Optical Instruments
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| Brand | Benyuan Nano |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | BY1000 |
| Price Range | USD 14,000 – 70,000 |
| Instrument Type | Scanning Tunneling Microscope (STM) |
| Position Detection Noise | 0.1 Å RMS |
| Maximum Sample Size | Ø45 mm × 15 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Brand | Benyuan Nano |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | BY3000 |
| Price Range | USD 14,000 – 72,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | 0.1 nm |
| Maximum Sample Diameter | 45 mm |
| Maximum Sample Thickness | 15 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Brand | BENYUAN Nano |
|---|---|
| Model | CSPM5500 |
| Origin | Beijing, China |
| Instrument Type | Atomic Force Microscope (AFM) with integrated Scanning Tunneling Microscope (STM) and Lateral Force Microscope (LFM) |
| Position Detection Noise | 0.1 nm |
| Sample Diameter Limit | <102 mm (4 in) |
| Sample Thickness Limit | <40 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Maximum Z-Travel (Auto-Approach) | >30 mm |
| Image Resolution | Up to 4096 × 4096 physical pixels |
| Horizontal Resolution (AFM) | 0.2 nm (mica-calibrated) |
| Vertical Resolution (AFM) | 0.1 nm (mica-calibrated) |
| Horizontal Resolution (STM) | 0.1 nm (graphite-calibrated) |
| Vertical Resolution (STM) | 0.01 nm (graphite-calibrated) |
| Data Interface | Fast Ethernet (10/100 Mbps) or USB 2.0 |
| Real-Time 3D Visualization | Yes |
| PID-Controlled Force Feedback | Yes |
| Brand | Bestron |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | INSTEMS MET/MT/ME/ET/M |
| Application Field | Materials Science |
| Instrument Classification | In Situ Tensile/Compression/Bending Holder |
| Thermal Range | RT–1200 °C |
| Max Force Output | >100 mN |
| Max Displacement | >4 µm |
| Minimum Step Resolution | <0.5 nm |
| Dual-Tilt Range (α/β) | ±25° each |
| Tilt Precision | <0.1° |
| Thermal Ramp Rate | >10,000 °C/s |
| Temperature Accuracy | ≥98% |
| Thermometry Method | Four-Probe Resistive |
| EDS Compatibility | Yes |
| Electrical Output | ±50 V |
| Current Measurement Range | 1 pA–1 A |
| Voltage Measurement Range | 100 nV–50 V |
| Spatial Resolution (in situ) | ≤0.1 nm |
| Drift Stability | <50 pm/s |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-M |
| Type | MEMS-Based In Situ TEM Mechanical Testing Holder |
| Loading Modes | Tension, Compression, Nanoindentation, Bending, Impact, Creep, Fatigue |
| Force Range | >100 mN |
| Displacement Range | 4 µm |
| Actuation Resolution | <500 pm |
| Drift Rate | <50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Compatibility | Standard 3-mm TEM specimen holders, Gatan/FEI/Thermo Fisher-compatible apertures |
| Chip Customization | User-configurable MEMS chip geometry and loading configuration |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-ME |
| Type | Dual-Axis Tilt Electromechanical In Situ TEM Holder |
| Max Force | 100 mN |
| Max Displacement | 4 µm |
| Force Resolution | < 500 pm |
| Voltage Range | ±50 V |
| Current Range | 1 pA–1 A |
| Temperature Range | RT–1200 °C |
| Temp. Stability | < 0.1 °C |
| α/β Tilt Range | ±25° each |
| Drift Rate | < 50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| EDS-Compatible | Yes |
| Application Domain | Materials Science, Nanodevices, Energy Storage, Ferroelectrics, Piezoelectrics, Flexible Electronics |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-MET |
