- All
- Favorite
- Popular
- Most rated
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Science Corporation |
| Product Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Model | VS1800 |
| Compliance | ISO 25178-2:2012, ISO 25178-601:2013, ISO 25178-602:2013 |
| Vertical Resolution | ≤ 0.01 nm (Phase-Shifting Mode) |
| Repeatability | < 0.1% (Z-height) |
| Field of View | Up to 6.4 mm × 6.4 mm (single-shot) |
| Measurement Speed | As fast as 5 seconds per acquisition (typical) |
| Optional Module | Large-Inclination Angle Measurement Kit |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Excitation Source | Xenon Arc Lamp |
| Monochromator Type | Dual Grating |
| Slit Width Range | 1–20 nm |
| Typical S/N Ratio (Water Raman, 350 nm ex/397 nm em) | ≥450:1 |
| Detection Limit (Fluorescein in Aqueous Solution) | ≤1 × 10⁻¹² mol/L |
| Lamp Lifetime | ≥2,000 hours |
| Scan Speed | Up to 60,000 nm/min |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | HT7800 Series |
| Accelerating Voltage | 20–120 kV |
| Magnification Range | ×200–×200,000 (High Contrast Mode) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Architecture | Dual-Beam |
| Detector Type | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ±0.1 nm |
| Spectral Bandwidth | 1.5 nm |
| Wavelength Scanning Mode | Motorized Auto-Scanning |
| Compliance | ISO/IEC 17025-compatible optical validation protocols, ASTM E275 and E387 spectral performance standards |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Conventional HPLC System |
| Flow Rate Range | 0.001–9.999 mL/min |
| Maximum Pressure | 39.2 MPa |
| Flow Accuracy | ≤0.075% RSD |
| Injection Volume Range | 0.1–50 µL |
| Sample Tray Capacity | 200 positions |
| Column Oven Temperature Range | (Ambient −15 °C) to 65 °C |
| UV-Vis Wavelength Range | 190–900 nm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Instrument |
| Model | NX5000 |
| Pricing | Available Upon Request |
| Brand | Hiranuma |
|---|---|
| Origin | Japan |
| Model | COM-28/28S |
| Measurement Range | −200 mV to +2000 mV |
| Potential Resolution | 0.1 mV |
| Display | 4.3-inch TFT LCD touchscreen (Chinese UI) |
| Data Storage | 50 internal records + up to ~9,900 via USB flash drive |
| Dimensions | 255 mm (W) × 290 mm (D) × 420 mm (H) |
| Optional accessories | C-1712 autosampler (12-position), photometric titration unit, dual external burettes |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Equipment |
| Model | ArBlade5000 |
| Price Range | USD 135,000 – 270,000 (FOB Japan) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | EA1280 |
| Configuration | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <150 eV (Mn Kα) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | SU3900/SU3800 SE Series |
| Instrument Type | Floor-Standing Conventional SEM |
| Electron Source | Thermal Field-Emission Gun |
| Secondary Electron Resolution | 0.9 nm @ 30 kV, 2.5 nm @ 1 kV, 1.6 nm @ 1 kV (Deceleration Mode) |
| Magnification Range | ×5 to ×600,000 (Film Equivalent) |
| Accelerating Voltage | 0.5 kV to 30 kV |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Instrument |
| Model | NX9000 |
| Pricing | Available Upon Request |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported Instrument |
| Model | ChromasterUltra Rs |
| Instrument Category | Ultra-High-Performance Liquid Chromatograph (UHPLC) |
| Application Scope | General-Purpose Analytical Platform |
| Flow Rate Range | 0.001–2.5 mL/min |
| Maximum System Pressure | 140 MPa |
| Flow Precision | ≤0.06% RSD |
| Autosampler Capacity | 120 positions |
| Injection Volume Range | 0.1–20 µL |
| Column Oven Temperature Range | (Ambient −15 °C) to 90 °C |
| UV-Vis Wavelength Range | 100–900 nm |
| Data Acquisition Rate | 100 Hz |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AMICS Automated Mineralogy System (MLA) |
| Price | USD 210,000 (FOB Hamburg) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | U-5100 |
| Optical System | Ratio-Beam Double-Beam |
| Detector | Photodiode Array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±1 nm |
| Spectral Bandwidth | 5 nm |
| Wavelength Scanning Speed | 12,000 nm/min |
| Standard Sample Holder | Automatic 6-Cell Carousel (10 mm square cuvettes) |
| Light Source | Pulsed Xenon Lamp |
| Display | Backlit LED, 320 × 240 dots |
| Dimensions (W×D×H) | 355 × 425 × 235 mm |
| Weight | 13 kg |
| Power Supply | 100–240 V, 50/60 Hz, 60 VA |
| Brand | Hitachi |
|---|---|
| Origin | Japan (manufactured by Hitachi High-Tech Corporation) |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Conventional HPLC System |
| Flow Rate Range | 0.001–9.999 mL/min at ≤40 MPa |
| Maximum Pressure | 60 MPa |
| Flow Accuracy | ≤0.05% RSD |
| Injection Volume Range | 0.1–100 µL |
