- All
- Favorite
- Popular
- Most rated
| Brand | k-Space Associates |
|---|---|
| Model | kSA BandiT |
| Origin | USA |
| Type | Non-Contact, Absorption-Edge-Based In-Situ Temperature Monitoring System for Semiconductor Wafers |
| Temperature Range | RT to 750 °C (up to 1300 °C with optional configuration) |
| Repeatability | ±0.2 °C |
| Resolution | 0.1 °C |
| Stability | ±0.2 °C |
| Measurement Principle | Temperature-Dependent Bandgap Absorption Edge Shift (Tauc Plot Method) |
| Compatible Platforms | MBE, MOCVD, Sputtering, PLD, Evaporation, Annealing & Rapid Thermal Processing (RTP) Systems |
| Laser Wavelength Options | Visible (e.g., 405 nm, 635 nm) and Near-IR (e.g., 980 nm, 1310 nm) |
| Surface Analysis Capabilities | In-situ deposition rate, film thickness estimation, and surface roughness correlation |
| Optical Interface | Standard viewport-compatible |
| Software | kSA BandiT Multi-Wafer Mapping Suite with motorized XY scanning stage control |
| Brand | k-Space |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | KSA RateRat |
| Price Range | USD $13,500 – $40,500 (based on configuration) |
| Compatible Target Materials | Metals and Semiconductors |
Show next