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| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | HT7800 Series |
| Accelerating Voltage | 20–120 kV |
| Magnification Range | ×200–×200,000 (High Contrast Mode) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Instrument |
| Model | NX5000 |
| Pricing | Available Upon Request |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Equipment |
| Model | ArBlade5000 |
| Price Range | USD 135,000 – 270,000 (FOB Japan) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | SU3900/SU3800 SE Series |
| Instrument Type | Floor-Standing Conventional SEM |
| Electron Source | Thermal Field-Emission Gun |
| Secondary Electron Resolution | 0.9 nm @ 30 kV, 2.5 nm @ 1 kV, 1.6 nm @ 1 kV (Deceleration Mode) |
| Magnification Range | ×5 to ×600,000 (Film Equivalent) |
| Accelerating Voltage | 0.5 kV to 30 kV |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Instrument |
| Model | NX9000 |
| Pricing | Available Upon Request |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AMICS Automated Mineralogy System (MLA) |
| Price | USD 210,000 (FOB Hamburg) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Science Corporation |
| Product Type | Atomic Force Microscope (AFM) Controller |
| Model | AFM5000II / RealTune®II |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Software Architecture | Windows-based real-time control platform with audit trail capability |
| Control Resolution | Sub-nanometer positioning accuracy |
| Vibration Noise Floor | < 0.1 nm RMS (in closed-loop mode) |
| Sample Stage Travel Range | X/Y: ±25 µm, Z: ±5 µm |
| GUI Framework | Qt-based modular interface with tabbed workflow navigation |
| 3D Rendering Engine | OpenGL-accelerated volumetric reconstruction |
| Data Format | HDF5-compliant binary + metadata-rich XML header |
| Regulatory Alignment | Supports FDA 21 CFR Part 11 electronic signature and ALCOA+ data integrity principles |
| Brand | SUNYOU |
|---|---|
| Origin | Japan |
| Model | ZONESEM II |
| Cleaning Principle | UV-Ozone Oxidation |
| Vacuum System | Oil-Free Diaphragm Pump (9 L/min) |
| Pump-Down Time | ≤3 min to Target Vacuum |
| Operating Vacuum Range | 100–500 torr (100-step adjustable) |
| Cleaning Chamber Dimensions | Ø100 mm × H36 mm |
| Cleaning Modes | Vacuum UV-Ozone Cleaning & Vacuum Storage Mode |
| Cleaning Duration | 1–1440 min (1-min increments) |
| Effective Cleaning Area | Ø100 mm |
| Compliance | Designed for SEM sample preparation per ISO 14644-1 Class 5 cleanroom-compatible workflows |
| Brand | SUNYOU |
|---|---|
| Origin | Japan |
| Model | ZONETEM II |
| Cleaning Principle | Vacuum-Enhanced 185/254 nm UV-Ozone Oxidation |
| Vacuum Range | 100–500 Torr (100-step adjustable) |
| Pump Type | Oil-Free Dry Scroll Vacuum Pump (3.8 L/min) |
| Pump-Down Time | ≤3 min to operational vacuum |
| Cleaning Duration | 1–30 min (1-min increments) |
| Sample Holder Compatibility | 3-hole or 5-hole TEM specimen holders |
| Effective Cleaning Area | Ø3 mm per position |
| Regulatory Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Floor-Standing SEM |
| Electron Source | Cold Field-Emission Gun (CFEG) |
| Resolution | 0.6 nm @ 1 kV, 0.4 nm @ 30 kV (Secondary Electron Imaging) |
| Magnification Range | 80× to 3,000,000× |
| Accelerating Voltage | 0.01–30 kV |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported Instrument |
| Model | SU7000 |
| Electron Gun | Cold Field-Emission (CFEG) |
| Secondary Electron (SE) Resolution | 0.8 nm @ 15 kV, 0.9 nm @ 1 kV |
| Magnification Range | 20× to 2,000,000× |
| Accelerating Voltage | 0.1–30 kV |
| Backscattered Electron (BSE) Resolution | Not Specified |
| Detector Channels | Simultaneous 6-channel signal acquisition and display |
| Maximum Image Resolution | 10240 × 7680 pixels |
| Sample Chamber | Ultra-large chamber with 18 accessory ports |
| Vacuum Mode | High vacuum and low vacuum (down to 300 Pa, optional) |
| Brand | Hitachi High-Tech |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Technologies Corporation |
| Product Type | Imported Desktop SEM |
| Model | FlexSEM 1000 II |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 4.0 nm @ 20 kV (High Vacuum), 15.0 nm @ 1 kV (High Vacuum) |
| Backscattered Electron Resolution | 5.0 nm @ 20 kV (Low Vacuum) |
| Magnification Range | 6×–300,000× (Film Equivalent), 16×–800,000× (Display) |
| Accelerating Voltage | 0.3–20 kV |
| EDS Detector | 30 mm² Silicon Drift Detector (SDD), Nitrogen-free |
| Dimensions (Main Unit) | 450 mm (W) × 640 mm (D) |
| Power Interface | Standard IEC C13 Socket |
