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| Brand | Hprobe |
|---|---|
| Origin | France |
| Model | Hprobe |
| Type | Automated Magnetic Testing System for Semiconductor Wafers |
| Compatibility | 100–300 mm wafers |
| Cooling | Air-cooled |
| Power Supply | Standard AC mains |
| Field Generation | 3D vector and uniaxial (Hcoil-2T) magnetic field sources |
| Max Field Strength | ±2 T (uniaxial), up to 500 mT (3D vector) |
| Field Scan Rate | Up to 10,000 device/s |
| Field Rise Time | <20 µs (Hcoil-2T) |
| Integration | Compatible with TEL, ACCRETECH, and Electroglas probers |
| Software Platform | IBEX (MRAM), LINX (sensors), GUI-based automation with calibration, sequencing, and production control modules |
| Compliance | Designed for GLP/GMP environments |
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