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| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Type | Manual I-V Tester |
| Solar Simulator Class | A+A+A (Steady-State) |
| Effective Test Area | 40 mm × 40 mm to 300 mm × 300 mm |
| Voltage Measurement Accuracy | 1 µV |
| Current Measurement Accuracy | 10 pA |
| Voltage Accuracy | ±0.015% of reading |
| Current Accuracy | ±0.15% of reading |
| Measurement Repeatability | ±1% |
| Sample Sizes Supported | 2″×2″ to 12″×12″ |
| Compliance | ASTM E927-22, IEC 60904-9 Ed. 3, JIS C 8912 |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | PCT |
| Automation Level | Semi-Automatic |
| Effective Illumination Area | 4 inch to 12 inch (102 mm to 305 mm diagonal) |
| Current Measurement Resolution | 10 pA |
| Voltage Measurement Resolution | 1 µA |
| Solar Simulator Class | AAA (per IEC 60904-9:2007, ASTM E927-05, JIS C 8912) |
| Spectral Mismatch | < ±12.5% (AM1.5G) |
| Irradiance Uniformity | < 2% (Class A) |
| Temporal Instability | < 1% over ≥1 h (Class A+) |
| Adjustable Irradiance Range | 70–130% of 1000 W/m² |
| Light Source Options | 150–3000 W Xenon Arc Lamp or Halogen Lamp |
| Shutter Timing Range | 0.1 s – 9990 h |
| Lamp Life Monitoring | Integrated Hour Meter |
| Safety Features | Interlocked Shutter, Overheat Protection, Auto-Cooling Post-Operation |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Automation Level | Semi-Automatic |
| Effective Test Area | 40 mm × 4 mm to 300 mm × 300 mm |
| Voltage Measurement Accuracy | ±0.015% of reading |
| Current Measurement Accuracy | ±0.15% of reading |
| Measurement Repeatability | ±1% |
| Compatible Wafer Sizes | 100 mm × 100 mm (4″), 150 mm × 150 mm (6″), 175 mm × 175 mm (7″), 200 mm × 200 mm (8″) |
| Light Source Classification | AAA-Class Steady-State Solar Simulator |
| Standard Compliance | IEC 60904-9 Ed. 3 (2020), ASTM E927-22, JIS C 8912 |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XES Series |
| Light Source | Xenon + Halogen |
| Spectral Class | AAA (A+A+A) per JIS C 8912, IEC 60904-9:2007, ASTM E927-05 |
| Effective Illumination Area | 40 mm × 40 mm to 300 mm × 300 mm (customizable) |
| Voltage Measurement Resolution | 10 µV |
| Current Measurement Resolution | 10 pA |
| Light Intensity Range | 70–130% of 1000 W/m² |
| Temporal Instability (≥1 h) | <1% (A+ class) |
| Spatial Non-uniformity | <2% (Class A) |
| Spectral Mismatch | <±12.5% (A+ class, AM1.5G or AM0) |
| Shutter Timing Range | 0.1 s – 9990 h |
| Remote Control | Yes |
| Safety Interlock & Auto-Cooling | Yes |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | PAIOS |
| Price Range | USD 14,000 – 70,000 |
| Automation Level | Semi-Automatic |
| Effective Test Area | 20 mm² |
| Voltage Measurement Resolution | Sub-nanovolt (nV) |
| Current Measurement Resolution | Sub-picoampere (pA) |
| Sampling Rate | 60 MS/s |
| Time Resolution | 16 ns |
| Frequency Range | 10 mHz – 10 MHz |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V (optional ±60 V with SMU module) |
| Spectral Coverage (Multi-LED) | 360–1100 nm |
| Temperature Range (Optional Cryo/Hot Stage) | −120 °C to +150 °C |
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