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| Brand | NanoMEGAS |
|---|---|
| Origin | Imported (Non-China) |
| Manufacturer Type | Authorized Distributor |
| Model | DigiSTAR |
| Pricing | Upon Request |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Model | Quantum C100 |
| Frame Rate | 2000 fps (continuous) |
| Pixel Array | 2048 × 2048 |
| Readout | Fiber-optic coupled direct electron detection |
| Interface | GUI-controlled, open-format data export (TIFF, MRC, HDF5) |
| Compatibility | Optimized for 100 keV transmission electron microscopes |
| Regulatory Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MERLIN T4 |
| Pricing | Upon Request |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | ADT-3D |
| Compatible TEM Voltage | 120–300 kV |
| Compatible Sources | LaB6, W, FEG |
| Minimum Crystal Size (Organic) | ~100 nm |
| Minimum Crystal Size (Inorganic) | ~20 nm |
| Tilt Range (Cell Parameter Determination) | −15° to +15°, 1° step |
| Recommended Tilt Range (Structure Solution) | −45° to +45°, 1° step or continuous rotation (MicroED) |
| Data Acquisition Modes | Manual or automated PED |
| Detector Compatibility | CCD cameras ≥1k × 1k resolution |
| Sample Holder Support | Single-tilt, tomography, cryo holders |
| Output | 3D reciprocal space reconstruction, unit cell parameters (2–5% error), space group assignment, integrated 3D reflection intensities |
| Compliance | Fully compatible with standard TEM workflows under GLP-aligned data handling practices |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Model | MerlinEELS |
| Detector Architecture | Hybrid Pixel (4 × Medipix3 RX chips) |
| Format | 1024 × 256 pixels |
| Frame Rate | up to 3600 fps (6-bit mode, full frame) |
| Dynamic Range | >16 million counts per pixel |
| Readout Noise | 0 e⁻ rms |
| Dead Time | 0 ns (dual counter per pixel) |
| Pixel Size | 55 µm |
| Energy Thresholding | User-configurable single-electron discrimination |
| ROI Modes | 4–128 rows selectable (N × 256 px) |
| Integration | TEM-compatible with dedicated scan generator and multi-signal synchronization |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MerlinEM |
| Pricing | Available Upon Request |
| Detector Material | 500 µm thick silicon |
| Detector Type | Reverse-biased hybrid silicon diode array |
| Pixel Size | 55 × 55 µm |
| Active Area | 1R (single chip): 14 × 14 mm² |
| 4R/4S (quad-chip) | 28 × 28 mm² |
| Pixel Count | 1R: 256 × 256 |
| 4R/4S | 512 × 512 |
| Readout Noise | Effectively 0 e⁻ (threshold-based discrimination) |
| Signal-to-Noise Ratio (SNR) | 107:1 |
| Detective Quantum Efficiency (DQE) at 60 keV | 1.0 (zero frequency), 0.45 (Nyquist frequency) |
| Modulation Transfer Function (MTF) at 60 keV | >0.62 at Nyquist frequency (mode-dependent) |
| Frame Rate (full-frame, continuous) | 18,800 fps (1-bit), 3,600 fps (6-bit), 1,800 fps (12-bit), 800 fps (24-bit) |
| Region-of-Interest (ROI) readout | up to 7,200 fps (128 × 256, 6-bit), 14,400 fps (64 × 256, 6-bit) |
| Inter-frame gap time | 0 µs |
| Dynamic Range | Up to 24-bit per pixel (16,777,216 counts/pixel) |
| Trigger Interface | 3.3 V / 5 V TTL pulse or software-controlled via TCP/IP |
| Energy Range | 30–300 keV |
| Software Suite | 4D STEM acquisition platform, LabVIEW drivers, GM3 integration interface, native TCP/IP communication |
| Mounting Options | Side-insertion retractable or bottom-fixed configuration |
| Optional Integration | NanoMEGAS precession electron diffraction (PED) interface |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CheeTah T3 EELS |
| Pricing | Available Upon Request |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | TOPSPIN |
| Application | Precession Electron Diffraction (PED)–Enabled 4D-STEM Acquisition |
| Integration | DigiSTAR Beam Control & Direct Electron Detection |
| Compliance | TEM/STEM-Compatible with ASTAR & STRAIN Software Ecosystem |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | TopSPIN STRAIN |
| Application | Automated High-Resolution Strain Mapping in Scanning Transmission Electron Microscopy (STEM) using 4D Scanning Precession Electron Diffraction (4D-SPED) |
| Spatial Resolution | 2–3 nm (FEG-TEM) |
| Strain Sensitivity | < 2 × 10⁻⁴ |
| Typical Acquisition Time | 5–10 min (150 × 150 pixels) |
| Pixel Dwell Time | 10–40 ms |
| Strain Quantification Accuracy | ±0.02% (at 200 kV FEG-TEM) |
| Analysis Engine | AppFive proprietary algorithm |
| Output Modalities | Point, line, and 2D strain tensor maps (εₓₓ, ε_zz, ε_xz), orientation/phase/strain/STEM co-registration |
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