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| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Science Corporation |
| Product Type | Atomic Force Microscope (AFM) Controller |
| Model | AFM5000II / RealTune®II |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Software Architecture | Windows-based real-time control platform with audit trail capability |
| Control Resolution | Sub-nanometer positioning accuracy |
| Vibration Noise Floor | < 0.1 nm RMS (in closed-loop mode) |
| Sample Stage Travel Range | X/Y: ±25 µm, Z: ±5 µm |
| GUI Framework | Qt-based modular interface with tabbed workflow navigation |
| 3D Rendering Engine | OpenGL-accelerated volumetric reconstruction |
| Data Format | HDF5-compliant binary + metadata-rich XML header |
| Regulatory Alignment | Supports FDA 21 CFR Part 11 electronic signature and ALCOA+ data integrity principles |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | AFM5500M II |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | ≤ 0.04 nm (High-Resolution Mode) |
| Sample Diameter | ≤ 100 mm |
| Sample Thickness | ≤ 20 mm |
| XY Stage Travel Range | 100 mm × 100 mm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Atomic Force Microscope (AFM) |
| Model | AFM100 |
| Instrument Category | Materials-Grade AFM |
| Position Detection Noise | 0.03 nm |
| Maximum Sample Diameter | ≤35 mm |
| Maximum Sample Thickness | ≤10 mm |
| Sample Stage Travel Range | 5 mm |
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