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| Brand | Auniontech |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | AUM-LSV1310 |
| Optical Wavelength | 1310 nm |
| Laser Safety Class | Class I (IEC 60825-1) |
| Output Power | <5 mW |
| Frequency Range | DC to 2.5 MHz |
| Displacement Noise Density | 5 pm/√Hz |
| Displacement Resolution | 1.28 nm |
| Maximum Velocity Range | 4.5 m/s |
| Velocity Resolution | <1 µm/s (at 1 kHz) |
| Displacement Repeatability (>10 Hz) | ±1 nm |
| Displacement Repeatability (<10 Hz) | ±10 nm |
| Vibration Frequency Accuracy | ±0.02% |
| Dynamic Velocity Range | 20 m/s (peak) |
| Sampling Rate | 5 MS/s (real-time digital acquisition) |
| Signal Output | Ethernet (TCP/IP, UDP), Digital TTL sync |
| Power Supply | 12–24 V DC |
| Power Consumption | <4 W |
| Operating Temperature | 0–50 °C |
| Relative Humidity | 35–85% RH (non-condensing) |
| Housing Material | Anodized Aluminum Alloy |
| Dimensions | 83.7 × 50 × 22 mm |
| Weight | 180 g |
| Brand | Auniontech |
|---|---|
| Model | Aut-S500 |
| Operating Temperature Range | -40 to 1000 °C |
| Accuracy | ±0.1 °C (when used with compatible interrogator) |
| Resolution | 0.02 °C |
| Wavelength Range | 1528–1568 nm (±0.1 nm center wavelength tolerance) |
| Thermal Sensitivity | 30–50 pm/°C |
| FWHM | <0.3 nm |
| Side Mode Suppression Ratio (SMSR) | >12 dB |
| Peak Reflectivity | >70% |
| Dimensions | 35 mm × 10 mm × 5.5 mm |
| Connector Type | FC/APC |
| Packaging | Ceramic Hermetic Encapsulation |
| Brand | Auniontech (HaoLiang Optoelectronics) |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | SA248P |
| Application Focus | SS-OCT, LIDAR, Fiber Optic Sensing, Mass Spectrometry, Semiconductor Test |
| Interface | PCIe Gen2 x8 |
| Sampling Rate | 8 GS/s (single channel) |
| Resolution | 14-bit |
| Analog Bandwidth | 2.5 GHz |
| Input Impedance | 50 Ω, DC-coupled |
| Full-Scale Range | 1 V (selectable) |
| Input Offset Range | ±0.5 FSR |
| Onboard Memory | 4 GB or 8 GB |
| Real-Time Processing | FPGA-based hardware averaging (AVG), Clock & Synchronization Trigger (CST) output |
| Software Support | IVI-C, IVI.NET, C/C++, C#, VB.NET, MATLAB, LabVIEW, Linux |
| Compliance | Designed for GLP/GMP-aligned test systems |
| Brand | Auniontech (HaoLiang Optoelectronics) |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model Series | SA108P, SA120P, SA217P, SA220P/SS-OCT, SA230P, SA240P/SS-OCT, SA248P |
| Sampling Rates | 1–8 GS/s |
| Resolution | 8-bit or 14-bit |
| Bandwidth | DC to 2.5 GHz |
| Input Range | 50 mV–5 V (configurable) |
| Onboard Memory | Up to 8 GB |
| Interface | PCIe 3.0 x8 |
| ENOB | 9-bit (8-bit models) |
| SFDR | 70 dBc (flat over analysis bandwidth) |
| Trigger Interpolation Accuracy | 15 ps RMS |
| Clock Jitter | 100 fs |
| Clock Accuracy | ±1 ppm |
| Brand | Auniontech (Distributor) |
|---|---|
| Origin | Shanghai, China |
| Model | Argo-WP Calibration Microplate |
| Application | QC/QA of fluorescence imaging systems (HCS/HTS/HCI) |
| Excitation Range | 350–650 nm |
| Emission Range | ~365–800 nm |
| Substrate | Patented photostable glass with embedded 3D fluorescent patterns |
| Format | 4-well aluminum plate, each well containing one 75 mm × 25 mm × 1.5 mm Argolight glass slide |
| Pattern Stability | Non-bleaching, reusable, traceable to NMIs (e.g., BAM) |
| Compliance Support | IQ/OQ/PQ protocols, ASTM E3085, ISO 17025-aligned validation workflows |
| Software | Argolight Daybook v3.x (FDA 21 CFR Part 11-ready audit trail, open-format export, documented algorithms) |
| Brand | ARGOLIGHT (distributed by Auniontech) |
|---|---|
| Origin | Shanghai, China |
| Product Type | Calibration Slide & Resolution Target |
| Dimensions | 75 × 25 × 6 mm |
| Excitation Wavelength Range | 250–650 nm (CW) |
| Emission Wavelength Range | λₑₓ + 15 nm to 800 nm (broadband) |
| Immersion Compatibility | Dry, Oil, and Water Objectives |
| Recommended Imaging Duration per Session | <20 min |
| Storage Conditions | 10–40 °C, 20–70% RH |
| Damage Threshold | 50 GW/cm² (peak or average irradiance) |
| Optical Power Measurement Range | 10 µW – 100 mW |
| Spectral Coverage for Power Detection | 350–1100 nm |
| Brand | ARGOLIGHT (distributed by Auniontech) |
|---|---|
