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| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic (PRC-Made) |
| Model Designation | XRF-Desktop Series |
| Form Factor | Benchtop |
| Detector Technology | Silicon Drift Detector (SDD) |
| Elemental Range | Na (11) to U (92) |
| Simultaneous Elements | Up to 25 |
| Coating Layers | Up to 5 (including alloy substrates) |
| Analysis Mode | Fundamental Parameters (FP) & Standardless Quantitative Analysis |
| Software Platform | Archer™ XRF Suite |
| Compliance | CE, RoHS, ISO/IEC 17025-compatible workflows |
| Connectivity | USB 2.0 |
| Footprint | < 400 × 350 × 300 mm |
| Weight | < 25 kg |
| Brand | Avenir |
|---|---|
| Origin | Germany |
| Type | Fiber Optic Spectrometer |
| Model | ARIS Compact |
| Spectral Range | UV–VIS–NIR (configurable) |
| Optical Resolution (FWHM, typical) | 0.33–1.10 nm |
| Detector Options | Toshiba TCD1304DG (3648 px) or Hamamatsu S11639-01 (2048 px) |
| Integration Time | 3 µs – 35 min (TCD1304DG) |
| Stray Light Suppression | < 0.01% @ 600 nm |
| SNR | 350:1 (TCD1304DG), 600:1 (S11639-01) |
| Dynamic Range | 1900:1 (TCD1304DG), 5000:1 (S11639-01) |
| Pixel Readout Rate | 1 MHz / 2 MHz |
| Trigger Jitter | ≤10 µs |
| Slit | User-replaceable 20 µm default (optional slits available) |
| Brand | Auniontech (HaoLiang) |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | PR-1050 SpectraScan |
| Pricing | Available Upon Request |
| Brand | Auniontech (distributor) |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic (PRC-manufactured) |
| Model Series | WP Raman XL |
| Form Factor | Portable / Handheld Raman Spectrometer |
| Excitation Wavelength Options | 532 nm, 633 nm, 785 nm, 830 nm, 1064 nm |
| Detector | Ultra-cooled scientific CMOS/CCD camera |
| Optical Architecture | High-throughput Czerny–Turner spectrometer with optimized f/# and stray-light suppression |
| Probe Interface | Interchangeable fiber-coupled probe tips (standard, industrial spherical, microscope-coupled lens adapters) |
| OEM Integration | Embedded modular Raman engine available (785/830/1064 nm variants) |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Ci4200 / Ci4200UV |
| Pricing | Available Upon Request |
| Optical Geometry | d/8° with DRS (Diffuse/8°) |
| Illumination/Measurement Aperture | 14 mm / 8 mm |
| Light Source | Tungsten-Halogen Lamp + UV LEDs (Ci4200UV only) |
| Detector | Blue-Enhanced Silicon Photodiode |
| Spectral Range | 400–700 nm |
| Spectral Interval | 10 nm (acquisition & output) |
| Reflectance Range | 0–200% |
| Inter-instrument Agreement | Avg. ΔE*ab ≤ 0.20 (BCRA Series II, SCI mode), Max. ΔE*ab ≤ 0.40 per tile |
| Short-Term Repeatability | ≤ 0.05 ΔE*ab (white tile) |
| Measurement Time | ~2 s (simultaneous SCI/SCE) |
| Gloss Measurement | 60° |
| UV Calibration Function | Yes |
| Transform Support | Yes |
| LED Status Panel & Remote Trigger via Measuring Button | Yes |
| Sample Fixture | Positionable & Preview-Capable |
| Mounting Flexibility | Horizontal & Vertical Orientation |
| Data Compatibility | Cross-platform with portable integrating sphere instruments |
| Lamp Lifetime | ~500,000 measurements |
| Power Supply | 90–130 VAC or 100–240 VAC, 50–60 Hz, ≤15 W |
| Interface | USB |
| Operating Temp. | 10–40 °C (50–104 °F), ≤85% RH (non-condensing) |
| Storage Temp. | −20–50 °C (−4–122 °F) |
| Weight | 5.2 kg (11.5 lbs) |
| Dimensions | 221 mm (H) × 190 mm (W) × 264 mm (D) |
| Standard Accessories | Black trap, white & green calibration tiles, UV calibration standard (Ci4200UV), user manual, AC adapter, USB cable |
| Brand | Auniontech |
|---|---|
| Model | micro-CT |
| X-ray Tube Voltage | Up to 200 kV |
| Detector Resolution | Up to 16 MP |
| Scan Speed | < 10 s per scan |
| Number of Projections | Up to 8-axis acquisition |
| Spatial Resolution | 0.4 µm – 5 µm |
| System Weight | 20 kg (CT-PORTABLE variant) |
| Radiation Leakage | < 1 µSv/h |
