Transmission Electron Microscope
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| Brand | Cameca |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EIKOS |
| Price Range | USD 3.2–3.8 million (FOB) |
| Acceleration Voltage | Not Applicable (Field Evaporation-Based Operation) |
| Magnification | Not Defined (Atom-by-Atom Reconstruction, Not Optical Imaging) |
| Brand | Cameca |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LEAP 5000 |
| Price Range | USD 6.2–6.9 million (FOB) |
| Acceleration Voltage | Up to 20 kV |
| Magnification | Field-ion imaging resolution < 0.3 nm, atomic-scale 3D reconstruction |
| Detection Efficiency | > 37% (pulse mode), > 60% (laser mode) |
| Mass Resolution (m/Δm) | > 1,000 at 100 Da |
| Spatial Resolution | ≤ 0.3 nm lateral, ≤ 0.2 nm depth (in optimal conditions) |
| Data Acquisition Rate | Up to 1 million atoms/hour |
| Brand | Kimball Physics |
|---|---|
| Base Compatibility | Zeiss, JEOL (JSM/GC/E), Hitachi S, Philips, Leica-AEI, PerkinElmer/ETEC, Camscan-AEI, Cameca-AEI, BioRad-AEI, Amray, VG-AEI |
| Cathode Materials | LaB₆ (single-crystal), CeB₆, Ta (tantalum disc), BaO-coated disc (low-temperature operation), Y₂O₃-coated Ir (poor-vacuum tolerant) |
| Base Types | Standard AEI ceramic, Compact CB-104 (Kimball Physics), Kovar/molybdenum pin variants, customer-supplied mount interface |
| Microflat Configurations | 60°–90° cone angles |
| microflat diameters | 6 µm, 15 µm, 20 µm (e.g., Code 60-06, 90-15, 90-20) |
| Richardson Constant | LaB₆ = 29 A·m⁻²·K⁻², CeB₆ = 3.6 A·m⁻²·K⁻² |
| Operating Vacuum | 1×10⁻⁶ Pa to 1×10⁻⁴ Pa (material-dependent) |
| Lifetime | >1,500 h (LaB₆, typical in UHV SEM/TEM conditions) |
| Certification | RoHS-compliant materials |
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Model | LVEM25 |
| Acceleration Voltages | 10, 15, 25 kV |
| Magnification Range | 1,000× – 470,000× |
| Spatial Resolution | 1 nm |
| Imaging Modes | TEM, SEM, Electron Diffraction (ED) |
| Vacuum System | Ion Pumps at Gun & Specimen Chambers |
| Electron Source | Schottky Field Emission Gun |
| Footprint | Benchtop |
| Power Requirements | Standard 120/240 V AC, No Chilled Water or Cryogens Required |
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Model | LVEM 25E |
| Acceleration Voltages | 10 kV, 15 kV, 25 kV |
| Imaging Modes | TEM, STEM, SEM (BSE), EDS, Electron Diffraction (ED) |
| Resolution | ≤1.0 nm |
| Footprint | Compact, Single-Phase Power Only |
| Compliance | Designed for GLP-compliant labs |
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Acceleration Voltages | 5, 10, 15, 25 kV |
| Maximum Magnification | ~1,300,000× |
| TEM Resolution (LVEM 5) | 1.5 nm |
| TEM Resolution (LVEM 25 / LVEM 25E) | 1.0 nm |
| Electron Source | Schottky Field-Emission Gun |
| Operating Modes | TEM, STEM, SEM, ED, EDS, Dark-Field TEM/STEM |
| Sample Exchange Time | ≤3 min |
| Cooling Water Required | No |
| Compressed Air Required | No |
| Brand | Delong Instruments |
|---|---|
| Origin | USA |
| Model | LVEM5 |
| Accelerating Voltage | 5 kV |
| Maximum Magnification | 700,000× |
| TEM Resolution | 1.5 nm (with TEM upgrade option) |
| SEM Resolution | 10 nm |
| STEM & ED Capabilities | Integrated |
| Sample Chamber | Ambient-pressure compatible, no external cooling required |
| Dimensions | Compact benchtop footprint (~1/10 volume of conventional TEM) |
| Electron Source | Inverted Schottky field-emission gun (FEG), >2000 h lifetime |
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Model | LVEM5 (Biological) |
| Accelerating Voltage | 5 kV |
