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| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | PK-Pyro600 |
| Temperature Range | −184 °C to >300 °C (with liquid nitrogen cooling) |
| Current Measurement Resolution | pA-level (10⁻¹² A) |
| Sample Diameter | up to 8 cm |
| Electric Field Capability | >100 V/µm in air |
| High-Voltage Source | ±10 kV (SRS PS350 or Trek 10 kV) |
| Electrometer | Keithley 6517B (or equivalent) with coaxial shielded cabling |
| Shielding | Fully Faraday-shielded test chamber with insulated interior door mount |
| Electrode Configuration | Spring-loaded spherical electrodes for non-damaging contact on soft polymer films (<10 µm thick) |
| Compliance | ASTM D257, ISO 3001-1, IEC 60243-1, GLP/GMP-ready data logging architecture |
| Brand | ProOpto |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EUV |
| Pricing | Upon Request |
| Standards Compliance | ISO 11551, ISO 11254, ISO 13696, ISO 11146, ISO 13694, ISO 11670, ISO 15367 |
| Radiation Sources Supported | Excimer lasers (351 nm, 308 nm, 248 nm, 193 nm, 157 nm) |
| Measurement Capabilities | Absorptance (thermal lensing in fused silica @193 nm), LIDT, wavefront distortion (thermal lensing & mechanical stress), transmission, reflection, bidirectional scatter distribution (@248 nm), color center formation, fluorescence/luminescence emission |
| Imaging Support | 2D scatter mapping, LIDT site micrography, compatibility with ~20 camera types |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | OPV/PSC |
| Sampling Rate | 60 MS/s |
| Time Resolution | 16 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | < 100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V |
| Optional Modules | Multi-LED Source (360–1100 nm), Cryogenic Stage (−120 °C to +150 °C), Spectrometer Integration, SMU Extension (±60 V, 1 pA resolution) |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | IMVS/IMPS |
| Sampling Rate | 60 MS/s |
| Time Resolution | 16 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | <100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V (optional ±60 V with SMU module) |
| Spectral Coverage (Multi-LED) | 360–1100 nm |
| Temperature Range (optional cryo-thermo stage) | −120 °C to +150 °C |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | TPC/TPV |
| Sampling Rate | 60 MS/s |
| Time Resolution | 18 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | <100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V (optional ±60 V with SMU module) |
| Spectral Coverage (Multi-LED) | 360–1100 nm |
| Temperature Range (optional cryo/heating stage) | −120 °C to +150 °C |
| Brand | Piezotest |
|---|---|
| Origin | Singapore |
| Model | PM200 |
| Price Range | USD 30,000–50,000 |
| d₃₃ Measurement Range | 0–10,000 pC/N |
| Resolution | 0.01 pC/N (lowest range) |
| Test Frequencies | 30–300 Hz (1 Hz step, calibrated at 110 Hz) |
| Static Force Range | 0–10 N |
| Dynamic Force Range | 0.05–0.5 N |
| Capacitance Range | 10 pF–0.1 µF |
| Loss Tangent (tanδ) Range | 0.0000–0.2000 |
| Max Sample Diameter | 136 mm |
| Max Sample Thickness (Polarization Direction) | 50 mm |
| Max Sample Mass | 1 kg |
| Compliance | ASTM D790, IEC 62047-18, ISO 20482 (referenced for piezoelectric characterization) |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | PK-HT800 |
| Temperature Range | RT to 800 °C (up to 1000 °C optional) |
| Frequency Range | 20 Hz to 1 MHz (4-terminal shielded) |
| Dielectric Loss Tangent Sensitivity | < 0.1% |
| Sample Capacity | Up to 4 samples per thermal cycle |
| DC Bias Voltage | Up to 4000 V (optional) |
| Includes | High-temperature furnace, ceramic-insulated 4TP test fixture with spring-loaded Pt probes, Agilent/Keysight LCR meter interface (4284A, E4980AL, 4294A compatible), dedicated control software, and thermally rated cabling |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | PK-CPR1901 |
| Pricing | Available Upon Request |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | CPE1901 |
| Voltage Amplifier Output | >10 kV to 30 kV |
| Charge Range | 1 nC to >1 mC |
| Frequency Range | 0.01 Hz – 1 kHz (standard), up to 300 kHz (with optional HF module) |
| Built-in Amplifier | ±100 V or ±200 V |
| Hysteresis & Breakdown Modes | AC, DC, Field Endurance Life |
| Software Platform | LabVIEW-based with waveform control (sine, triangle, unipolar/bipolar, arbitrary) |
| Optional Modules | Piezoelectric Strain Measurement (10 nm resolution Fotonic Sensor or magnetoelectric sensor), High-Voltage Variable-Temperature Testing (–184 °C to +250 °C) |
| Compliance | Designed for ASTM D149, IEC 60243, IEEE Std 930, and ISO 25777 test protocols |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | TEL |
| Key Features | DC/AC/Transient operation modes |
| Measurement Capabilities | TEL, TPC, TPV, Photo-CELIV, Dark-CELIV, IMPS, IMVS, IS, CV, C-f, DLTS, SCLC, Pulse Voltage, MIS-CELIV, Delaytime-CELIV, Injection-CELIV |
| Sampling Rate | 60 MS/s |
| Time Resolution | 18 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | <100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V (extendable to ±60 V with SMU module) |
