touchscreen (1024 × 600 resolution) |
| Data Interfaces | USB, Bluetooth, Wi-Fi (optional) |
| Compliance | GLP/GMP-ready software architecture |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | X-9D |
| Price Range | USD 9,800 – 13,900 (FOB Shanghai) |
| Optical Design | Dual-beam |
| Detector | Silicon Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning | Automatic |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.01%T |
| Photometric Repeatability | ≤0.1%T (0–100%T) |
| Noise Level | ≤0.3%T |
| Display | 10-inch capacitive touchscreen (1024 × 600) |
| Connectivity | USB, Bluetooth, Wi-Fi (optional) |
| Data Output | A4 printer support (inkjet/laser), customizable file naming, GLP-compliant audit trail |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | X-9DS |
| Optical System | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 0.1 / 0.2 / 0.5 / 1.0 / 2.0 / 4.0 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.01%T |
| Brand | Mapada |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Origin | Domestic (China) |
| Model | UV-6100S |
| Price Range | USD 7,000–10,000 |
| Optical System | Dual-beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Spectral Bandwidth | 1.8 nm (fixed) |
| Wavelength Setting | Automatic |
| Display | 320 × 240 LCD |
| Measurement Modes | Transmittance (T), Absorbance (A), Concentration (C), Energy (E) |
| Scan Speed Options | High/Medium/Low (up to 3800 nm/min) |
| Light Sources | Long-life imported tungsten lamp and deuterium lamp |
| Detector Type | Imported silicon photodiode |
| Interface | USB port for data export |
| Power Supply | AC 220 V / 50 Hz or AC 110 V / 60 Hz |
| Dimensions | 590 × 420 × 260 mm |
| Net Weight | 26 kg |
| Brand | Metrolux |
|---|---|
| Origin | Germany |
| Model | ML6500 |
| Wavelength Range | 115–230 nm (single lamp), 115–320 nm (dual lamp: D₂ + Xe) |
| Spectral Resolution | < 1 nm FWHM at 160 nm |
| Wavelength Reproducibility | < 0.1 nm (validated at 121.5 nm and 160 nm) |
| Operating Pressure | < 1×10⁻⁵ mbar |
| Transmittance Accuracy | < ±0.3% |
| Reflectance Accuracy | < ±0.5% |
| Out-of-Band Transmittance | < 0.1% |
| Scattered Reflectance (157 nm) | > 0.001% |
| Diffuse Reflectance (157 nm, 1 mm aperture) | < 5% |
| Scattered Reflectance (157 nm, 1 mm aperture) | < 5% |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Easy UV |
| Price | Upon Request |
| Wavelength Range | 190–1000 nm |
| Photometric Accuracy (K₂Cr₂O₇) | ±0.005 A |
| Wavelength Accuracy | ±1.5 nm |
| Stray Light (KCl, 198 nm) | ≤2.5% |
| Light Source | Xenon Flash Lamp |
| Optical Path Lengths | 10 mm, 16 mm, 20 mm, 30 mm, 40 mm, 50 mm (1 inch equivalent) |
| Display | 4.3-inch capacitive touchscreen |
| Dimensions (H×W×D) | 176 × 201 × 362 mm |
| Weight | 4.25 kg |
| Max. Stored Methods | 80 |
| User-Defined Quick Keys | 10 |
| Supported Languages | English, Spanish, French, German, Italian, Portuguese, Polish, Japanese, Korean, Chinese, Thai, Indonesian |
| Colorimetric Standards | CIELAB, APHA, Gardner (30 pre-programmed color scales) |
| Compliance | Designed to support pharmacopeial workflows (USP <85>, EP 2.2.25, JP 2.04) |
| Connectivity | USB port for printer (USB-P25), barcode scanner (SQKitReader™), and peripheral storage |
| Sample Handling | Fixed cuvette holder (no autosampler or cuvette changer) |
| Application Scope | Quantitative analysis, spectral scanning, water quality testing (Spectroquant® integration), color measurement |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Model | Easy VIS |
| Wavelength Range | 330–1000 nm |
| Photometric Accuracy (K₂Cr₂O₇) | ±0.005 A |
| Wavelength Accuracy | ±1.5 nm |
| Light Source | Tungsten Halogen Lamp |
| Optical Path Options | 10, 16, 20, 30, 40, 50 mm (1 inch) |
| Display | 4.3-inch capacitive touchscreen |
| Dimensions (H × W × D) | 176 × 201 × 362 mm |
| Weight | 4.25 kg |
| User-Defined Methods | Up to 80 |
| Quick Access Keys per User | 10 |
| Supported Languages | English, Spanish, French, German, Italian, Portuguese, Polish, Japanese, Korean, Chinese, Thai, Indonesian |
| Barcode Reader Compatibility | SQKitReader™ handheld scanner (optional) |
| Printer Interface | USB-P25 |
| USB Host Port | Yes |
| Cuvette Changer | Not integrated |