| Type | In Situ TEM Dual-Axis Tilt Sample Holder with Integrated Mechanical, Electrical, and Thermal Actuation |
| Heating Range | RT to 1200 °C |
| Temperature Accuracy | < 0.1 °C |
| Max. Driving Force | > 100 mN |
| Drive Resolution | < 500 pm |
| Voltage Range | ±50 V (up to 150 V peak) |
| Current Range | 1 pA – 2 A |
| Dual-Axis Tilt | α/β ±25° |
| Spatial Resolution (TEM-compatible) | ≤ 0.1 nm |
| Sample Drift | < 50 pm/s |
| EDS-Compatible | Yes |
| Heating Rate | > 10,000 °C/s |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-MT |
| Category | In Situ TEM Sample Holder |
| Heating Range | RT to 1200 °C |
| Temperature Accuracy | < 0.1 °C |
| Programmable Thermal Ramp Rate | >10,000 °C/s |
| Mechanical Load Capacity | >100 mN |
| Drive Resolution | < 500 pm |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Sample Drift | < 50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| EDS-Compatible | Yes |
| Current Range | 0–2 A |
| Voltage Range | 0–150 V |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-ET |
| Type | In Situ Dual-Axis Tilt TEM Sample Holder |
| Heating Range | RT to 1200 °C |
| Electrical Bias Range | 0–150 V |
| Current Range | 0–2 A |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Spatial Resolution (in situ) | ≤0.1 nm |
| Sample Drift | <50 pm/s |
| EDS-Compatible | Yes |
| Heating Accuracy | ≥98% |
| Maximum Heating Rate | >10,000 °C/s |
| Current Measurement Range | 1 pA–1 A |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | ATR1000 |
| Configuration | Fully Automatic |
| Spectral Range | 200–2500 nm (UV-VIS-NIR) |
| Measurement Modes | Absolute Reflectance & Transmittance |
| Optical Architecture | Integrated Fixed-Fiber Optic Path |
| Sample Compartment | Light-Tight Enclosed Chamber |
| Optional Accessory | Integrating Sphere (custom-configurable) |
| Data Output | Full Spectral Curve + Multi-Point Quantitative Reporting |
| Compliance Ready | ASTM E308, ISO/CIE 15, USP <857>, GLP/GMP-aligned Audit Trail Support |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | CSPM6000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | ≤0.1 nm |
| Sample Dimensions | Ø < 100 mm, Thickness < 40 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Force Sensitivity | ≤5 pN |
| Image Resolution Options | 128×128 to 4096×4096 pixels |
| Scan Rotation | 0–360° |
| Scan Frequency Range | 0.1–100 Hz |
| Control Architecture | Dual-core DSP+ARM processor (Texas Instruments) |
| Feedback System | Fully digital PID-controlled feedback with auto-tuning |
| Communication Interfaces | Gigabit Ethernet (TCP/IP) + High-Speed USB 2.0 |
| Display | 16×4 LCD with real-time system diagnostics |
| Software | Multi-language (EN/CN-Traditional/CN-Simplified), Windows 10/7/XP/Vista compatible |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | L3230 |
| Price Range | USD 1,400–7,200 (based on configuration) |
| Configuration | Upright |
| Image Analysis System | Not Included |
| Total Magnification Range | 50× to 1000× |
| Eyepieces | Wide-Field WF10X (Φ22 mm) |
| Objectives | Infinity-Corrected Achromatic Plan Objectives (Cover-Slip Free) |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | MARS1000 |
| Pricing | Upon Request |
| Brand | Betop Scientific |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | OpenSPM |