| Power Output | Up to 65 W (CT-XPRESS variant) |
| Brand | Auniontech (HaoLiang) |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | Nanalysis 100 MHz |
| Operating Frequency | 100 MHz (2.35 T) |
| Magnet Type | Permanent, Cryogen-Free |
| Nuclei Support | Dual-Tuned Probes (e.g., ¹H/¹³C, ¹H/³¹P, ¹H/¹⁹F, ¹H/¹¹B, ¹⁹F/⁷Li) |
| Lock Channel | ¹H or ²H |
| Sample Format | Standard 5 mm NMR tubes |
| Resolution | <1.0 Hz (at 100 MHz) |
| Sensitivity | 220:1 (1% ethylbenzene in CDCl₃) |
| Data Formats | JCAMP-DX, Delta, ACD/Labs, TopSpin, LabVIEW, MATLAB |
| Operating Temperature | 16–28 °C |
| Power Input | 100–240 VAC, 50–60 Hz |
| Dimensions | 37.1 × 41.4 × 65.5 cm (14.6 × 16.3 × 25.8 in) |
| Weight | 84 kg |
| User Interface | Integrated touchscreen PC + remote access capability |
| Compliance | Designed for GLP-compliant environments |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | d-shot |
| Measurement Principle | Dispersion-Scan (D-scan) |
| Pulse Duration Range | < 50 fs |
| Repetition Rate Support | Single-shot to MHz |
| Compatible Pulse Types | Few-cycle and Multi-cycle Pulses |
| Output | Full Electric Field Reconstruction (Amplitude & Phase) |
| Software | Real-time Retrieval Algorithm with Visual Trajectory Feedback |
| Compliance | Designed for GLP/GMP-aligned ultrafast labs |
| Brand | Arcoptix |
|---|---|
| Origin | Switzerland |
| Model | FT-IR Rocket |
| Detector | Thermoelectrically Cooled MCT (2-stage or 4-stage) |
| Spectral Range | Mid-IR (typically 2.5–12 µm / 4000–833 cm⁻¹, configuration-dependent) |
| Resolution | 4 cm⁻¹ or 8 cm⁻¹ |
| Coupling Options | Fiber-optic (SMA-905 or FC/PC) and Free-space |
| Light Source | Integrated Broadband IR Emitter |
| Compliance | CE-marked, RoHS-compliant |
| Software Interface | USB 2.0, SDK for LabVIEW, Python, MATLAB |
| Brand | Arcoptix |
|---|---|
| Origin | Switzerland |
| Model | FT-IR Rocket |
| Detector | Thermoelectrically Cooled HgCdTe (MCT) |
| Interferometer Type | Permanently Aligned Dual Corner-Cube Design |
| Reference Laser | Solid-State Stabilized Laser (PPM-level wavelength stability) |
| Spectral Range | Mid-Infrared (Typical 2–12 µm, configuration-dependent) |
| Optical Interface | Fiber-Coupled or Free-Space Input |
| Resolution | Up to 0.5 cm⁻¹ (configurable) |
| Scan Rate | Up to 10 scans/sec (typical) |
| Weight | < 1.2 kg |
| Dimensions | 120 × 85 × 65 mm |
| Brand | Admesy |
|---|---|
| Origin | Netherlands |
| Model | CS2000 |
| Luminance Range | 0.003–300 cd/m² |
| Contrast Ratio Measurement Capability | Up to 100,000:1 |
| Spectral Bandwidth (FWHM) | 5 nm |
| Polarization Error | ≤2% (at 1° field of view) |
| Measurement Angles | 1°, 0.2°, 0.1° |
| Minimum Measurable Spot Size | Ø0.1 mm (with close-up lens) |
| Measurement Time at 1 cd/m² (Fast Mode) | ~5 s |
| Warm-up Time | 30 s |
| Operating Temperature | 5–35 °C |
| Compliance | JIS Z 8724-1997, CIE 122-1996 |
| Brand | Auniontech (distributor of GGB Industries) |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | GGB Industries, USA |
| Type | Coaxial Millimeter-Wave On-Wafer Probe |
| Frequency Range | 750–1100 GHz (D-Band) |
| Impedance | 50 Ω |
| Tip Configuration | Coplanar Spring-Loaded Beryllium-Copper |
| DC Bias Capability | Up to 100 mA |
| Optical Alignment | Integrated Tip Viewing Port |
| Compliance | Designed for ASTM F2683, IEEE Std 145-2013, and ISO/IEC 17025-compliant on-wafer RF characterization workflows |
| Optional Accessories | Bias-T modules, probe positioning stages, calibration substrates (Si/SiO₂, quartz), and WR-0.8 waveguide interfaces |
| Brand | X-Rite |
|---|---|
| Model | Ci7500 |
| Measurement Principle | D/8° (Diffuse Illumination / 8° Viewing) with Integrated Sphere |
| Wavelength Range | 360–750 nm |
| Optical Geometry | SCI & SCE Simultaneous |
| Aperture Options | 25 mm & 10 mm |
| Repeatability (White Tile) | ≤0.03 ΔE* uv (D65, UV Filter On) |