| Autosampler Capacity | 200 positions |
| Column Oven Temperature Range | (Ambient −15 °C) to 85 °C |
| UV-Vis Wavelength Range | 190–900 nm |
| Data Acquisition Rate | 100 Hz |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Science Corporation |
| Product Type | Atomic Force Microscope (AFM) Controller |
| Model | AFM5000II / RealTune®II |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Software Architecture | Windows-based real-time control platform with audit trail capability |
| Control Resolution | Sub-nanometer positioning accuracy |
| Vibration Noise Floor | < 0.1 nm RMS (in closed-loop mode) |
| Sample Stage Travel Range | X/Y: ±25 µm, Z: ±5 µm |
| GUI Framework | Qt-based modular interface with tabbed workflow navigation |
| 3D Rendering Engine | OpenGL-accelerated volumetric reconstruction |
| Data Format | HDF5-compliant binary + metadata-rich XML header |
| Regulatory Alignment | Supports FDA 21 CFR Part 11 electronic signature and ALCOA+ data integrity principles |
| Brand | SUNYOU |
|---|---|
| Origin | Japan |
| Model | ZONESEM II |
| Cleaning Principle | UV-Ozone Oxidation |
| Vacuum System | Oil-Free Diaphragm Pump (9 L/min) |
| Pump-Down Time | ≤3 min to Target Vacuum |
| Operating Vacuum Range | 100–500 torr (100-step adjustable) |
| Cleaning Chamber Dimensions | Ø100 mm × H36 mm |
| Cleaning Modes | Vacuum UV-Ozone Cleaning & Vacuum Storage Mode |
| Cleaning Duration | 1–1440 min (1-min increments) |
| Effective Cleaning Area | Ø100 mm |
| Compliance | Designed for SEM sample preparation per ISO 14644-1 Class 5 cleanroom-compatible workflows |
| Brand | SUNYOU |
|---|---|
| Origin | Japan |
| Model | ZONETEM II |
| Cleaning Principle | Vacuum-Enhanced 185/254 nm UV-Ozone Oxidation |
| Vacuum Range | 100–500 Torr (100-step adjustable) |
| Pump Type | Oil-Free Dry Scroll Vacuum Pump (3.8 L/min) |
| Pump-Down Time | ≤3 min to operational vacuum |
| Cleaning Duration | 1–30 min (1-min increments) |
| Sample Holder Compatibility | 3-hole or 5-hole TEM specimen holders |
| Effective Cleaning Area | Ø3 mm per position |
| Regulatory Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Floor-Standing SEM |
| Electron Source | Cold Field-Emission Gun (CFEG) |
| Resolution | 0.6 nm @ 1 kV, 0.4 nm @ 30 kV (Secondary Electron Imaging) |
| Magnification Range | 80× to 3,000,000× |
| Accelerating Voltage | 0.01–30 kV |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported Instrument |
| Model | ChromAssist Data Station |
| Pricing | Upon Request |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | ChromAssist Database Edition |
| Instrument Type | Conventional High-Performance Liquid Chromatograph (HPLC) System Software |
| Deployment Options | Standalone & Networked |
| Regulatory Compliance | FDA 21 CFR Part 11, ALCOA+ Principles, ISO/IEC 17025 Annex A.3, ICH GCP, USP <1058> Analytical Instrument Qualification |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Product Type | Imported Instrument |
| Model | SU7000 |
| Electron Gun | Cold Field-Emission (CFEG) |
| Secondary Electron (SE) Resolution | 0.8 nm @ 15 kV, 0.9 nm @ 1 kV |
| Magnification Range | 20× to 2,000,000× |
| Accelerating Voltage | 0.1–30 kV |
| Backscattered Electron (BSE) Resolution | Not Specified |
| Detector Channels | Simultaneous 6-channel signal acquisition and display |
| Maximum Image Resolution | 10240 × 7680 pixels |
| Sample Chamber | Ultra-large chamber with 18 accessory ports |
| Vacuum Mode | High vacuum and low vacuum (down to 300 Pa, optional) |
| Brand | Hiranuma |
|---|---|
| Origin | Japan |
| Model | AQ-300 |
| Titration Method | Fully Automatic Coulometric Titration |
| Instrument Type | Coulometric Karl Fischer Moisture Analyzer |
| Dimensions (W × D) | 310 mm × 270 mm |
| Interface | Dual RS-232C ports |
| Compliance | Designed for ISO 8533, ASTM E203, and USP <921> moisture determination protocols |
| Software Integration | Compatible with PC-based data acquisition and GLP-compliant reporting systems |
| Brand | Hitachi High-Tech |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Technologies Corporation |
| Product Type | Imported Desktop SEM |
| Model | FlexSEM 1000 II |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 4.0 nm @ 20 kV (High Vacuum), 15.0 nm @ 1 kV (High Vacuum) |
| Backscattered Electron Resolution | 5.0 nm @ 20 kV (Low Vacuum) |
| Magnification Range | 6×–300,000× (Film Equivalent), 16×–800,000× (Display) |
| Accelerating Voltage | 0.3–20 kV |
| EDS Detector | 30 mm² Silicon Drift Detector (SDD), Nitrogen-free |
| Dimensions (Main Unit) | 450 mm (W) × 640 mm (D) |
| Power Interface | Standard IEC C13 Socket |
| System Architecture | Modular Main Unit + Detachable Power Supply Unit |
Show next