X-Ray Instruments
Filter
Showing 391–420 of 786 results
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | YANG 700 |
| Pricing | Upon Request |
| Brand | Laser Components |
|---|---|
| Model | IG26 Series |
| Detector Type | PIN Photodiode |
| Cutoff Wavelength | 2.6 µm |
| Spectral Range | 0.8–2.6 µm |
| Typical Responsivity @ 2.0 µm | 1.45 A/W |
| Operating Temperature | −40 °C to +85 °C (TE-cooled variants available) |
| Shunt Resistance | >10⁹ Ω (typ. at 0 V, 25 °C) |
| Dark Current | <10 nA (typ. at −5 V, 25 °C) |
| Capacitance | <20 pF (typ. at −5 V, 25 °C) |
| Active Area Options | 0.05–1.0 mm² |
| Package | TO-8, TO-46, or OEM hermetic ceramic |
| Brand | JWGB (Jingwei Gaobo) |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | Lattice GO |
| Instrument Type | Powder X-ray Diffractometer |
| Instrument Configuration | Portable |
| X-ray Tube Power | 30 W |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.2° |
| Dimensions (L×W×H) | 120 mm × 300 mm × 305 mm |
| Weight | 12 kg |
| X-ray Tube | Cu anode, 30 kV / 1 mA |
| Goniometer Geometry | Vertical θ–2θ Bragg–Brentano |
| Goniometer Radius | 110 mm |
| Detector | Photon-counting 2D array detector |
| Scan Speeds | 6°/min or 13°/min (selectable) |
| 2θ Range | 0°–130° |
| Battery Runtime | 3 hours |
| Origin | USA |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | LC-06 |
| Price Range | USD 28,000 – 70,000 |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Angular Resolution | < 0.05° |
| Effective Detection Area | 30 cm × 30 cm |
| Data Acquisition Time | Seconds per Laue Pattern |
| Gas Replacement Interval | Every 6 months |
| Coolant Replacement Interval | Annually |
| Sample Rotation Capability | Yes |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LC-02 |
| Pricing | Upon Request |
| Brand | LND Inc. |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Custom-Configurable |
| Pricing | Available Upon Request |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | 2830 ZT |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Detector Configuration | Sequential Multi-channel |
| Analyzable Elements | B, C, N, O, F, Mg, TiSiₓ, CoSiₓ, WSiₓ |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Aeris |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-stability X-ray tube voltage/current regulation) |
| Brand | Malvern PANalytical |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Aeris Cement Edition |
| Pricing | Upon Request |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Aeris HCSC |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Axios FAST |
| Instrument Type | Floor-standing |
| Instrument Configuration | Simultaneous Multi-Channel WDXRF |
| X-ray Tube | SST-mAX with 160 mA high-power capability |
| Analyzable Elements | Up to 28 elements (Na to U) |
| Detection Range | ppm to 100 wt% |
| Sample Throughput | Up to 168 samples unattended |
| Minimum Measurement Time per Sample | 2 seconds |
| Optional Configurations | Up to 4 goniometers, HiPer channel for light elements (Na–F), anode materials (Rh, Cr, Mo, Au) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Malvern Panalytical |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Consumption | 0.0001 kW |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Consumption | 0.0001 kW |
| Core Technology | MultiCore Optics (iCore/dCore) |
| Detector Technology | Hybrid Pixel Array (PIXcel3D / GaliPIX3D) |
| Sample Flexibility | Powder, Thin Film, Nanomaterials, Bulk Solids |
| Compliance Framework | GLP-ready, PreFIX modular architecture, ISO/IEC 17025-compatible workflow support |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon 1 ISO 13032 |
| Configuration | Benchtop |
| Industry Application | Energy & Petrochemicals |
| Elemental Range | Na to Am |
| Quantification Range | ppm to % |
| Energy Resolution | 135 eV |
| Repeatability | High |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Epsilon 4 |
| Form Factor | Benchtop / Floor-standing Configurable |
| Application Scope | Universal |
| Elemental Range | F–Am (C–Am with optional configuration) |
| Quantification Range | 0.01 ppm – 100 wt% |
| Energy Resolution | ~135 eV (at Mn Kα, 5.9 keV) |
| Repeatability | As low as 0.02% RSD (relative standard deviation) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon Xflow |
| Form Factor | Benchtop or Floor-Standing |
| Industry-Specific Application | Energy & Chemical Processing |
| Elemental Range | Na (Z=11) to Am (Z=95) |
| Quantification Range | 1 ppm to 100% w/w |
| Energy Resolution | <145 eV at 5.9 keV (1000 cps) |
| Repeatability | Concentration-dependent |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon1 |
| Form Factor | Benchtop |
| Industry Application | Energy & Chemicals |
| Elemental Range | Na (Z=11) to Am (Z=95) |
| Quantification Range | 1 ppm to 100% w/w |
| Energy Resolution | <145 eV at Mn Kα (5.9 keV, 1000 cps) |
| Repeatability | Concentration-dependent, compliant with ISO 8258 and ASTM E1621 for precision validation |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Omega/Theta |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Accuracy (1σ) | <0.003° (rocking angle), <0.03° (in-plane direction) |
| Measurement Time | ≤10 s per orientation determination |
| Maximum Sample Weight | 30 kg |
| Maximum Sample Length | 450 mm |
