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| Brand | MVP |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Spectra Series II |
| Pricing | Upon Request |
| Brand | CAMECA |
|---|---|
| Origin | France |
| Model | IMS 7f-Auto, LEAP 5000 XR / XS / R |
| Type | Secondary Ion Mass Spectrometry (SIMS) and Laser/Field-Assisted Atom Probe Tomography (APT) Platforms |
| Compliance | ASTM E1527, ISO/IEC 17025, GLP/GMP-ready data audit trails, FDA 21 CFR Part 11–compliant software options |
| Sample Form | Bulk solids, thin films, epitaxial layers, semiconductors (Si, III-V, II-VI), metals, ceramics, glasses, insulators |
| Depth Resolution | <0.3 nm (SIMS) |
| Spatial Resolution | <0.3 nm (APT, 3D) |
| Detection Limit | Sub-ppq (SIMS) |
| Throughput | Fully automated multi-sample analysis chain |
| Reproducibility | RSD < 0.5% (SIMS depth profiling) |
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