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| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Excitation Source | Xenon Arc Lamp |
| Monochromator Type | Dual Grating |
| Slit Width Range | 1–20 nm |
| Typical S/N Ratio (Water Raman, 350 nm ex/397 nm em) | ≥450:1 |
| Detection Limit (Fluorescein in Aqueous Solution) | ≤1 × 10⁻¹² mol/L |
| Lamp Lifetime | ≥2,000 hours |
| Scan Speed | Up to 60,000 nm/min |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Architecture | Dual-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ±0.1 nm |
| Spectral Bandwidth | 1.5 nm |
| Wavelength Scanning Mode | Motorized Auto-Scanning |
| Compliance | ISO/IEC 17025-compatible optical validation protocols, ASTM E275 and E387 spectral performance standards |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | U-5100 |
| Optical System | Ratio-Beam Double-Beam |
| Detector | Photodiode Array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±1 nm |
| Spectral Bandwidth | 5 nm |
| Wavelength Scanning Speed | 12,000 nm/min |
| Standard Sample Holder | Automatic 6-Cell Carousel (10 mm square cuvettes) |
| Light Source | Pulsed Xenon Lamp |
| Display | Backlit LED, 320 × 240 dots |
| Dimensions (W×D×H) | 355 × 425 × 235 mm |
| Weight | 13 kg |
| Power Supply | 100–240 V, 50/60 Hz, 60 VA |
| Brand | Hitachi |
|---|---|
| Origin | Imported |
| Manufacturer Type | Manufacturer |
| Model | UH4150AD+ |
| Optical Design | Double-beam |
| Detector | Photomultiplier Tube (PMT) for UV-Vis |
| Wavelength Range | 175–2000 nm |
| Wavelength Accuracy | ±0.2 nm (UV-Vis), ±1.0 nm (NIR) |
| Wavelength Repeatability | ±0.1 nm (UV-Vis) |
| Spectral Bandwidth | UV-Vis: auto-adjustable up to 14.4 nm, manually selectable from 0.01–8 nm |
| NIR | auto-adjustable up to 36 nm, manually selectable from 0.1–20 nm |
| Stray Light | ≤0.00005% at 220 nm (NaI), ≤0.00004% at 370 nm (NaNO₂) |
| Photometric Range | 8 Abs (UV-Vis), 7 Abs (NIR) |
| Data Mode | Optical Density (O.D.) |
| Multi-scan Capability | Wavelength-range-dependent scan speed & neutral density filter selection |
| Resolution Modes | Four-step high-resolution processing (High/Medium/Standard/Low) |
| ND Filter Wheel | Automatic insertion of five calibrated neutral density filters |
| Detector Calibration | Full 0%T baseline acquisition across measurement range |
| High-Absorbance Calibration | Dual-mode correction (negative transmittance compensation & offset adjustment) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Excitation Source | Xenon Arc Lamp |
| Monochromator | Holographic Grating |
| Slit Width (Spectral Bandpass) | 1–20 nm |
| Wavelength Scanning Speed | Up to 60,000 nm/min |
| Typical Detection Limit (Fluorescein) | 1 × 10⁻¹³ mol/L |
| Lamp Lifetime | ≥2,500 hours |
| Software Platform | FL Solutions v3.x (with ASTM E2899-compliant audit trail, USP <1058> validated operation mode) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | UH4150 |
| Optical Design | Double-Beam |
| Detector Type | Photomultiplier Tube (PMT) for UV-Vis |
| Wavelength Range | 175–3300 nm |
| Wavelength Accuracy | ±0.1 nm (UV-Vis) |
| Spectral Bandwidth | UV-Vis: Auto-adjustable up to 14.4 nm |
| NIR | Auto-adjustable up to 36 nm |
| Stray Light | ≤0.00008% at 220 nm (NaI) |
| Scan Speed | Up to 1200 nm/min (1 nm data interval) |
| Beam Geometry | Collimated Parallel Beam |
| Detector Switching | Seamless dual-detector transition with minimized absorbance discontinuity |
| Integrating Sphere Options | Multiple 60 mm spheres (BaSO₄ or Spectralon® coating), optional 150 mm sphere and goniometric absolute reflectance accessory |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Architecture | Dual-beam |
| Detector Type | Photomultiplier Tube (PMT) |
| Wavelength Range | 190–2600 nm |
| Wavelength Accuracy | ±0.1 nm |
| Spectral Bandwidth | 0.1 / 0.5 / 1 / 2 / 4 / 5 nm |
