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Beijing Ingerheid Analytical Technology Co., Ltd.

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BrandHiden
OriginUnited Kingdom
ModelXEMIS
Instrument TypeSpecific Surface Area and Pore Size Analyzer
Number of Analysis Stations1
Pore Size Measurement Range< 50 nm
Temperature Range77 K to 773 K (–196 °C to 500 °C)
Pressure RangeUp to 200 bar
Analysis TheoryBJH, Langmuir, DFT, t-plot, α<sub>s</sub>-method
Balance Capacity5 g
Balance Resolution0.2 µg
Long-term Stability±5 µg
Dynamic Weighing Range0–200 mg
ConstructionAll-metal VCR-fitted architecture
ComplianceDesigned for GLP/GMP environments with audit-trail-capable software
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