| Instrument Category | Atomic Force Microscope (AFM) |
| Instrument Type | Materials Science AFM |
| Z-Direction Position Detection Noise (RMS) | ≤0.05 nm (calibrated on monolayer step height of HOPG graphite) |
| Maximum Sample Diameter | ≤30 mm |
| Maximum Sample Thickness | ≤20 mm |
| Sample Stage Travel Range (Auto-Approach) | ≥23 mm (one-click automated approach), Minimum Step Resolution: ≤50 nm |
| Manual XY Adjustment Range | ≥±8.0 mm |
| Scanner Type | Tube Scanner |
| Maximum Scan Range | ≥20 μm × 20 μm × 3 μm |
| Lateral Resolution | <0.02 nm (in-plane) |
| Scan Rate | 0.1–30 lines/sec |
| PID Feedback Loop Response Time | <10 μs |
| Max Pixel Density per Image | 4000 × 4000 physical pixels |
| Real-Time Simultaneous Data Channels | ≥5 |
| Control Architecture | Dual-Core Embedded System (ARM + DSP) |
| Communication Protocol | TCP/IP |
| Detection Mode | Frequency Modulation (FM-AFM) with Integrated Analog-Digital Lock-in Amplifier |
| Software Capabilities | Real-time 3D surface rendering, multi-parameter mapping (topography, phase, friction, current, force-distance, I–V, I–Z), tip characterization & image deconvolution algorithms |
| Compliance | Designed for GLP-compliant materials characterization workflows |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | RamSPM |
| Price Range | USD 70,000 – 140,000 |
| Instrument Category | Atomic Force Microscope (AFM) |
| Instrument Class | Materials Science AFM |
| Z-direction RMS System Noise | ≤0.05 nm (calibrated on monolayer step height of HOPG) |
| Maximum Sample Diameter | ≤30 mm |
| Maximum Sample Thickness | ≤20 mm |
| Auto-approach Travel Range | ≥23 mm |
| Minimum Step Resolution | ≤50 nm |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | RT100 |
| Price Range | USD 14,000 – 28,500 |
| Spectral Range | 200–2500 nm (standard configuration: 380–1050 nm) |
| Sample Stage Dimensions | 195 × 160 mm (W × D) |
| Power Supply | 220 V ±10%, 50 Hz |
| Operating Environment | 10–35 °C, 10–80% RH (non-condensing) |
| Light Source | High-stability halogen lamp (customizable per spectral range and sample type) |
| Integration Sphere | Optional, for diffuse reflectance/transmittance measurement of matte, frosted, or textured surfaces |
| Software | RT100 Control & Analysis Suite with auto-zero, calibration traceability, pass/fail threshold logic, and spectral data export (CSV, XML) |
| Brand | Betop Scientific |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | TopSPM |
| Price Range | USD 84,000 – 182,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-direction RMS System Noise | ≤0.05 nm (calibrated on graphite monolayer step height) |
| Maximum Sample Diameter | ≤30 mm |
| Maximum Sample Thickness | ≤20 mm |
| Auto-Approach Travel Range | ≥23 mm |
| Minimum Approach Step Resolution | ≤50 nm |
| Closed-Loop XY Scan Range | ≥30 µm × 30 µm |
| Closed-Loop Z Scan Range | ≥8 µm |
| Scan Resolution | <1.5 nm |
| Line Rate | 0.1–30 lines/sec |
| PID Feedback Response Time | <10 µs |
| Max Pixel Density per Image | 4000 × 4000 |
| Real-Time Simultaneous Data Channels | ≥5 |
| Control Architecture | Dual-Core Embedded System (ARM + DSP) |
| Communication Protocol | TCP/IP |
| Detection Mode | Frequency Modulation (FM-AFM) |
| Integrated Lock-in Amplifier | Analog-Digital Hybrid Structure |
| Probe Compatibility | Self-Sensing Probes & Conventional Laser-Detected Cantilevers |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Model | TX53M |