| Automation Level | Motorized Wavelength Scanning |
| Monochromator Configuration | UH3900S — Single Monochromator |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Instrument Type | Dual-beam |
| Detector | Photomultiplier Tube (PMT) |
| Wavelength Range | 190–3300 nm |
| Wavelength Accuracy | ±0.05 nm (UV-Vis), ±0.2 nm (NIR) |
| Spectral Bandwidth | UV-Vis: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm |
| NIR | 0.25, 0.5 nm |
| Wavelength Scanning Mode | Automatic |
| Slit Control | Motorized continuous variable slit |
| Optical System | Etched holographic diffraction grating, high-flux monochromator |
| Software | UV Solutions Plus with customizable reporting, data table view, instrument performance verification module |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Instrument Type | Flame and Graphite Furnace AAS |
| Optical System | Dual-Beam |
| Monochromator | Custom High-Resolution Grating (Motor-Driven for ZA4800) |
| Detector | Photomultiplier Tube (Dual-Detector Configuration) |
| Background Correction | Polarized Zeeman Correction (Full-Wavelength, Real-Time) |
| Baseline Stability | ≤ 0.0004 Abs / 30 min |
| Element Simultaneity | Up to 12 Elements in Sequential Mode (ZA4800) |
| Compliance | ASTM E1756, ISO 8289, USP <731>, FDA 21 CFR Part 11 (Audit Trail & Electronic Signature Ready), GLP/GMP-Ready Software Architecture |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Architecture | Dual-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 1.5 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ±0.1 nm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Manufacturer |
| Product Category | Imported Instrument |
| Model | EEM View |
| Pricing | Upon Request |
| Dispersive Element | Grating |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Slit Width (Spectral Bandpass) | 1–20 nm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Configuration | Dual-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Spectral Bandwidth | 1 nm |
| Automation Level | Automatic Wavelength Scanning |
| Standard Sample Changer | Integrated 6-Position Auto-Cuvette Holder |
| Light Source | Long-Life Pulsed Xenon Lamp (7-Year Limited Warranty, Subject to Usage Conditions) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | 3D SpectAlyze |
| Dispersion Element | Grating |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Software Functionality | Multivariate Curve Resolution (MCR), PARAFAC, PCA, Cluster Analysis, Discriminant Analysis, Spectral Deconvolution, ROI Masking, Stray Light Correction, Export to PNG/JPG/PDF |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Excitation Source | Xenon Arc Lamp |
| Monochromator | Grating-Based |
| Slit Width (Spectral Bandpass) | 2.5–20 nm |
| Sensitivity (S/N Ratio, RMS) | ≥1000:1 |
| Lamp Lifetime | 2500 h |
| Dynamic Range | ~6 decades |
| Accessories | >30 optional modules including solid-sample holders, temperature-controlled cuvette holders, polarization kits, and quantum yield accessories |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Wavelength Scanning Speed | Up to 60,000 nm/min |
| Slit Width (Spectral Bandpass) | 1–20 nm |
| Excitation Source | Xenon Arc Lamp |
| Monochromator Type | Dual Grating |
| Detection Mode | Photon Counting with PMT |
| Dimensions & Weight | Approx. 2/3 volume and 30% less mass vs. F-4500 model |
| Software Compliance | FDA 21 CFR Part 11 (Audit Trail, Electronic Signature, User Access Control) |
| Linear Dynamic Range | 6 decades for calibration curve generation |
| Phosphorescence Measurement Capability | Extended time-gated detection up to seconds scale |
| Optional Module Support | Report Generator, Temperature-Controlled Cell Holder, Polarization Accessories, Microvolume Adapters |
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