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| Brand | MVP |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Models | Supra E, Ultra 850G, Spectra, Ultra |
| Pricing | Upon Request |
| Brand | Mechanical Devices |
|---|---|
| Origin | USA |
| Model | Flex TC |
| Temperature Measurement Range | -55°C to +155°C |
| Measurement Method | Contact |
| Temperature Stability | ±0.1°C (High-Temp Mode) |
| Cooling Power | 21 W @ -40°C, ~65 W @ 0°C |
| Resolution | Not specified (N/A) |
| Compliance | CE, RoHS, UL Recognized Components |
| Power Supply | 100–240 VAC, 50/60 Hz |
| Dimensions | 280 × 220 × 190 mm (W × D × H) |
| Weight | 6.2 kg |
| Brand | CAMECA |
|---|---|
| Origin | France |
| Model | IMS 7f-Auto, LEAP 5000 XR / XS / R |
| Type | Secondary Ion Mass Spectrometry (SIMS) and Laser/Field-Assisted Atom Probe Tomography (APT) Platforms |
| Compliance | ASTM E1527, ISO/IEC 17025, GLP/GMP-ready data audit trails, FDA 21 CFR Part 11–compliant software options |
| Sample Form | Bulk solids, thin films, epitaxial layers, semiconductors (Si, III-V, II-VI), metals, ceramics, glasses, insulators |
| Depth Resolution | <0.3 nm (SIMS) |
| Spatial Resolution | <0.3 nm (APT, 3D) |
| Detection Limit | Sub-ppq (SIMS) |
| Throughput | Fully automated multi-sample analysis chain |
| Reproducibility | RSD < 0.5% (SIMS depth profiling) |
| Brand | Camtek |
|---|---|
| Origin | Israel |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Falcon 800 |
| Pricing | Available Upon Request |
| Brand | Camtek |
|---|---|
| Origin | Israel |
| Model | Falcon600 |
| Category | Precision Geometric Measurement Instrument / Profilometer |
| Application Scope | Semiconductor Wafer-Level and Advanced Packaging Inspection |
| Maximum Wafer Size | 300 mm (unmounted or framed) |
| Detection Capability | 2D & 3D Defect Detection and Metrology |
| Target Structures | Stacked Die, 3D IC, SiP, Flip-Chip, Fine-Pitch Wire Bonds |
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