| System Architecture | Modular Main Unit + Detachable Power Supply Unit |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Floor-standing SEM |
| Electron Source | Schottky field-emission gun |
| Secondary Electron Resolution | 0.6 nm @ 15 kV, 0.8 nm @ 1 kV, 0.9 nm @ 0.3 kV |
| Magnification Range | 20× – 2,000,000× |
| Accelerating Voltage | 0.1–30 kV (standard mode) |
| Maximum Image Size (optional) | 40,960 × 30,720 pixels |
| Simultaneous Signal Channels | Up to 6 detectors |
| EDS Working Distance Optimization | Short WD configuration enabled via optimized chamber geometry |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Floor-standing FE-SEM |
| Electron Source | Cold Field-Emission Gun |
| Secondary Electron Resolution | 0.6 nm @ 15 kV |
| Magnification Range | 20× – 2,000,000× |
| Accelerating Voltage | 0.5–30 kV (standard mode) |
| Backscattered Electron Resolution | Not specified |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | HF5000 |
| Accelerating Voltage | Up to 200 kV |
| Magnification | TEM (×200–×4,000,000), STEM (×20–×4,000,000) |
| HAADF-STEM Resolution | 0.78 Å |
| EDS Solid Angle | Up to 2.0 sr (dual-windowless silicon drift detectors) |
| Imaging Modes | TEM, STEM, SEM, Selected-Area Electron Diffraction (SAED), Convergent-Beam Electron Diffraction (CBED) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | TM4000PlusIII / TM4000III |
| Instrument Type | Benchtop SEM |
| Electron Source | Tungsten Filament |
| Accelerating Voltage | 5 kV, 10 kV, 15 kV, 20 kV |
| Magnification Range | 10× – 100,000× (photographic magnification) |
| Maximum Sample Diameter | 80 mm |
| Maximum Sample Thickness | 50 mm |
| Stage Travel | X: 40 mm, Y: 35 mm |
| Vacuum Mode | Standard Low-Vacuum Operation |
| Automation Features | Auto-focus, Auto-brightness/contrast, Filament Usage Monitoring, Programmable Workflow Sequencing, Integrated Particle Analysis Support (with Oxford AZtecLiveLite) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported |
| Model | SU3900 |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3.0 nm |
| Magnification Range | ×5–300,000 (standard mode), ×7–800,000 (high-magnification mode) |
| Accelerating Voltage | 0.3–30 kV |
| Backscattered Electron Resolution | 4.0 nm @ 30 kV (low-vacuum mode) |
| Maximum Sample Diameter | 300 mm |
| Maximum Sample Height | 130 mm |
| Maximum Sample Weight | 5 kg |
| Navigation Field of View | up to Ø200 mm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Instrument |
| Model | IM4000 II |
| Pricing | Available Upon Request |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | AFM5500M II |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | ≤ 0.04 nm (High-Resolution Mode) |
| Sample Diameter | ≤ 100 mm |
| Sample Thickness | ≤ 20 mm |
| XY Stage Travel Range | 100 mm × 100 mm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Atomic Force Microscope (AFM) |
| Model | AFM100 |
| Instrument Category | Materials-Grade AFM |
| Position Detection Noise | 0.03 nm |
| Maximum Sample Diameter | ≤35 mm |
| Maximum Sample Thickness | ≤10 mm |
| Sample Stage Travel Range | 5 mm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SU3800 |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3.0 nm at 30 kV |
| Magnification Range | 5–300,000× (low mode), 7–800,000× (high mode) |
| Accelerating Voltage | 0.3–30 kV (standard mode) |
| Backscattered Electron Resolution | 4.0 nm at 30 kV (low-vacuum mode) |
| Maximum Sample Diameter | 200 mm |
| Maximum Sample Height | 80 mm |
| Maximum Sample Weight | 2 kg |
| Navigation System | SEM MAP |
| Automated Imaging | Multi Zigzag Stitching |
| Filament Monitoring | Intelligent Filament Technology (IFT) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported TEM |
| Model | HT7800II |
| Accelerating Voltage | 20–120 kV |
| Magnification | ×200–×200,000 (High-Contrast Mode) |
| Brand | Quorum |
|---|---|
| Origin | United Kingdom |
| Model | PP3010T |
| Type | Cryogenic Transfer System for SEM |
| Application | Cryo-SEM Sample Preparation and In-Situ Cold Stage Integration |
| Temperature Range | Down to –185 °C (Liquid Nitrogen Cooled) |
| Compatibility | Cold Field Emission SEMs (CFEG-SEM), Conventional SEMs with Cryo-Compatible Stages |
| Brand | Hitachi High-Technologies |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Technologies Corporation |
| Type | Imported |
| Model | MC1000 |
| Pricing | Upon Request |
| Max Sample Diameter | 60 mm |
| Max Sample Height | 20 mm |
| Control Interface | LCD Touchscreen |
| Memory Function | Yes |
| Optional Accessories | Thick/Large Sample Holder Kit |
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