| Inter-Instrument Agreement (SCI) | ≤0.15 avg. ΔE CIELAB |
| Spectral Bandwidth | 10 nm |
| Reflectance Range | 0–200% |
| Measurement Cycle Time | <3 s |
| Brand | Specim (Finland) |
|---|---|
| Origin | Finland |
| Model | SPECIMONE |
| Operating Principle | Push-broom |
| Imaging Method | Dispersive |
| Deployment | Ground-based |
| Spectral Range | 400–1000 nm |
| Spectral Resolution | 2 nm |
| Spatial Resolution | 1280 × 1024 pixels |
| Total Field of View (TFOV) | 8° |
| Instantaneous Field of View (IFOV) | 0.18 mrad |
| Frame Rate | 15 fps |
| Certification | CE, FCC, RoHS3 |
| Operating Temperature | −10 °C to +60 °C |
| Operating Humidity | 95% RH (at 40 °C, non-condensing) |
| Data Interface | GigE Vision (RGB8, Mono12, Mono12packed), USB 3.0, RS-232/485, CAN |
| Embedded Platform | NVIDIA Jetson AGX Xavier SoC |
| Onboard Storage | 256 GB |
| Dimensions | 190 × 300 × 90 mm |
| Weight | 4.6 kg |
| Compatible Cameras | Specim FX10, FX17, FX50 |
| OS | Specim CameraOS |
| Web UI | CameraOS webUI |
| Data Format | ENVI-compatible Specim native format |
| Brand | Silios |
|---|---|
| Origin | France |
| Model | TOUCAN Mosaic |
| Spectral Range | 420–870 nm |
| Spectral Bands | 10 |
| FWHM | 30–50 nm |
| Sensor | CMOS |
| Resolution (RAW) | 2048 × 2048 |
| Spectral Image Resolution | 512 × 512 |
| Pixel Pitch | 5.5 µm |
| Frame Rate | 65 Hz (native), 20 Hz (with COLOR-SHADES Lab software) |
| Exposure Time | 100 µs – 5 s |
| Bit Depth | 10-bit |
| Interface | USB 3.0 |
| Lens Mount | CS-mount (C-mount compatible via adapter) |
| Dimensions | 52 × 63 × 40 mm |
| Weight | <180 g |
| Technology | COLOR-SHADES mosaic filter array |
| Brand | Auniontech |
|---|---|
| Model | TeraCube Scientific |
| Type | THz Near-Field Scanning Microscope |
| Core Technology | Electro-optic Sampling-Based Terahertz Time-Domain Near-Field Imaging |
| Probe Type | TeraSpike THz Microprobe |
| Automation Level | Fully Motorized XYZ + Tip-Sample Distance Control |
| Laser Source Compatibility | Ti:sapphire Oscillator-Amplifier System (800 nm, <100 fs) |
| Detection Method | Lock-in Amplified Electro-optic Sampling |
| Spatial Resolution | Sub-wavelength (≤ λ/10, ~3–5 µm at 0.3–1 THz) |
| Dynamic Range | >60 dB (typical, system-limited) |
| Scan Range | Up to 100 × 100 µm² (high-res mode), 1 × 1 mm² (wide-field mode) |
| Sample Environment | Ambient air or purged N₂ (optional) |
| Compliance | CE Marked |
| Safety Class | Integrated Class 3B Laser Enclosure with Interlock System |
| Data Export | ASCII (.txt), MATLAB (.mat), HDF5 |
| Brand | Auniontech |
|---|---|
| Model | MICRO FOCUS X |
| Target Spot Size | 5–10 µm (power-dependent) |
| Operating Voltage | 20–100 kV |
| Max Power | 15 W |
| Focus-to-Window Distance (FOD) | 7 mm |
| Anode Material | Tungsten (W) / Copper (Cu) |
| Input Power | 24 VDC / 2 A |
| Weight | 4.5 kg |
| Dimensions | 524 × 490.25 × 206.5 mm |
| Window Thickness | 0.254 mm |
| Beam Divergence | 95° conical |
| Cooling | Integrated fan (sufficient for ambient ≤28°C) |
| Operating Temp | +10°C to +40°C |
| HV Ripple (full load) | ≤0.1% p-p |
| Voltage/Current Regulation | ±0.25% |
| Interface | RS-232C |
| OS Compatibility | Windows 7/8.1/10 |
| Window Type | Side-window and end-window configurations available |
| Brand | Princeton Instruments |
|---|---|
| Sensor Type | Back-illuminated or front-illuminated deep-depletion CCD |
| Energy Range | 3–20 keV |
| Window Material | Vacuum-integrated beryllium (Be) |
| Cooling | Thermoelectric (TE) cooling to –70 °C |
| Readout Architecture | Dual-amplifier selectable for low-noise or high-dynamic-range mode |
| Software Support | LightField v8.x, PICAM SDK, LabVIEW® and MATLAB® integration |
| Compliance | ASTM E1316, ISO/IEC 17025-compatible operation, FDA 21 CFR Part 11-ready audit trail (via LightField) |
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