| Pharmacopeia Compliance | Not specified |
| Colorimetric Standards | 25 pre-programmed methods (CIELAB, APHA, Gardner, etc.) |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | UV5 |
| Wavelength Range | 190–1100 nm |
| Detector Type | CCD (Charge-Coupled Device) |
| Optical Design | Dual-Wavelength |
| Wavelength Accuracy | ±1.0 nm |
| Measurement Speed | Full-spectrum scan in <1 second |
| Light Source | Xenon flash lamp |
| Warm-up Time | Zero |
| Automation Level | Fully automated wavelength selection and measurement execution |
| Sample Compartment | Open-access, motor-free design |
| Software Platform | LabX UV-Vis PC software (21 CFR Part 11 / EU Annex 11 compliant) |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Model | UV5, UV7 |
| Optical Design | Single-beam with pulsed xenon lamp |
| Detector | 2048-pixel CCD array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±1.0 nm (UV5), ±0.8 nm (UV7) |
| Stray Light | <0.01% T at 198 nm (KCl) |
| Scan Speed | Full spectrum in ≤1 s |
| Photometric Accuracy | ±0.01 A (K₂Cr₂O₇) |
| Wavelength Resolution (toluene in n-hexane) | >1.5 nm (UV5), >1.9 nm (UV7) |
| Display | 7″ QVGA color TFT touchscreen (400 × 800 px) |
| Dimensions (L×W×H, without controller) | 208 × 255 × 228 mm |
| Weight (with controller) | 6.4 kg |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Model | UV5 / UV7 / UV5Bio |
| Detector Type | CCD (Charge-Coupled Device) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.9 nm |
| Spectral Bandwidth | 1 nm |
| Stray Light | <0.03% T (at 220 nm, KI solution) |
| Automation Level | Automatic Wavelength Selection |
| Lamp Type | Xenon Flash Lamp |
| Warm-up Time | None |
| Dimensions | Compact footprint (~A4 size) |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Model | UV5Bio / UV5Nano |
| Optical Design | Dual-wavelength |
| Detector | CCD array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±1.0 nm |
| Stray Light (at 198 nm, KCl) | >2.0 A |
| Scan Time (full spectrum) | 1 s |
| Automation | Automatic wavelength selection, integrated cuvette changer, FillPalMini peristaltic pump |
| Compliance | ASTM E275, ISO 6425, USP <857>, FDA 21 CFR Part 11 ready (via LabX®) |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | UV5Nano |
| Detector Type | CCD (Charge-Coupled Device) |
| Wavelength Range | 190 nm – 1,100 nm |
| Wavelength Automation | Automatic |
| Spectral Bandwidth | 1.5 nm |
| Wavelength Accuracy | ±0.9 nm |
| Stray Light | <0.03% T (at 220 nm, KI solution) |
| Brand | METTLER TOLEDO |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | UV5Nano |
| Instrument Architecture | Dual-wavelength |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190 nm – 1,100 nm |
| Wavelength Accuracy | ±1.0 nm |
| Photometric Accuracy (K₂Cr₂O₇) | ±0.01 A |
| Path Length Options | 0.1 mm and 1.0 mm |
| Cuvette Holder | Yes |
| Automation Level | Automatic Wavelength Selection |
| Sample Volume Requirement | As low as 0.3 µL |
| Brand | MPB |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic (China) |
| Model | M7 |
| Price Range | USD 9,800 – 14,000 |
| Optical Design | Dual-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 190 – 1100 nm |
| Wavelength Scanning Mode | Motorized Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| [Brand | MPB |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Architecture | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.5 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Scanning | Motorized & Auto-Calibrated |
| Light Source | Pulsed Xenon Lamp (No Preheating Required)] |
| [Brand | MPB |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Single-Beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.5 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Scanning Mode | Motorized Auto-Scanning |
| Compliance | ISO/IEC 17025-compatible validation protocols supported] |
| Brand | MPD |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Architecture | Quasi-Double-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Motorized Auto-Scanning |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Display | 5-inch Capacitive Color Touchscreen |
| Sample Compartment Design | Removable Front Panel, Damped Hinged Lid (0–120° Position Hold), Integrated Spill Drain Port |