| Maximum Magnification | 700,000× |
| Resolution (unstained biological samples) | 1.5 nm |
| Imaging Modes | TEM, SEM, STEM |
| Vacuum Pump-Down Time | ≤3 min |
| Footprint | <1 m² |
| Operating Environment | Standard laboratory (no external cooling, no high-vacuum infrastructure required) |
| Origin | Canada |
|---|---|
| Supplier Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | 249 |
| Pricing | Available Upon Request |
| Scan Range (Measurement Head) | 80 × 80 × 3.5 µm (±10%) |
| Minimum Step Size | 0.009 nm |
| XY Sample Stage Travel | 5 × 5 mm |
| Stage Positioning Accuracy | 5 µm |
| Maximum Sample Diameter/Thickness | Φ100 × 10 mm |
| Closed-Loop XY Piezo Platform Range | 100 × 100 µm |
| Inherent Nonlinearity | <0.2% |
| Positional Accuracy | 2 nm |
| Repeatability | 30 nm (typical), <0.2% of full scale |
| Maximum Load Capacity | 2 kg |
| Laser Pulse Duration | <50 fs |
| Average Output Power | >100 mW |
| Repetition Rate | >80 MHz |
| Tunable Wavelength Range | 740–950 nm |
| Optional Laser Modules | Trestles 20/50/100 (700–950 nm), Mavericks65 (1240–1270 nm), Tamarak-Er (1540–1560 nm) |
| Brand | Halcyonics |
|---|---|
| Origin | Germany |
| Model | Vario Series |
| Application | TEM |
| Type | Active Vibration Isolation System |
| Compliance | Designed for Ultra-High-Resolution TEM Imaging |
| Certification | CE Marked, ISO 9001–Certified Manufacturing |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | HF5000 |
| Accelerating Voltage | Up to 200 kV |
| Magnification | TEM (×200–×4,000,000), STEM (×20–×4,000,000) |
| HAADF-STEM Resolution | 0.78 Å |
| EDS Solid Angle | Up to 2.0 sr (dual-windowless silicon drift detectors) |
| Imaging Modes | TEM, STEM, SEM, Selected-Area Electron Diffraction (SAED), Convergent-Beam Electron Diffraction (CBED) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | HT7800 Series |
| Accelerating Voltage | 20–120 kV |
| Magnification Range | ×200–×200,000 (High Contrast Mode) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported TEM |
| Model | HT7800II |
| Accelerating Voltage | 20–120 kV |
| Magnification | ×200–×200,000 (High-Contrast Mode) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | CRYO ARM™ 200 II (JEM-Z200CA) |
| Acceleration Voltage | 200 kV |
| Magnification Range | ×100 to ×1,000,000 |
| Spherical Aberration Coefficient (Cs) | 1.5 mm |
| Chromatic Aberration Coefficient (Cc) | 1.8 mm |
| Specimen Temperature | ≤100 K |
| Sample Storage Capacity | Up to 12 cryo-samples |
| Energy Filter | Integrated Omega-type Energy Filter |
| Optional Software | JEOL Automated Data Acquisition System (JADAS) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JEM-3300 |
| Price Range | USD 6.2–6.9 million (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 2,000× – 1,000,000× |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Energy Filter | Integrated Omega-Type Electron Energy Filter |
| Automation | Automated Sample Loading System, JADAS Software Suite, Phase Plate Compatibility, Köhler Illumination Optics |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-120i |
| Acceleration Voltage | Up to 120 kV |
| Magnification Range | 50× – 1,200,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2100Plus |
| Acceleration Voltages | 80, 100, 120, 160, 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | 0.19 nm |
| Line Resolution | 0.14 nm |
| Minimum Probe Size | 0.5 nm |
| Tilt Range | ±25° |
| Condenser System | Three-Stage Lens Design |
| Pole Piece Options | UHR, HR, HT, HC, CRYO |
| Operating System | 64-bit Windows-based Control Interface |