| Configuration | Upright |
| Image Analysis System | Integrated |
| Total Magnification Range | 50×–1000× |
| Eyepieces | Adjustable diopter wide-field eyepieces (10×, FN=23 mm), silicone eye cups, diopter range −2° to +8° |
| Objectives | 5× (NA=0.16, WD=16 mm, OFN=26.5), 10× (NA=0.30, WD=9 mm, OFN=26.5), 20× Long Working Distance (NA=0.40, WD=12 mm, OFN=26.5), 50× Long Working Distance (NA=0.60, WD=9.5 mm, OFN=26.5), 100× Long Working Distance (NA=0.80, WD=3 mm, OFN=26.5) |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | XJL-20 |
| Price Range | USD 140–7,200 (based on configuration) |
| Type | Inverted |
| Image Analysis System | Not Included |
| Total Magnification Range | 100×–1000× |
| Eyepieces | Widefield 10× (22 mm field number) |
| Objectives | Infinity-corrected Plan Achromatic Lenses — 10×/0.25, 20×/0.40, 50×/0.70, 100×/0.85 (dry, spring-loaded) |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | XPL-1 |
| Pricing | Upon Request |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Model | XPL-3230 |
| Optical System | Infinity-Corrected |
| Objective Lenses | Strain-Free Plan Achromatic Polarizing Objectives (5X, 10X, 40X, 60X) |
| Eyepieces | Widefield WF10X (Φ22 mm), Divided Eyepiece 10X (0.1 mm/div) |
| Rotating Stage | 360° Graduated, Vernier Resolution 6′, Center-Adjustable with Lock |
| Focusing Mechanism | Coaxial Coarse/Fine Focus, Fine Adjustment Graduation 2 µm, Limit & Lock Function |
| Illumination | 6V/30W Halogen Lamp (Transmitted & Reflected), Brightness Adjustable |
| Polarizers | Rotatable Polarizer & Analyzer (0–360°), Graduated Scale with Vernier |
| Condenser | Abbe Condenser NA=1.25 with Iris Diaphragm |
| Compensation Plates | λ, λ/4, and Quartz Wedge |
| Trinocular Tube | 30° Inclined, 100% Light Path for Imaging |
| Power Supply | 85–265 V AC, 50/60 Hz |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | XTL-101 |
| Total Magnification | 45× |
| Working Distance | 88 mm |
| Objective Type | Continuous Zoom Objective |
| Illumination | Halogen Lamp |
| Eyepiece Inclination | 45° |
| Binocular Tube | Adjustable Interpupillary Distance & Diopter Compensation |
| Zoom Ratio | 0.7×–4.5× (extendable to 0.35×–9× with auxiliary lenses) |
| Optional Configurations | Trinocular Head, Ring LED Illuminator (8 W, 90–265 V), Ring Fluorescent Lamp (5 W, 110/220 V) |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Model | XTL-201 |
| Total Magnification Range | 7×–63× |
| Zoom Ratio | 1:9 |
| Field Diameter | 7.66 mm |
| Working Distance | 110 mm |
| Objective Type | Continuous Zoom Objective |
| Illumination | LED Epifluorescence Illuminator / Ring Fluorescence Illuminator |
| Depth of Field | 220 mm |
| Numerical Aperture | 0.06–0.63 |
| Brand | Betop Scientific |
|---|---|
| Model | XY8060 |
| Type | Motorized Translation Stage |
| Travel Range (X-Y) | 60 mm × 55 mm |
| Minimum Step Size | 0.08 µm |
| Unidirectional Repeatability | <0.005% |
| Unidirectional Standard Deviation | <2.5 µm |
| Positioning Accuracy (X-Y) | <1.2 µm/mm |
| Max. Speed (X-Y) | 3 mm/s (up to 10 mm/s) |
| Max. Load Capacity | 10 kg |
| Stage Top Dimensions | 230 mm × 200 mm |
| Weight | 3 kg |
| Origin | Guangdong, China |
| Compliance | CE-marked for laboratory use |
| Software Interface | USB 2.0 + RS-485, compatible with third-party control APIs (e.g., Micro-Manager, LabVIEW, Python) |
