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| Brand | Abner |
|---|---|
| Origin | Jiangsu, China |
| Model | ABN-XRF-001 |
| Instrument Type | Benchtop |
| Scanning Mode | 2D Mapping |
| Scan Speed | ≤1 frame/sec |
| Detector | 2048 × 2048 CMOS |
| Effective Detection Area | 4.6 mm × 4.6 mm |
| Spatial Resolution | ≤2 µm |
| Quantitative Accuracy | ±0.5% relative error (for major/majority elements) |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Sample Stage Max Size | 30 mm × 30 mm |
| Operating Temperature Range | −196 °C to 100 °C |
| Power Consumption | ≤100 W |
| Safety Compliance | IEC 61010-1, IEC 62471 (UV/X-ray emission limits) |
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