| Integrated Detectors | STEM, EDS, CCD, EELS |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ACE200F |
| Price | USD $3,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Maximum Magnification | 2,000,000× |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.136 nm |
| Information Limit | 0.11 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-ARM200F(C)-NEO ARM |
| Acceleration Voltages | 30 kV, 80 kV, 200 kV |
| Magnification Range | 50× to 2,000,000× |
| Point Resolution | 0.078 nm (at 200 kV) |
| Energy Resolution | ≤0.3 eV (with monochromated cold FEG) |
| Configuration | Dual spherical aberration correctors (objective and condenser), integrated STEM/TEM/EELS/EDS platform |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ARM300F2 |
| Price | USD 6.8M (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 100×–2,000,000× |
| Guaranteed HAADF-STEM Resolution | 53 pm (300 kV, with ETA corrector + FHP2 polepiece) |
| EDS Detector | Dual large-area SDD (158 mm² total active area) |
| Solid Angle for EDS | 2.2 sr (with WGP polepiece) |
| Cs Corrector | JEOL 12-Pole Monochromator-Based Spherical Aberration (Cs) Corrector |
| Software | COSMO™ Auto-Aberration Correction Suite |
| Gun Type | Next-Generation Cold Field-Emission Gun (Cold-FEG) |
| Environmental Shielding | Integrated Active Vibration & Acoustic Damping Enclosure |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-F200 |
| Price | USD $2,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Magnification Range | 50× – 2,000,000× |
| Brand | JEOL (Japan Electron Optics Laboratory) |
|---|---|
| Origin | Japan |
| Model | JXA-iHP100 |
| Acceleration Voltage | 0–30 kV (0.1 kV step) |
| Beam Current Range | 10⁻¹² – 10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h (W) |
| Secondary Electron Resolution | 6 nm (W), 5 nm (LaB₆) at WD = 11 mm, 30 kV |
| Scan Magnification | ×40 – ×300,000 (WD = 11 mm) |
| Max. Image Resolution | 5,120 × 3,840 pixels |
| Display | Dual LCDs (1,280 × 1,024 each) for EPMA and SEM/EDS operation |
| Optical Microscope Resolution | ~1 µm |
| Depth of Field | ~1 µm |
| Vacuum System | Mechanical pump + turbomolecular pump + ion pump |
| Chamber Vacuum | <8.0 × 10⁻⁴ Pa |
| Gun Vacuum | <9.0 × 10⁻⁵ Pa |
| Elemental Detection Range | WDS: Be (optional) to U |
| EDS | B to U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometer Channels | 1–5 (configurable) |
| EDS Detector | One SDD (Silicon Drift Detector), fanless option available |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| Brand | SHNTI (Shanghai NTI Instruments) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | TEM-SN |
| Accelerating Voltage Compatibility | Up to 300 kV (compatible with standard TEMs operating at 70–300 kV) |
| Magnification Range | Optimized for high-resolution imaging ≥100× |
| Frame Dimensions | 3 mm × 3 mm |
| Window Aperture | 0.5 mm or 1.0 mm (square) |
| Si₃N₄ Membrane Thickness | 50 nm or 100 nm (customizable from 30–200 nm, MOQ 100 pcs) |
| Frame Thickness | 200 µm or 381 µm |
| Surface Roughness | 0.6–2 nm RMS |
| Thermal Stability | Stable up to 1000 °C in inert/vacuum environments |
| Chemical Resistance | Inert to most acids, bases, and organic solvents (except hot phosphoric acid and strong alkalis) |
| Hydrophobicity | Native hydrophobic surface |
| Cleaning Method | Compatible with O₂ plasma, Ar/O₂ glow discharge, and chemical etching (e.g., Piranha: H₂SO₄:H₂O₂ = 1:1 |
| RCA1 | H₂O:HCl:H₂O₂ = 5:3:3) |
| Brand | Thermo Fisher Scientific |
|---|---|
| Model | Iliad |