| Spectral Coverage (Multi-LED) | 360–1100 nm |
| Temperature Range (optional cryo/heating stage) | −120 °C to +150 °C |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | PK-Pyro |
| Temperature Range | −184 °C to >300 °C (with liquid nitrogen cooling) |
| Current Measurement Sensitivity | down to 1 pA |
| Maximum Electric Field | >100 V/µm (air-gap configuration) |
| Sample Diameter | up to 8 cm |
| Electrode Configuration | spring-loaded spherical electrodes |
| Shielding | fully enclosed, grounded Faraday cage enclosure |
| Compliance | ASTM D257, ASTM D877, IEC 60243-1, ISO 60243-1 |
| Measurement Modes | pyroelectric current, leakage current, thermally stimulated depolarization current (TSDC) |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | ECE-22A |
| Temperature Range | −50 °C to 200 °C |
| Response Time | ≤100 ms |
| Sample Size | up to 20 mm × 20 mm |
| Heat Flux Sensor Sensitivity | >3 µV/(BTU·ft⁻²·hr⁻¹) |
| Thermal Resistance | 0.01 °F·ft²·hr/BTU |
| Thermal Capacitance | 0.02 BTU/(ft²·°F) |
| Data Acquisition | 16-bit ADC |
| Amplifier | Stanford Research Systems SR560 |
| Gain Range | 1–50,000 |
| Bandwidth | DC to 1 MHz |
| Input Noise | 4 nV/√Hz |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | CP |
| Voltage Range | Up to 10 kV |
| Electric Field Capability | ≥100 V/µm (up to 200 V/µm demonstrated) |
| Current Resolution | ≤1 pA |
| Temperature Range | –150 °C to >250 °C (with liquid nitrogen cooling) |
| Sample Diameter | up to 8 cm |
| Electrode Configuration | Spring-loaded spherical electrode for soft polymer films (<10 µm thick) |
| Shielding | Fully enclosed, grounded Faraday cage test chamber |
| Compliance | ASTM D257 (extended-field adaptation), ISO 60270 (partial discharge context), GLP-ready architecture |
| Brand | k-Space Associates |
|---|---|
| Origin | USA |
| Model | kSA MOS US |
| Scan Area | 300 mm × 300 mm (up to 2 m optional) |
| Scanning Speed | up to 20 mm/s (X/Y) |
| Positional Resolution | 1 µm |
| Mean Curvature Resolution | 5 × 10⁻⁵ m⁻¹ (1σ) |
| Stress Measurement Range | 3.2 × 10⁵ Pa to 7.8 × 10⁹ Pa (1σ) |
| Stress Resolution | < 0.32 MPa or 1% (1σ) |
| Stress Repeatability | 0.02 MPa (1σ) |
| Curvature Repeatability | < 5 × 10⁻⁵ m⁻¹ (1σ) |
| Measurement Modes | Region-of-Interest, Linear Multi-Point, Full-Sample Scan |
| Output | 2D curvature mapping, quantitative stress distribution imaging, radius of curvature, wafer bow, and stress intensity |
| Brand | k-Space |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | RDA |
| Pricing | Upon Request |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | PTC-TPV |
| Sampling Rate | 60 MS/s |
| Time Resolution | 18 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | < 100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V |
| Optional Modules | Solar Cell & OLED Dual Configuration, Multi-Wavelength LED Source (360–1100 nm), Cryogenic/Heated Stage (−120 °C to +150 °C), Integrated Spectrometer, SMU Extension (±60 V, 1 pA current resolution) |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | CPT1705 |
| Max Voltage | ±4000 V |
| Max Current | ±20 mA |
| Frequency Range | 100 Hz – 1 MHz |
| Capacitance Range | 100 pF – 100 nF |
| Temperature Range | −184 °C to 250 °C |
| Optional Cryo/High-Temp Chamber | −75 °C to 200 °C or RT to 1000 °C |
| Optional Frequency Extension | 0.01 Hz – 1 MHz (dependent on integrated impedance analyzer) |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | CPT1706 |
| Voltage Range | ±4000 V |
| Current Range | ±20 mA |
| Frequency Range | 100 Hz – 1 MHz |
| Capacitance Range | 100 pF – 100 nF |
| Temperature Range | −184 °C to 250 °C |
| Optional Cryo-Free Chamber | −75 °C to 200 °C |
| Optional High-Temp Chamber | RT to 1000 °C |
| Optional Extended Frequency | 0.01 Hz – 110 MHz (dependent on integrated impedance analyzer) |
| Brand | ProOpto |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PTA |
| Pricing | Available Upon Request |
| Measurement Principle | Photothermal Deflection + Hartmann-Shack Wavefront Sensing |
| Sensor Resolution | <10 pm (≈ λ/10,000) |
| Absorption Sensitivity | Real-time ppm-level detection |
| Supported Camera Interfaces | ~20 standard scientific camera types |
| Compliance | ISO 11146, ISO 13694, ISO 11670, ISO 15367 |
| Application Domain | Optical thin-film metrology, high-power laser component qualification, transient thermal distortion analysis |
| Brand | Piezotest |
|---|---|
| Origin | Singapore |
| Model | PM300 |
| d₃₃ Range | 0–10,000 pC/N |
| Resolution | 0.01 pC/N (lowest range) |
| Adjustable Static Force | 0–10 N |
| Dynamic Force | 0.05–0.5 N |
| Test Frequency | 30–300 Hz (1 Hz step, calibrated at 110 Hz) |
| Capacitance Measurement | 10 pF–0.1 µF |
| Loss Tangent (tan δ) | 0.0000–0.2000 |
| Max Sample Dimensions | Ø136 mm × 50 mm (polarization direction) |
| Max Sample Weight | 1 kg |
| Compliance | ASTM D790, IEC 62047-18, ISO 6722 (referenced for piezoelectric characterization) |
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