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| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Benchtop |
| Excitation Source | High-Power Programmable DC Arc |
| Detector | Back-Illuminated CCD Array |
| Focal Length | 400 mm |
| Grating Groove Density | 2400 lines/mm |
| Wavelength Range | 190–680 nm |
| Spectral Coverage | Full-Spectrum Simultaneous Acquisition |
| Optical Design | Paschen-Runge Mount with Fixed, Thermally Stabilized Vacuum- or Purged-Optics Chamber |
| Cooling | Integrated Water-Cooled Electrode & Arc Source |
| Safety Interlocks | Real-Time Monitoring of Cooling Flow, Exhaust Ventilation, Torch Chamber Door Status, and Thermal Sensors |
| Brand | Microlink / BEIJING MICHEM TECHNOLOGY LTD. |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Scientific-grade CMOS array (replacing legacy CCD) |
| Focal Length | 1000 mm |
| Grating Density | 3600 lines/mm |
| Wavelength Range | 140 nm – 680 nm |
| Number of Simultaneous Detection Channels | 96 |
| Optical System | Dual-chamber vacuum-UV + UV-Vis configuration |
| Structural Material | Stress-relieved die-cast aluminum optical chamber (4-stage annealing) |
| Thermal Management | Active chamber temperature stabilization with laminar purge gas flow |
| Spectral Optimization | RTMC (Real-Time Multi-Channel) calibration and drift compensation algorithm |
| Compliance | Designed to support ISO/IEC 17025 workflows, ASTM E415, ASTM E1086, ASTM E3061, and GB/T 4336–2016 methodologies |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark Discharge |
| Detector Type | Scientific-grade CMOS Sensor with Active Cooling |
| Wavelength Range | 130–700 nm |
| Element Analysis Time | ≤10 s per measurement |
| Detection Limit | ≤1 ppm for key metallic elements |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories, supports GLP/GMP audit trails and ASTM E415, E1086, E1479 methodologies |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector | Cooled Scientific-Grade A-CMOS Array |
| Wavelength Range | 130–700 nm |
| Optical Configuration | Dual-Optical-Path System |
| Element Coverage | ≥40 elements across Fe, Al, Cu, Ni, Zn, Mg, Co, Ti, Sn, Pb matrices |
| Detection Limit | ≤1 ppm (C, P, S, N with cryogenic cooling) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Model | MERLIN 4 |
| Excitation | Spark Source |
| Optical System | Paschen-Runge Mount with Holographic Concave Grating |
| Detector | High-Resolution CCD Array |
| Spectral Range | 130–800 nm |
| Resolution | ≤ 10 pm at 200 nm |
| Sample Stage | Motorized X-Y Translation with Open Spark Stand |
| Compliance | ASTM E415, ISO 11577, GB/T 4336 |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | High-Resolution CCD Array |
| Spectral Range | 130–700 nm |
| Optical Design | Paschen–Runge Mount with Dual Optical Chambers |
| Cooling | Thermostatically Controlled Enclosure (±0.1 °C) |
| Purge Medium | Argon |
| Compliance | ISO/IEC 17025-ready architecture, GLP/GMP-supporting data integrity features |
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