| Brand | Top |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | BGD-1 |
| Pricing | Upon Request |
| Timing Accuracy | ±0.1 s |
| Brand | Bigdipper |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | HBD5-Turb4210_90D |
| Price Range | USD 1,400–2,800 |
| Type | Portable |
| Measurement Range | 0–2000 FNU |
| Resolution | 1.0 FNU |
| Operating Temperature | −30 °C to +70 °C |
| Accuracy | ±2.0% of reading |
| Detection Principle | 90° Nephelometric Scattering (ISO 7027-compliant) |
| Display | 2×16 LCD |
| Keypad | 4×5 membrane keypad |
| Response Time | <1 ms |
| Power Supply | Rechargeable 9 V battery or external DC 9 V adapter |
| Battery Life | >10 hours continuous operation |
| Dimensions (H×W×D) | 180 mm × 98 mm × 35 mm |
| IP Rating | IP68 (fully submersible sensor probe) |
| Probe Interface | ZG1″ (BSPP) threaded fitting for in-line pipe insertion |
| Sample Compatibility | Clear to moderately turbid aqueous samples |
| Brand | Bioptechs |
|---|---|
| Origin | USA |
| Model | FCS2 (for inverted microscopes), FCS3 (for upright microscopes), CFCS2 (cooling-enabled variant) |
| Component Category | Optical Instrument Component |
| Optical Compatibility | Full compatibility with brightfield, phase contrast, DIC, fluorescence (including TIRF and confocal), and super-resolution modalities |
| Temperature Control Range | Ambient to 50 °C ±0.2 °C (air-gap-free design) |
| Flow Regime | Tunable from near-laminar (low-shear) to directed high-shear, user-defined geometry |
| Chamber Volume & Geometry | Fully user-adjustable chamber height (10–500 µm), optical path length, and flow channel profile |
| Thermal Uniformity | <0.1 °C spatial variation across imaging area |
| Fluidic Interface | 1/16″ OD tubing compatible (C-Flex®, Tygon®) |
| Environmental Sealing | Closed-system operation compatible with CO₂/bicarbonate or organic buffering systems |
| Assembly | Tool-free, modular configuration |
| Brand | Biphoton |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Optical Instrument Component |
| Model | SU-8 2000 Series |
| Wavelength Sensitivity | Near UV (350–400 nm), compatible with i-line, electron beam, and X-ray lithography |
| Typical Film Thickness | 0.5–650 µm |
| Application Scope | MEMS, microfluidics, optical waveguides, passivation layers, and photonic device fabrication |
| Compliance | Compatible with standard semiconductor cleanroom processes (Class 100/10) and ISO 14644-1 certified environments |
| Brand | BJBY |
|---|---|
| Origin | Beijing, China |
| Model | BY-2007Z |
| Type | Portable |
| Measurement Range | 0.0–200,000 lx (4 auto-ranging scales) |
| Accuracy | ±3% RD, ±0.5% FS |
| Repeatability | ±2% |
| Temperature Coefficient | ±0.1%/°C |
| Display | 3.5-digit LCD, digit height 15 mm |
| Sampling Rate | 2.0 readings/sec |
| Photodetector | Silicon photodiode with calibrated spectral filter |
| Dimensions | 150 × 70 × 39 mm |
| Calibration Reference | Standard planar lamp at 2856 K (CIE Illuminant A) |
| Brand | BJBY |
|---|---|
| Model | UV-2000 |
| Measurement Range | 0.1–199,900 µW/cm² |
| Spectral Response | 230–290 nm (Peak at 254 nm) |
| Accuracy | ±5% |
| Response Time | 1 s |
| Out-of-Band Rejection | <0.1% |
| Operating Temperature | 0–40 °C |
| Relative Humidity | <85% RH |
| Power Supply | 9 V alkaline battery |
| Power Consumption | ≤80 mW |
| Dimensions | 130 × 70 × 30 mm |
| Weight | 200 g |
| Probe Calibration | 254 nm UV-C specific |