| Origin | Shanghai, China |
| Product Type | Fluorescence Microscope Calibration Slide & Integrated Power Sensor |
| Dimensions | 75 × 25 × 6 mm |
| Excitation Wavelength Range | 250–650 nm (CW) |
| Emission Wavelength Range | λₑₓ + 15 nm to 800 nm (broadband) |
| Power Measurement Range | 10 µW – 100 mW |
| Measurable Wavelength Range | 350–1100 nm |
| Immersion Compatibility | Dry, oil, and water immersion objectives |
| Recommended Imaging Duration per Session | < 20 min |
| Storage Conditions | 10–40 °C, 20–70 % RH |
| Damage Threshold | 50 GW/cm² (peak or average irradiance) |
| Pattern Stability | Photostable, non-bleaching embedded 2D/3D fluorescent nanostructures |
| Brand | Argolight |
|---|---|
| Model | Argo-SIM Slide V2 |
| Substrate | AG03 Glass Core in Anodized Aluminum Housing |
| Dimensions | 75 × 25 × 1.5 mm |
| Fluorescence Stability | Lifetime (Non-photobleaching) |
| Excitation Range | 250–650 nm (Continuous) |
| Emission Range | λₑₓ + 15 nm to 800 nm (Continuous) |
| Immersion Compatibility | Dry, Oil (Unrestricted), Water |
| Objective Exposure Limit | <20 min per objective |
| Storage Conditions | 10–40 °C, 20–70 % RH |
| Laser Damage Threshold | 50 GW/cm² (Peak or Average Irradiance) |
| Pattern Count per Slide | 27 Distinct Fluorescent Microstructures |
| Imaging Compatibility | All Fluorescence-Based Modalities Except STED and Multiphoton |
| Software | Argolight Daybook (Proprietary Image Analysis & QC Database Platform) |
| Brand | Argolight |
|---|---|
| Origin | France |
| Model | Argo-LM Slide V2 |
| Substrate | AG03 borosilicate glass core in anodized aluminum carrier |
| Dimensions | 75 × 25 × 1.5 mm |
| Excitation Range | 250–650 nm (continuous) |
| Emission Range | λₑₓ + 15 nm to 800 nm (continuous) |
| Immersion Compatibility | Dry, oil (unrestricted), water |
| Objective Compatibility | ≤20× magnification |
| Photostability | Non-bleaching, lifetime-stable fluorescence patterns |
| Laser Damage Threshold | 50 GW/cm² (peak or average irradiance) |
| Pattern Precision | <10 µm in all three dimensions |
| Compliance | Aligns with ISO 21073:2019 (“Fluorescence confocal microscopes for biological imaging — Optical data”) and supports GLP/GMP-aligned quality documentation workflows |
| Brand | Julight |
|---|---|
| Model | SP-LV-1000 |
| Laser Source | Semiconductor Diode |
| Interferometry Principle | Self-Mixing Interferometry (SMI) |
| Measurement Axis | Normal-to-surface displacement/velocity |
| Operating Distance | 0.1–5 m (customizable up to 50 m) |
| Scan Angle Range | ±25° × ±25° |
| Max Scan Points | 1024 × 1024 per frame |
| Scan Speed | 0.5–50 pts/s |
| Frequency Range | DC–50 kHz (standard) |
| Signal Output | Analog voltage proportional to displacement or velocity |
| Data Acquisition Resolution | Up to 25,600 spectral lines |
| Surface Compatibility | Diffuse, rough, unpolished metals, plastics, rubber, wood, composites |
| Integrated Imaging | 96× real-time color zoom (24× optical + 4× digital), auto-focus, on-screen point selection |
| Software Features | Automated grid generation, programmable scanning, modal analysis, FRF quality assessment, time/frequency domain recording, 3D animation & visualization |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Argolight |
|---|---|
| Origin | France |
| Manufacturer | Argolight SAS |
| Model | Argo-HM Slide V2 |
| Substrate | AG03 ultra-pure fused silica core |
| Dimensions | 75 × 25 × 1.5 mm |
| Pattern Count | 16 embedded 3D fluorescent structures per slide |
| Excitation Range | 250–650 nm (continuous) |
| Emission Range | λₑₓ + 15 nm to 800 nm (continuous) |
| Photostability | Non-bleaching, lifetime-stable fluorescence |
| Damage Threshold | 50 GW/cm² (peak or average irradiance) |
| Immersion Compatibility | Dry, oil, water (no restrictions) |
| Objective Compatibility | All objectives ≤ 100× |
| Storage Conditions | 10–40 °C, 20–70 % RH |
| Imaging Modality Compatibility | Widefield, confocal, spinning disk, light-sheet, TIRF — excluding STED, RESOLFT, and multiphoton modalities |
| Traceability | Certified reference standard aligned with ISO/IEC 17025-accredited metrology labs (e.g., BAM) and ISO 21073:2019 |
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