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| Brand | TA Instruments |
|---|---|
| Origin | Italy |
| Model | OPD 868 |
| Temperature Range | RT – 1650 °C |
| Heating Rate | 0.1 – 100 °C/min (up to 200 °C/sec in transient mode) |
| Temperature Accuracy | ±0.2 °C |
| Sample Length | 1 – 85 mm (mode-dependent) |
| Camera Resolution | 5 MP |
| Multi-sample Capability | Up to 8 ISO-standard specimens simultaneously |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DIL 821 / DIL 822 |
| Measurement Principle | Contact-based linear thermal expansion measurement using optical encoder and linear motor actuation |
| Resolution | 1 nm |
| Configuration | Vertical sample orientation |
| Force Control | Constant low-force contact via linear motor |
| Differential Capability | True differential measurement (DIL 822 only) |
| Compliance | ASTM E228, ISO 11359-1/-2, DIN 51045 |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DIL 802/802L |
| Measurement Principle | True Mechanical Differential Expansion Detection |
| Sensor Type | High-Stability LVDT with Digital Amplification |
| Contact Force Range | 0.02–1.00 N (User-Adjustable) |
| Configuration | Convertible Between Differential and Single-Sample Modes |
| Thermal Uniformity | Optimized Horizontal Furnace Design |
| Vibration Resistance | Integrated Mechanical Isolation Architecture |
| Compliance Ready | Designed for GLP/GMP environments with audit-trail-capable software integration |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DIL 801 / DIL 801L |
| Configuration | Horizontal, single-sample dilatometer |
| Operating Atmosphere | Air, vacuum, or inert gas (N₂, Ar) |
| Temperature Range | −150 °C to 1600 °C (dependent on furnace and sensor option) |
| Force Control | User-adjustable contact force from 0.02 N to 1.00 N |
| Sensor Type | High-stability LVDT with digital signal conditioning |
| Compliance | ASTM E228, ISO 11359-1/-2, DIN 51045-1, USP <671> |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DIL 803/803L |
| Configuration | Dual-sample horizontal dilatometer with differential capability |
| Sensor Type | High-stability LVDT with digital amplifier |
| Contact Force Range | User-adjustable from 0.02 N to 1.00 N |
| Furnace Compatibility | Interchangeable TA furnace modules |
| Operating Mode | Simultaneous dual-sample or differential (sample vs. inert reference) |
| Compliance | Designed for ASTM E228, ISO 11359-2, and USP <640> thermal expansion testing |
| Brand | TA Instruments |
|---|---|
| Origin | Germany |
| Model | DIL 831 |
| Temperature Range | RT to 1700 °C |
| Heating Rate | Up to 50 °C/min |
| Temperature Accuracy | ±0.05 °C |
| Sample Length | 0–25 mm (standard), 12 mm (optimal) |
| Length Resolution | 1 nm |
| Force Range | 0.01–1.00 N |
| Force Resolution | 0.01 N |
| CTE Accuracy | ±0.03 × 10⁻⁶ K⁻¹ |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DIL 805 |
| Temperature Range | −150 to 1300 °C |
| Maximum Heating Rate | ≤4000 °C/s |
| Measurement Resolution | 0.01 µm / 0.05 °C |
| Atmosphere Options | Air, Vacuum, Inert Gases (e.g., Ar, N₂, He) |
| Quench Medium | High-velocity Helium Gas |
| Brand | TA Instruments |
|---|---|
| Origin | USA |
| Model | DIL 806 |
| Measurement Principle | Non-contact shadow-edge optical imaging |
| Light Source | High-intensity GaN LED with collimated short-wavelength planar illumination |
| Detection | High-resolution CCD sensor with digital edge detection |
| Temperature Range | Ambient to 1400 °C |
| Heating Rate | Up to 100 °C/min |
| Cooling Rate | 1400 °C → 50 °C in ≤10 min |
| Furnace Design | Dual-zone planar heating (top + bottom) for minimized axial and radial thermal gradients |
| Sample Area | 30 mm wide field-of-view with position-insensitive measurement |
| Compliance | ASTM E228, ISO 11359-1, USP <632>, GLP/GMP-ready data audit trail (via TRIOS software) |
| Brand | TA Instruments |
|---|---|
| Origin | Germany |
| Model | DIL 832 |
| Temperature Range | RT to 1700 °C |
| Heating Rate | Up to 50 °C/min |
| Temperature Accuracy | ±0.05 °C |
| Sample Length | 0–25 mm |
| Sample Diameter | ≤6 mm |
| Length Resolution | 1 nm |
| Force Range | 0.01–1.00 N |
| Force Resolution | 0.01 N |
| CTE Accuracy | ±0.01 × 10⁻⁶ K⁻¹ |
| Total Measurement Range | 5000 µm |
| Cooling Time (1000 °C → RT) | 13 min |
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