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| Brand | Abner |
|---|---|
| Origin | Jiangsu, China |
| Model | ABN-AFM-001 |
| Instrument Type | Material-oriented AFM |
| Sample Dimensions | Max 15 mm × 15 mm × 2 mm |
| Scan Range | 70 µm × 70 µm (X–Y), 17 µm (Z) |
| Lateral Resolution | ≤1 nm |
| Vertical Resolution | ≤0.1 nm |
| XY Noise | ≤0.01 nm RMS |
| Z Noise | ≤0.05 nm RMS |
| Scan Speed | Up to 10 Hz |
| Probe Compatibility | Si probes with spring constants from 0.01 N/m to 40 N/m |
| Scanner | High-precision closed-loop piezoelectric scanner |
| Environmental Requirements | 18–25 °C, ≤60% RH |
| Image Resolution | 512×512 to 2048×2048 pixels |
| Interface | USB and Ethernet |
| Power Supply | 220 V/50 Hz or 110 V/60 Hz |
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