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| Brand | Auniontech |
|---|---|
| Model | XR-100 |
| Detector Type | Thermoelectrically Cooled Si-PIN or Silicon Drift Detector (SDD) |
| Energy Resolution (5.9 keV ⁵⁵Fe) | 145 eV (Si-PIN), 122 eV (FAST SDD) |
| Active Area | 6–25 mm² |
| Detector Thickness | 500 µm |
| Beryllium Window Thickness | 0.3–1.0 mil (C1/C2 windows available) |
| Integrated Collimator | Yes |
| Package | Hermetically Sealed TO-8 |
| Preamp Architecture | External JFET-based (SDD), Monolithic CMOS/MOSFET (FAST SDD) |
| Brand | Auniontech |
|---|---|
| Wavelength Range | 1200–1650 nm & 850 nm |
| Attenuation Range | 0–65 dB |
| Accuracy | ±0.15 dB (1200–1650 nm) / ±0.3 dB (850 nm) |
| Repeatability | ±0.015 dB (1200–1650 nm) / ±0.03 dB (850 nm) |
| Insertion Loss | ≤1.5 dB |
| Operating Temperature | 23 °C ±5 °C |
| Mode Options | Absolute Attenuation (including IL) & Relative Attenuation |
| Features | Integrated Optical Shutter, Zero-Attenuation Calibration Function |
| Compliance | Designed for telecom-grade test environments per ITU-T G.691, IEC 61280-2-9, and Telcordia GR-1073-CORE |
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