| Type | Spherical Aberration-Corrected Scanning/Transmission Electron Microscope (S/TEM) |
| Integrated Spectroscopy | Dual-mode EELS (including XEELS™ up to 30 keV) and Energy-Filtered Imaging |
| Detectors | Zebra EELS Detector, NanoPulser Electrostatic Beam Blanking (1 MHz, ≤10 ns pulse width), Optional Dual-X/Super-X/Ultra-X EDX |
| Software | Velox™ (S/TEM, EDX, EELS acquisition & analysis), Autoscript™ TEM (Python-based automation, AI-integrated workflow control) |
| Compliance | Designed for GLP/GMP-aligned labs |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Talos F200X |
| Price Range | USD 2.1–2.8 million (FOB) |
| Accelerating Voltage | 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | ≤0.12 nm (TEM), ≤0.16 nm (STEM) |
| EDS Detector | Super-X G3 with 4 silicon drift detectors |
| Camera | Ceta 16M CMOS, 16-megapixel, 4k × 4k, 25 fps at full resolution |
| Stage | Piezo-driven high-precision motorized stage with sub-nanometer stability |
| Optional In Situ Capabilities | Heating, cooling, electrical biasing, and gas/liquid environmental holders |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Imported (Netherlands/USA manufacturing site) |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | Talos L120C TEM |
| Price Range | USD 1.9–2.5 million (FOB) |
| Accelerating Voltage | 120 kV |
| Camera System | 4k × 4k Ceta CMOS (16 MP), optional SmartCam™ digital search/overview camera |
| Vacuum System | Fully automated dual-stage turbomolecular pumping with rapid lock recovery (<60 s after air exposure) |
| Automation | Auto-gun alignment, auto-focus, auto-stigmator, EPU-integrated cryo-TEM workflow |
| Software Platform | Thermo Scientific TEM Imaging & Analysis (TIA) v5.x with GLP-compliant audit trail and 21 CFR Part 11-ready user management |
| Brand | Thermo Fisher |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Spectra S/TEM |
| Price Range | USD 4.2–4.9 million (approx.) |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Imported (Netherlands/USA manufacturing site) |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | Talos F200C TEM |
| Accelerating Voltage Range | 20–200 kV |
| Detector | Integrated 1600 × 1600 CMOS Direct Detection Camera |
| Lens Configuration | Constant-Power C-Twin Objective Lens |
| Optional Stage | Piezo-Driven High-Stability Specimen Stage |
| Compliance | Designed for GLP/GMP-compliant labs |
| Brand | Thermo Fisher |
|---|---|
| Origin | Czech Republic |
| Model | Talos F200i S/TEM |
| Accelerating Voltage | 20–200 kV |
| TEM Line Resolution | ≤0.10 nm |
| TEM Information Resolution | ≤0.12 nm |
| STEM Resolution | ≤0.16 nm |
| LACBED Convergence Angle | ≥100 mrad |
| Diffraction Angle | up to 24° |
| EDS Configuration | Side-mounted, retractable |
| Electron Source | High-brightness field emission gun (FEG) |
| Specimen Stage Z-Travel (standard holder) | ±0.375 mm |
| Tilt Range (3D tomography holder) | ±90° |
| Specimen Drift | ≤0.5 nm/min |
| Camera | 4k × 4k Ceta 16M CMOS |
| Brand | Thermo Fisher |
|---|---|
| Origin | Czech Republic |
| Model | Talos F200S G2 S/TEM |
| Accelerating Voltage | 200 kV |
| TEM Information Resolution | 0.12 nm |
| STEM HAADF Resolution | 0.16 nm |
| Probe Current | 0.6 nA @ 1 nm (200 kV) |
| Total FEG Beam Current | >150 nA |
| EDS System | Dual SDD, windowless design, shutter-protected |
| Energy Resolution | ≤136 eV (Mn-Kα, 10 kcps output) |
| EDS Pixel Dwell Time | down to 10 µs |
| Maximum Diffraction Angle | 24° |
| Double-Tilt Holder | ±35° α / ±30° β |
| Specimen Stage Tilt Range | ±90° |
| Ceta 16M CMOS Camera | 25 fps @ 512×512 |