| Goniometer Configuration | Omega/Theta (θ–2θ coupled or independent scanning) |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Revontium |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na to Am (Z = 11 to Z = 95) |
| Energy Resolution | <145 eV at Mn Kα |
| Detectors | Four simultaneous silicon drift detectors (SDDs) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W air-cooled Cu-anode microfocus X-ray tube |
| Measurement Speed | Full orientation determination in ≤10 s per sample rotation |
| Sample Diameter Range | 1–200 mm |
| Angular Precision (Si 100) | Tilt magnitude < 0.01°, tilt direction < 0.03° |
| Uptime | >99% |
| Theta Scan Capability | Yes |
| Multi-crystal Transfer | Up to 6 oriented crystals per collimated beam |
| MES Integration | Compatible with SECS/GEM-compliant manufacturing execution systems |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Wafer XRD |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Sample Size Compatibility | 3-inch to 8-inch wafers (custom FOUPs, carriers, or single-wafer stages available) |
| Measurement Speed | <10 seconds per wafer |
| Typical Standard Deviation (Tilt Angle) | <0.003° for Si(100) |
| X-ray Source Options | Air-cooled microfocus Cu-target tube (30 W) or water-cooled fine-focus Cu-target tube (1.5 kW) |
| Safety Compliance | Fully CE-compliant with integrated interlock and three-color tower light status indication |
| Interface Protocols | SEMI-compliant MES and SECS/GEM |
| Optional Modules | Resistivity measurement (0.01–0.020 Ω·cm), automated matrix/QR/barcode recognition, unpolished & mirror-surface distance metrology |
| Material Support | Si, SiC, GaAs, GaN, Sapphire (Al₂O₃), Ge, AlN, Quartz, InP, and >100 additional crystalline semiconductor substrates |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X’Pert3 MRD (XL) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Supply | Not Specified |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Crystal Orientation |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Speed | ≤10 s per measurement |
| Angular Accuracy | ±0.003° (Wafer XRD 200/300), ±0.01° (DDCOM/SDCOM) |
| Sample Diameter Range | 1–225 mm |
| Cooling Requirement | Air-cooled (no water cooling required) |
| Compliance | ASTM E975, ISO 18755, IEC 61000-6-3, CE, RoHS |
| Interface Options | Ethernet/IP, Profibus, Modbus TCP, SECS/GEM |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Zetium |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 2.4–4 kW |
| Elemental Range | 4Be to 95Am |
| Instrument Class | Scanning-type WDXRF |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Instrument Type | Floor-standing |
| Excitation Source | High-power X-ray tube (2.4–4 kW) |
| Analytical Range | Be (4) to Am (95) |
| Configuration | Scanning-type WDXRF with integrated EDXRF core (SumXcore technology) |
| Software Platform | SuperQ with Virtual Analyst |
| Compliance | Designed for ISO/IEC 17025, ASTM E1621, ASTM E2488, USP <233>, and GLP/GMP environments requiring audit trail and electronic signature support (21 CFR Part 11 ready) |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MiniSAXS |
| Price Range | USD 140,000 – 280,000 |
| Instrument Type | Small-Angle X-ray Scattering (SAXS) System |
| Measurement Range | 1 nm – 100 nm |
| Available Anode Materials | Cu, Mo, Ag |
| Collimation | Pinhole-based collimation system |
| Filtration | Integrated beam filtration unit |
| Sample Stage | Motorized 3-axis stage with 16-position powder holder and 16-position solid-sample holder |
| Detector | Two-dimensional silicon pixel array single-photon counting detector |
| Pixel Size | 75 µm × 75 µm |
| Readout Mode | Continuous, zero dead time, no readout noise or dark current |
| Dynamic Range | 32-bit |
| Sample-to-Detector Distance (SD) | 40 mm – 350 mm |
| Scattering Vector (q) Range | 0.063 nm⁻¹ – 6.3 nm⁻¹ |
| Dimensions (W×D×H) | 840 mm × 750 mm × 700 mm |
| Power Supply | AC 220 V, 50 Hz (single-phase) |
| Supported Techniques | SAXS, WAXS, GIWAXS, GISAXS |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | Monoblock |
| Tube Type | Metal-Ceramic |
| Target Materials | Ag, W, Pd, Rh |
| Operating Voltage Range | 10–50 kV |
| Current Range | 0–0.2 mA |
| Max Output Power | 10 W |
| Focal Spot Size | 400 µm |
| Stability | < 1.0% RSD |
| Beryllium Window Thickness | 0.25 mm |
| Max Input Power | 20 W |
| Operating Temperature | −10 °C to +50 °C |
| Storage Temperature | −40 °C to +60 °C |
| Weight | 500 g |
| Compliance | RoHS, CE (per IEC 61010-1), FDA 21 CFR Part 1020.40 (X-ray equipment) |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TUB00045 |
| Voltage Range | −4 to 40 kV |
| Current Range | 0–100 µA |
| Max Output Power | 4 W |
| Optional Anode Materials | Ag, W, Pd, Rh, Ta, Au |
| Input Voltage | 7–12 VDC |
| Weight | 450 g |
| Warranty | 1 Year |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TUB00046 |
| Voltage Range | ±4–40 kV |
| Current Range | 0–100 µA |
| Max Power Output | 4 W |
| Anode Target Options | Tungsten (W), Rhodium (Rh), Copper (Cu) |
| Focal Spot Size | 300 µm |
| HV Cable Length Options | 1–11.5 inches |
| Warranty | 12 months |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TUB00050 |
| Voltage Range | 4–50 kV |
| Current Range | 0–200 µA |
| Max Output Power | 10 W |
| Optional Anode Materials | Ag, W, Pd, Rh, Ta, Au |
| Input Voltage | 6–12 VDC |
| Weight | 500 g |
| HV Cable Length Options | 1–11.5 in |
| Warranty | 1 year |