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| Brand | Advantest |
|---|---|
| Origin | Japan |
| Model | TS9000 |
| Type | TDR/TDT Integrated Measurement System |
| Application Domain | Non-destructive Fault Localization in IC Packages and PCB Interconnects |
| Compliance Context | Supports JEDEC JESD22-B111, IPC-TM-650 2.5.1, and IEEE Std 1149.1 (JTAG) auxiliary diagnostics |
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